- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 9/02055 - Reduction or prevention of errorsTestingCalibration
Patent holdings for IPC class G01B 9/02055
Total number of patents in this class: 328
10-year publication summary
|
3
|
1
|
6
|
10
|
30
|
40
|
62
|
67
|
53
|
26
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Carl Zeiss SMT GmbH | 3261 |
17 |
| ASML Netherlands B.V. | 7795 |
15 |
| Kineolabs, Inc. | 25 |
8 |
| Precitec Optronik GmbH | 82 |
7 |
| Centre National de La Recherche Scientifique | 10922 |
6 |
| ams International AG | 443 |
6 |
| Ecole Superieure de Physique et de Chimie Industrielles de La Ville de Paris | 384 |
6 |
| Leica Microsystems CMS GmbH | 1133 |
5 |
| Leica Microsystems Inc. | 23 |
5 |
| Mitutoyo Corporation | 1255 |
5 |
| Orbotech Ltd. | 254 |
5 |
| Tokyo Seimitsu Co., Ltd. | 393 |
5 |
| KLA Corporation | 1816 |
5 |
| Massachusetts Institute of Technology | 10210 |
4 |
| LightLab Imaging, Inc. | 290 |
4 |
| Mitsubishi Electric Corporation | 47749 |
3 |
| Panasonic Intellectual Property Management Co., Ltd. | 33839 |
3 |
| California Institute of Technology | 4023 |
3 |
| Omron Corporation | 7343 |
3 |
| Hamamatsu Photonics K.K. | 4626 |
3 |
| Other owners | 210 |