- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 9/02056 - Passive reduction of errors
Patent holdings for IPC class G01B 9/02056
Total number of patents in this class: 91
10-year publication summary
|
0
|
0
|
2
|
2
|
3
|
10
|
12
|
23
|
21
|
8
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Carl Zeiss SMT GmbH | 3034 |
10 |
| Omron Corporation | 7310 |
5 |
| ASML Netherlands B.V. | 7490 |
4 |
| Chamartin Laboratories LLC | 25 |
4 |
| Heidelberg Engineering GmbH | 63 |
3 |
| Leica Microsystems CMS GmbH | 1095 |
3 |
| Leica Microsystems Inc. | 23 |
3 |
| NinePoint Medical, Inc. | 34 |
3 |
| Samsung Electronics Co., Ltd. | 147983 |
2 |
| Alcon, Inc. | 5493 |
2 |
| Alfred E. Mann Institute for Biomedical Engineering at the University of Southern California | 40 |
2 |
| Avinger, Inc. | 132 |
2 |
| Mitutoyo Corporation | 1251 |
2 |
| PLX, Inc. | 69 |
2 |
| Lumentum Technology UK Limited | 85 |
2 |
| Apple Inc. | 55640 |
1 |
| Canon U.S.A., Inc. | 532 |
1 |
| Centre National de La Recherche Scientifique | 10576 |
1 |
| Seiko Epson Corporation | 19670 |
1 |
| Hitachi, Ltd. | 15599 |
1 |
| Other owners | 37 |