- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 9/02056 - Passive reduction of errors
Patent holdings for IPC class G01B 9/02056
Total number of patents in this class: 102
10-year publication summary
|
0
|
2
|
2
|
3
|
11
|
12
|
24
|
22
|
9
|
8
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Carl Zeiss SMT GmbH | 3328 |
11 |
| ASML Netherlands B.V. | 7906 |
6 |
| Omron Corporation | 7358 |
5 |
| Chamartin Laboratories LLC | 24 |
4 |
| Samsung Electronics Co., Ltd. | 157557 |
3 |
| Heidelberg Engineering GmbH | 69 |
3 |
| Leica Microsystems CMS GmbH | 1143 |
3 |
| Leica Microsystems Inc. | 23 |
3 |
| NinePoint Medical, Inc. | 34 |
3 |
| Alcon, Inc. | 5848 |
2 |
| Mitutoyo Corporation | 1259 |
2 |
| PLX, Inc. | 74 |
2 |
| Lumentum Technology UK Limited | 88 |
2 |
| Kineolabs, Inc. | 26 |
2 |
| Lumivascular, Inc. | 29 |
2 |
| Apple Inc. | 58705 |
1 |
| Canon U.S.A., Inc. | 544 |
1 |
| Centre National de La Recherche Scientifique | 11016 |
1 |
| Seiko Epson Corporation | 20248 |
1 |
| Hitachi, Ltd. | 16071 |
1 |
| Other owners | 44 |