- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 9/02061 - Reduction or prevention of effects of tilts or misalignment
Patent holdings for IPC class G01B 9/02061
Total number of patents in this class: 8
10-year publication summary
|
0
|
0
|
0
|
0
|
0
|
0
|
2
|
1
|
3
|
4
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Carl Zeiss SMT GmbH | 3034 |
2 |
| ASML Netherlands B.V. | 7490 |
1 |
| Dr. Johannes Heidenhain GmbH | 406 |
1 |
| Optipro Systems, L.L.C. | 13 |
1 |
| Tohoku University | 2823 |
1 |
| KLA Corporation | 1616 |
1 |
| Rapid Phenotyping Pty Ltd | 25 |
1 |
| Other owners | 0 |