- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 9/02061 - Reduction or prevention of effects of tilts or misalignment
Patent holdings for IPC class G01B 9/02061
Total number of patents in this class: 12
10-year publication summary
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0
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0
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0
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0
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0
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2
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1
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4
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4
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3
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| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Carl Zeiss SMT GmbH | 3258 |
3 |
| Nikon Corporation | 7284 |
1 |
| ASML Netherlands B.V. | 7785 |
1 |
| Dr. Johannes Heidenhain GmbH | 411 |
1 |
| Liteq B.V. | 3 |
1 |
| Munro Design & Technologies, LLC | 15 |
1 |
| Optipro Systems, L.L.C. | 13 |
1 |
| Tohoku University | 2936 |
1 |
| KLA Corporation | 1812 |
1 |
| Rapid Phenotyping Pty Ltd | 22 |
1 |
| Other owners | 0 |