- All sections
- G - Physics
- G01J - Measurement of intensity, velocity, spectral content, polarisation, phase or pulse characteristics of infrared, visible or ultraviolet lightcolorimetryradiation pyrometry
- G01J 1/18 - Photometry, e.g. photographic exposure meter by comparison with reference light or electric value using electric radiation detectors using comparison with a reference electric value
Patent holdings for IPC class G01J 1/18
Total number of patents in this class: 145
10-year publication summary
|
10
|
14
|
17
|
14
|
7
|
11
|
13
|
7
|
3
|
1
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Samsung Electronics Co., Ltd. | 146092 |
10 |
| Semiconductor Components Industries, L.L.C. | 5251 |
4 |
| Enphase Energy, Inc. | 602 |
4 |
| STMicroelectronics International N.V. | 3172 |
4 |
| Ricoh Company, Ltd. | 13247 |
3 |
| ams AG | 776 |
3 |
| ams International AG | 429 |
3 |
| UT-Battelle, LLC | 1455 |
3 |
| Axon Enterprise, Inc. | 752 |
3 |
| Solar Light Company, LLC | 30 |
3 |
| Honeywell International Inc. | 13545 |
2 |
| Applied Materials, Inc. | 18621 |
2 |
| Microsoft Technology Licensing, LLC | 53720 |
2 |
| Omron Corporation | 7261 |
2 |
| Communications Test Design, Inc. | 100 |
2 |
| Fitbit, Inc. | 662 |
2 |
| National Research Council of Canada | 1551 |
2 |
| Radisens Diagnostics Limited | 15 |
2 |
| Seek Thermal, Inc. | 95 |
2 |
| Universidad Complutense de Madrid | 209 |
2 |
| Other owners | 85 |