- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 1/32 - PolishingEtching
Patent holdings for IPC class G01N 1/32
Total number of patents in this class: 269
10-year publication summary
|
21
|
12
|
13
|
17
|
17
|
22
|
15
|
15
|
16
|
11
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| FEI Company | 1054 |
44 |
| Hitachi High-Tech Analysis Corporation | 285 |
13 |
| Hitachi High-Tech Corporation | 5857 |
9 |
| Carl Zeiss Microscopy GmbH | 1273 |
7 |
| Gatan, Inc. | 112 |
5 |
| Techinsights Inc. | 96 |
5 |
| Tescan Group, A.S. | 43 |
5 |
| Hitachi, Ltd. | 16113 |
4 |
| Hitachi High-Technologies Corporation | 1987 |
4 |
| JEOL Ltd. | 621 |
4 |
| Illinois Tool Works Inc. | 11866 |
3 |
| Hitachi High-Tech Science Corporation | 48 |
3 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 48438 |
3 |
| Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V. | 5259 |
3 |
| Globalwafers Co., Ltd. | 730 |
3 |
| Howard Hughes Medical Institute | 231 |
3 |
| IB Labs, Inc. | 5 |
3 |
| JFE Steel Corporation | 7549 |
3 |
| Leica Mikrosysteme GmbH | 64 |
3 |
| Struers ApS | 18 |
3 |
| Other owners | 139 |