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  • All sections
  • G - Physics
  • G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
  • G01Q 20/00 - Monitoring the movement or position of the probe

Patent holdings for IPC class G01Q 20/00

Total number of patents in this class: 84

10-year publication summary

12
8
11
1
3
5
1
3
4
0
2017 2018 2019 2020 2021 2022 2023 2024 2025 2026

Principal owners for this class

Owner
All patents
This class
Bruker Nano, Inc.
381
13
Infinitesima Limited
73
4
Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO
2455
4
Shimadzu Corporation
6373
3
Park Systems Corp.
40
2
The Penn State Research Foundation
1632
2
SensApex Oy
14
2
Zyvex Labs, LLC
14
2
Paris Sciences et Lettres - Quartier Latin
236
2
Sorbonne Universite
1410
2
Nearfield Instruments B.V.
62
2
Innovatum Instruments Inc.
3
2
Hitachi High-Tech Analysis Corporation
286
2
General Electric Company
13966
1
The Regents of the University of California
20868
1
International Business Machines Corporation
62769
1
Centre National de La Recherche Scientifique
11092
1
Hitachi High-Tech Science Corporation
48
1
Koninklijke Philips Electronics N.V.
7211
1
Caterpillar Inc.
10302
1
Other owners 35

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