- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 30/00 - Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices
Patent holdings for IPC class G01Q 30/00
Total number of patents in this class: 34
10-year publication summary
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0
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1
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3
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0
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2
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2
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2
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2
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0
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1
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| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Bruker Nano, Inc. | 347 |
5 |
| Shimadzu Corporation | 6191 |
3 |
| Commissariat à l'énergie atomique et aux energies alternatives | 10946 |
2 |
| Cornell University | 3330 |
2 |
| RHK Technology, Inc. | 15 |
2 |
| WeighUp LLC | 2 |
2 |
| Honda Motor Co., Ltd. | 25499 |
1 |
| Massachusetts Institute of Technology | 10110 |
1 |
| The Board of Trustees of the Leland Stanford Junior University | 6462 |
1 |
| Board of Regents, The University of Texas System | 5860 |
1 |
| Carl Zeiss SMT GmbH | 3027 |
1 |
| The Chancellor, Masters and Scholars of The University of Oxford | 159 |
1 |
| I-shou University | 34 |
1 |
| Infinitesima Limited | 68 |
1 |
| Keysight Technologies, Inc. | 1201 |
1 |
| Microscan Systems, Inc. | 22 |
1 |
| Park Systems Corp. | 34 |
1 |
| Quotient Technology Inc. | 80 |
1 |
| Sonix, Inc. | 26 |
1 |
| Tohoku University | 2816 |
1 |
| Other owners | 4 |