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  • All sections
  • G - Physics
  • G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
  • G01Q 40/02 - Calibration standards or methods of fabrication thereof

Patent holdings for IPC class G01Q 40/02

Total number of patents in this class: 45

10-year publication summary

2
4
4
4
2
8
2
5
2
1
2017 2018 2019 2020 2021 2022 2023 2024 2025 2026

Principal owners for this class

Owner
All patents
This class
Carl Zeiss SMT GmbH
3339
6
Nearfield Instruments B.V.
61
6
Samsung Electronics Co., Ltd.
157946
3
Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO
2440
3
Centre National de La Recherche Scientifique
11026
2
Shimadzu Corporation
6347
2
Korea Advanced Institute of Science and Technology
4670
2
Kwansei Gakuin Educational Foundation
225
2
NTT Advanced Technology Corporation
82
2
International Business Machines Corporation
62671
1
Battelle Energy Alliance, LLC
588
1
Carl Zeiss SMS GmbH
46
1
China Jiliang University
83
1
Consejo Superior de Investigaciones Cientificas (csic)
1443
1
Ecole Polytechnique
333
1
The Government of the United States of America, as represented by the Secretary of the Navy
1454
1
Istituto Nazionale di Ricerca Metrologica (I.N.RI.M.)
17
1
Korea Research Institute of Standards and Science
692
1
Nanotools GmbH
5
1
Technion Research & Development Foundation Ltd.
1259
1
Other owners 6

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