- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/46 - SCM [Scanning Capacitance Microscopy] or apparatus therefor, e.g. SCM probes
Patent holdings for IPC class G01Q 60/46
Total number of patents in this class: 11
10-year publication summary
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1
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2
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1
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0
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0
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0
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0
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1
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1
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0
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| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Semiconductor Manufacturing International (Beijing) Corporation | 1033 |
2 |
| Semiconductor Manufacturing International (Shanghai) Corporation | 1761 |
2 |
| Msscorps Co., Ltd. | 11 |
2 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 43258 |
1 |
| National Chung Hsing University | 82 |
1 |
| Oxford Instruments Asylum Research, Inc. | 31 |
1 |
| Universität Linz | 39 |
1 |
| FEI Efa, Inc. | 19 |
1 |
| Other owners | 0 |