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  • All sections
  • G - Physics
  • G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
  • G01Q 70/06 - Probe tip arrays

Patent holdings for IPC class G01Q 70/06

Total number of patents in this class: 103

10-year publication summary

3
11
12
8
13
4
5
7
3
2
2017 2018 2019 2020 2021 2022 2023 2024 2025 2026

Principal owners for this class

Owner
All patents
This class
Infinitesima Limited
72
12
Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO
2442
12
Xallent Inc.
20
8
Nearfield Instruments B.V.
61
5
Carl Zeiss SMT GmbH
3342
4
Northwestern University
3546
4
The Boeing Company
20168
2
Bruker Nano, Inc.
382
2
IMEC VZW
1823
2
Industry-Academic Cooperation Foundation, Yonsei University
2444
2
Panorama Synergy, Ltd.
5
2
SensApex Oy
14
2
Washington University
1746
2
Xallent, LLC
4
2
TERA-print, LLC
14
2
Molecular Vista, Inc.
17
2
UNM Rainforest Innovations
490
2
The Regents of the University of California
20790
1
Centre National de La Recherche Scientifique
11042
1
Applied Materials Israel, Ltd.
680
1
Other owners 33

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