- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 70/10 - Shape or taper
Patent holdings for IPC class G01Q 70/10
Total number of patents in this class: 143
10-year publication summary
|
8
|
14
|
13
|
12
|
11
|
12
|
9
|
9
|
7
|
9
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2455 |
10 |
| Bruker Nano, Inc. | 381 |
7 |
| Infinitesima Limited | 73 |
7 |
| Centre National de La Recherche Scientifique | 11092 |
5 |
| Vmicro | 10 |
5 |
| Nearfield Instruments B.V. | 62 |
4 |
| Olympus Corporation | 12912 |
3 |
| National Institute of Metrology P.R. China | 68 |
3 |
| Park Systems Corp. | 40 |
3 |
| Universitat Basel | 316 |
3 |
| Universiteit Twente | 238 |
3 |
| Zhejiang University | 3469 |
3 |
| Tiptek, LLC | 5 |
3 |
| Xallent Inc. | 20 |
3 |
| Samsung Electronics Co., Ltd. | 158842 |
2 |
| Hitachi High-Tech Science Corporation | 48 |
2 |
| Korea Advanced Institute of Science and Technology | 4702 |
2 |
| Northwestern University | 3567 |
2 |
| Boise State University | 125 |
2 |
| Namiki Seimitsu Houseki Kabushiki Kaisha | 136 |
2 |
| Other owners | 69 |