- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 90/00 - Scanning-probe techniques or apparatus not otherwise provided for
Patent holdings for IPC class G01Q 90/00
Total number of patents in this class: 19
10-year publication summary
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| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| KLA-Tencor Corporation | 2518 |
2 |
| Applied Materials, Inc. | 20363 |
1 |
| Applied Materials Israel, Ltd. | 675 |
1 |
| ASML Netherlands B.V. | 7906 |
1 |
| Shimadzu Corporation | 6337 |
1 |
| Mizuho Information & Research Institute, Inc. | 16 |
1 |
| Nanofactory Instruments AB | 4 |
1 |
| Nanotools GmbH | 5 |
1 |
| Nanyang Technological University | 2200 |
1 |
| National University Corporation Toyohashi University of Technology | 197 |
1 |
| The Trustees of Princeton University | 1262 |
1 |
| University of Houston System | 1122 |
1 |
| University of Tennessee Research Foundation | 758 |
1 |
| UT-Battelle, LLC | 1510 |
1 |
| Waseda University | 469 |
1 |
| Zyvex Labs, LLC | 14 |
1 |
| Molecular Vista, Inc. | 16 |
1 |
| National University Corporation Tokai National Higher Education and Research System | 865 |
1 |
| Other owners | 0 |