- All sections
- G - Physics
- G01R - Measuring electric variablesmeasuring magnetic variables
- G01R 31/316 - Testing of analog circuits
Patent holdings for IPC class G01R 31/316
Total number of patents in this class: 65
10-year publication summary
|
0
|
4
|
9
|
5
|
6
|
5
|
2
|
8
|
5
|
5
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hefei University of Technology | 229 |
8 |
| Advantest Corporation | 1812 |
4 |
| Mitsubishi Electric Corporation | 46127 |
2 |
| SK Hynix Inc. | 11368 |
2 |
| Wuhan University | 371 |
2 |
| Gentiam LLC | 14 |
2 |
| Qualcomm Incorporated | 85434 |
1 |
| Sony Corporation | 31036 |
1 |
| NEC Corporation | 35687 |
1 |
| Panasonic Corporation | 20099 |
1 |
| Intel Corporation | 47005 |
1 |
| Seiko Epson Corporation | 19367 |
1 |
| Hitachi Automotive Systems, Ltd. | 3958 |
1 |
| Infineon Technologies AG | 8225 |
1 |
| Advanced Micro Devices, Inc. | 5686 |
1 |
| STMicroelectronics S.r.l. | 3610 |
1 |
| Finisar Corporation | 249 |
1 |
| Rockwell Collins, Inc. | 2499 |
1 |
| Battelle Memorial Institute | 2485 |
1 |
| Allegro Microsystems, LLC | 1336 |
1 |
| Other owners | 31 |