HORIBA, Ltd.

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1. CCEVA

Application Number	1889994
Status	Registered
Filing Date	2025-10-14
Registration Date	2025-10-14
Owner	HORIBA, Ltd. (Japan)
NICE Classes ?	09 - Scientific and electric apparatus and instruments 37 - Construction and mining; installation and repair services 42 - Scientific, technological and industrial services, research and design

Goods & Services

Carbon dioxide measuring apparatus, and parts and fittings therefor; carbon dioxide analyzing apparatus, and parts and fittings therefor; carbon dioxide measuring and analyzing apparatus, and parts and fittings therefor; gas measuring apparatus, and parts and fittings therefor; gas analyzing apparatus, and parts and fittings therefor; gas measuring and analyzing apparatus, and parts and fittings therefor; fluid flow meters; measuring or testing machines and instruments; laboratory apparatus and instruments; photographic machines and apparatus; cinematographic machines and apparatus; optical machines and apparatus; telecommunication machines and apparatus; electronic computer and data processing machines and apparatus and their parts; downloadable and recorded computer software for controlling carbon dioxide measuring apparatus, carbon dioxide analyzing apparatus, and carbon dioxide measuring and analyzing apparatus; downloadable and recorded computer software for controlling gas measuring apparatus, gas analyzing apparatus, and gas measuring and analyzing apparatus; computer software; computer programs. Repair and maintenance of carbon dioxide measuring apparatus; repair and maintenance of carbon dioxide analyzing apparatus; repair and maintenance of carbon dioxide measuring and analyzing apparatus; repair and maintenance of gas measuring apparatus; repair and maintenance of gas analyzing apparatus; repair and maintenance of gas measuring and analyzing apparatus; repair and maintenance of fluid flow meters; repair and maintenance of measuring or testing machines and instruments; repair and maintenance of laboratory apparatus and instruments; repair and maintenance of photographic machines and apparatus; repair and maintenance of cinematographic machines and apparatus; repair and maintenance of optical machines and apparatus; repair and maintenance of telecommunication machines and apparatus; repair and maintenance of electronic machines and apparatus. Rental of carbon dioxide measuring apparatus; rental of carbon dioxide analyzing apparatus; rental of carbon dioxide measuring and analyzing apparatus; rental of gas measuring apparatus; rental of gas analyzing apparatus; rental of gas measuring and analyzing apparatus; rental of fluid flow meters; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of carbon dioxide measuring apparatus; calibration of carbon dioxide analyzing apparatus; calibration of carbon dioxide measuring and analyzing apparatus; calibration of gas measuring apparatus; calibration of gas analyzing apparatus; calibration of gas measuring and analyzing apparatus; calibration of fluid flow meters; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of photographic machines and apparatus; calibration of cinematographic machines and apparatus; calibration of optical machines and apparatus; calibration of telecommunication machines and apparatus; calibration of electronic machines and apparatus; design of carbon dioxide measuring apparatus; design of carbon dioxide analyzing apparatus; design of carbon dioxide measuring and analyzing apparatus; design of gas measuring apparatus; design of gas analyzing apparatus; design of gas measuring and analyzing apparatus; design of fluid flow meters; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of photographic machines and apparatus; design of cinematographic machines and apparatus; design of optical machines and apparatus; design of telecommunication machines and apparatus; design of electronic machines and apparatus; design, programming and maintenance of computer software for controlling carbon dioxide measuring apparatus, carbon dioxide analyzing apparatus, and carbon dioxide measuring and analyzing apparatus; design, programming and maintenance of computer software for controlling gas measuring apparatus, gas analyzing apparatus, gas measuring and analyzing apparatus, and fluid flow meters; design, programming and maintenance of computer software; design, programming and maintenance of computer programs; providing on-line non-downloadable computer software for controlling carbon dioxide measuring apparatus, carbon dioxide analyzing apparatus, and carbon dioxide measuring and analyzing apparatus; providing on-line non-downloadable computer software for controlling gas measuring apparatus, gas analyzing apparatus, gas measuring and analyzing apparatus, and fluid flow meters; providing on-line non-downloadable computer software; providing on-line non-downloadable computer programs; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

2. LIQUID SAMPLE ANALYSIS METHOD, LIQUID SAMPLE ANALYSIS PROGRAM, AND LIQUID SAMPLE ANALYSIS SYSTEM

Application Number	JP2025016885
Publication Number	2025/243856
Status	In Force
Filing Date	2025-05-08
Publication Date	2025-11-27
Owner	HORIBA, LTD. (Japan)
Inventor	Aoyama, Tomoki Mori, Tetsuya

Abstract

Even for a liquid sample in which particle elements forming solid particles partially overlap compound elements forming a compound dissolved in a solution, the present invention quantifies only the solid particles. The present invention involves: measuring the concentration of elements (hereinafter referred to as non-overlapping elements) in the liquid not overlapping particle elements; calculating the concentration of elements (hereinafter referred to as overlapping elements) in the liquid overlapping the particle elements; measuring the total concentration of the overlapping elements and the particle elements included in the liquid sample; and calculating the concentration of the particle elements by subtracting the concentration of the overlapping elements from the total concentration.

IPC Classes ?

G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

3. TEST SYSTEM, TEST METHOD, AND TEST PROGRAM FOR HEAT MANAGEMENT SYSTEM

Application Number	JP2025017856
Publication Number	2025/243948
Status	In Force
Filing Date	2025-05-16
Publication Date	2025-11-27
Owner	HORIBA, LTD. (Japan)
Inventor	Hirai, Seiji Iseki, Hirotaka Michikita, Toshiyuki Yoshimura, Ryo

Abstract

The present invention makes it possible to improve tracking with respect to changes in an amount of heat at a heat management system and comprises a simulated heat source body 2 for thermally simulating a heat source component, a heat supply device 3 that supplies heat to the simulated heat source body 2, a heat amount acquisition unit 41 that acquires the amount of heat produced by a heat source component of a heat-generating device, and a heat simulation control unit 42 that controls the heat supply device 3 to thermally simulate the heat source component using the simulated heat source body 2. The heat simulation control unit 42 controls the heat supply device 3 on the basis of the amount of heat acquired by the heat amount acquisition unit 41 and an outlet temperature T5 or an outlet flow rate FR5 for a test object temperature adjustment apparatus 210 of a heat management system 200.

IPC Classes ?

G01M 17/007 - Wheeled or endless-tracked vehicles
G01M 99/00 - Subject matter not provided for in other groups of this subclass

4. EVALUATION SYSTEM, PROGRAM FOR EVALUATION SYSTEM, AND EVALUATION METHOD

Application Number	JP2025014891
Publication Number	2025/225466
Status	In Force
Filing Date	2025-04-16
Publication Date	2025-10-30
Owner	HORIBA, LTD. (Japan)
Inventor	Echigoya, Takeshi

Abstract

An evaluation system according to the present invention evaluates the performance of an electrolysis cell that electrolyzes supplied steam to generate hydrogen gas or a test piece that is a portion thereof and comprises a steam supply line that supplies steam to the test piece, a hydrogen gas extraction line that extracts hydrogen gas that is generated from the test piece by electrolysis, a generated hydrogen information acquisition unit that acquires generated hydrogen information that directly or indirectly indicates the hydrogen gas content of a fluid that flows along the hydrogen gas extraction line, and a steam control unit that controls the flow rate of the steam supplied to the test piece from the steam supply line on the basis of the acquired generated hydrogen information.

IPC Classes ?

C25B 15/023 - Measuring, analysing or testing during electrolytic production
C25B 1/042 - Hydrogen or oxygen by electrolysis of water by electrolysis of steam
G01N 1/00 - SamplingPreparing specimens for investigation

5. MICROCHIP, SPECIMEN TESTING APPARATUS, AND SPECIMEN TESTING METHOD

Application Number	18290726
Status	Pending
Filing Date	2022-07-13
First Publication Date	2025-10-23
Owner	HORIBA, Ltd. (Japan)
Inventor	Matsuda, Yasunori Hirata, Katsuki

Abstract

A microchip (3) has a fluid circuit in it. The fluid circuit includes: a specimen introduction portion (31) into which a specimen is introduced; a component separation portion (32) that, when a centrifugal force in a first direction (D1) occurs in the microchip (3), separates, under the centrifugal force in the first direction (D1), a component contained in the specimen introduced into the specimen introduction portion (31); and a reagent reaction portion (33) that has a carrier member (330) carrying a reagent and that makes part of the component introduced from the component separation portion (32) into the carrier member (330) react with the reagent. When a centrifugal force in a second direction (D2) different from the first direction (D1) occurs in the microchip (3), the component separated in the component separation portion (32) is introduced, under the centrifugal force in the second direction (D2), from the component separation portion (32) into the carrier member (330).

IPC Classes ?

B01L 3/00 - Containers or dishes for laboratory use, e.g. laboratory glasswareDroppers
G01N 21/77 - Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator

6. GAS ANALYSIS DEVICE, LIGHT EMISSION-INDUCING GAS GENERATION DEVICE, AND ANALYSIS METHOD

Application Number	JP2025008487
Publication Number	2025/220352
Status	In Force
Filing Date	2025-03-07
Publication Date	2025-10-23
Owner	HORIBA, LTD. (Japan)
Inventor	Miyahara, Kohei Nagasawa, Kenya Mizumoto, Kazunori Yamada, Ryusuke Kobayashi, Go Serizawa, Izumi

Abstract

The present invention suppresses the generation of components other than a light emission-inducing gas. The gas analysis device (100) comprises a light emission-inducing gas generation device (9) that generates a light emission-inducing gas that interacts with a gas to be analyzed to generate reaction light. The light emission-inducing gas generation device (9) has a housing (91) and a light source (92). The housing (91) has an internal space (SP) into which a raw material gas serving as a raw material for the light emission-inducing gas is introduced. The light source (92) is provided in the internal space (SP) and emits light for generating a light emission-inducing gas from the raw material gas. At least one of electric wires of the light source (92) is disposed in the internal space SP of the housing (91). The electrical wires disposed in the internal space (SP) of the housing (91) are electrically connected at a portion facing the internal space of the housing (91).

IPC Classes ?

G01N 21/76 - ChemiluminescenceBioluminescence

7. INFRARED GAS ANALYZER, AND INFRARED GAS ANALYSIS METHOD

Application Number	18863980
Status	Pending
Filing Date	2023-04-27
First Publication Date	2025-10-16
Owner	HORIBA, LTD. (Japan)
Inventor	Sakakura, Seiji Imamura, Yuki

Abstract

The present invention is one which reduces running costs by eliminating the need for a catalyst, which is a consumable item, and comprises a measurement cell into which sample gas is introduced, an infrared light source that irradiates the measurement cell with infrared light, an infrared light detector that detects infrared light that has passed through the measurement cell, and a gas filter within which a plurality of interference components that interfere with a measurement component in the sample gas are enclosed.

IPC Classes ?

G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

8. VERIFICATION METHOD OF THERMAL SIMULATION SYSTEM, VERIFICATION PROGRAM, VERIFICATION DEVICE FOR THERMAL SIMULATION SYSTEM, THERMAL SIMULATION SYSTEM, TEST METHOD, AND TEST SYSTEM

Application Number	JP2025013513
Publication Number	2025/216147
Status	In Force
Filing Date	2025-04-02
Publication Date	2025-10-16
Owner	HORIBA, LTD. (Japan)
Inventor	Iseki, Hirotaka Hirai, Seiji Michikita, Toshiyuki Yoshimura, Ryo

Abstract

The present invention facilitates parameter setting of a thermal simulation system used for a test of a thermal management system and is a verification method of a thermal simulation system 100 for testing the thermal management system for managing heat generated from one or a plurality of heat source components of a vehicle, the method including an acquisition step for acquiring heat quantity data indicating a heat quantity generated from the heat source component and an arithmetic step for inputting the acquired heat quantity data to a thermal simulation system model M, which is software obtained by modeling the thermal simulation system 100, and calculating a parameter of the thermal simulation system 100 for reproducing the heat quantity, by the thermal simulation system model M.

IPC Classes ?

G01M 17/007 - Wheeled or endless-tracked vehicles

9. SHIFT OPERATION MECHANISM, AUTOMATED DRIVING ROBOT, TEST SPECIMEN TESTING SYSTEM, AND SHIFT OPERATION METHOD FOR AUTOMATED DRIVING ROBOT

Application Number	JP2025013678
Publication Number	2025/211427
Status	In Force
Filing Date	2025-04-03
Publication Date	2025-10-09
Owner	HORIBA, LTD. (Japan)
Inventor	Yamada, Daiki Aoyagi, Kazuma Kugai, Kotaro Hirose, Yoku Oi, Kousuke

Abstract

This shift operation mechanism 1 for an automated driving robot 100 that drives a test specimen, which is a vehicle or a part thereof, comprises a clamping mechanism 10 that clamps a rotary type dial shift R, and an actuator 20 that rotates the clamping mechanism 10 about the axis of rotation of the dial shift R, wherein the clamping mechanism 10 comprises: a plurality of clamping pieces 11 that clamp the dial shift R from the sides of the dial shift R; and an elastic member 12 that imparts an elastic force in the direction in which the plurality of clamping pieces 11 clamp the dial shift R.

IPC Classes ?

G01M 17/007 - Wheeled or endless-tracked vehicles

10. SHIFT OPERATION MECHANISM, AUTOMATIC DRIVING ROBOT, TEST PRODUCT TESTING SYSTEM, AND SHIFT OPERATION METHOD OF AUTOMATIC DRIVING ROBOT

Application Number	JP2025013679
Publication Number	2025/211428
Status	In Force
Filing Date	2025-04-03
Publication Date	2025-10-09
Owner	HORIBA, LTD. (Japan)
Inventor	Yamada, Daiki Kugai, Kotaro Nara, Kazuteru Hashimoto, Kaho Furukawa, Kazuki Hirose, Yoku Matsubara, Yoshiaki

Abstract

Provided is a shift operation mechanism 1 of an automatic driving robot for driving a test product, which is a vehicle or a part thereof, said shift operation mechanism 1 comprising: a shift lever operation unit 11 that operates a shift lever of the test product; a shift button operation unit 12 that operates a button B provided to the shift lever L of the test product; and a control unit 13 that controls the shift lever operation unit 11 and the shift button operation unit 12.

IPC Classes ?

G01M 17/007 - Wheeled or endless-tracked vehicles

11. MEXACUBE

Application Number	1877758
Status	Registered
Filing Date	2025-07-30
Registration Date	2025-07-30
Owner	HORIBA, Ltd. (Japan)
NICE Classes ?	09 - Scientific and electric apparatus and instruments 37 - Construction and mining; installation and repair services 42 - Scientific, technological and industrial services, research and design

Goods & Services

Measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measurement apparatus and instruments for engine emission, and parts and fittings therefor; measurement apparatus and instruments for emission, and parts and fittings therefor; measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; measurement apparatus and instruments for process gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; on-board measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for emission, and parts and fittings therefor; on-board measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measurement apparatus and instruments for process gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; portable measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for emission, and parts and fittings therefor; portable measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measurement apparatus and instruments for process gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; measurement apparatus and instruments for automobile emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for automobile emission, and parts and fittings therefor; measurement apparatus and instruments for vehicle emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle emission, and parts and fittings therefor; gas measurement apparatus and instruments, and parts and fittings therefor; gas measuring and analyzing apparatus and instruments, and parts and fittings therefor; vehicle engine testing apparatus and instruments, and parts and fittings therefor; automotive engine testing apparatus and instruments, and parts and fittings therefor; engine testing apparatus and instruments, and parts and fittings therefor; computer software for controlling measurement apparatus and instruments for vehicle engine emission; computer software for controlling measurement apparatus and instruments for engine emission; computer software for controlling measurement apparatus and instruments for emission; computer software for controlling measurement apparatus and instruments for exhaust gases; computer software for controlling measurement apparatus and instruments for process gases; computer software for controlling gas measurement apparatus and instruments; computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; computer software for controlling measuring and analyzing apparatus and instruments for engine emission; computer software for controlling measuring and analyzing apparatus and instruments for emission; computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; computer software for controlling measuring and analyzing apparatus and instruments for process gases; computer software for controlling gas measuring and analyzing apparatus and instruments; computer software for controlling engine testing apparatus and instruments; computer software; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; cinematographic machines and apparatus; photographic machines and apparatus. Repair or maintenance of measurement apparatus and instruments for vehicle engine emission; repair or maintenance of measurement apparatus and instruments for engine emission; repair or maintenance of measurement apparatus and instruments for emission; repair or maintenance of measurement apparatus and instruments for exhaust gases; repair or maintenance of measurement apparatus and instruments for process gases; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for emission; repair or maintenance of measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of measuring and analyzing apparatus and instruments for process gases; repair or maintenance of on-board measurement apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measurement apparatus and instruments for engine emission; repair or maintenance of on-board measurement apparatus and instruments for emission; repair or maintenance of on-board measurement apparatus and instruments for exhaust gases; repair or maintenance of on-board measurement apparatus and instruments for process gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for process gases; repair or maintenance of portable measurement apparatus and instruments for vehicle engine emission; repair or maintenance of portable measurement apparatus and instruments for engine emission; repair or maintenance of portable measurement apparatus and instruments for emission; repair or maintenance of portable measurement apparatus and instruments for exhaust gases; repair or maintenance of portable measurement apparatus and instruments for process gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for process gases; repair or maintenance of measurement apparatus and instruments for automobile emission; repair or maintenance of measuring and analyzing apparatus and instruments for automobile emission; repair or maintenance of measurement apparatus and instruments for vehicle emission; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle emission; repair or maintenance of gas measurement apparatus and instruments; repair or maintenance of gas measuring and analyzing apparatus and instruments; repair or maintenance of vehicle engine testing apparatus and instruments; repair or maintenance of automotive engine testing apparatus and instruments; repair or maintenance of engine testing apparatus and instruments; repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of optical machines and apparatus; repair or maintenance of cinematographic machines and apparatus; repair or maintenance of photographic machines and apparatus. Rental of measurement apparatus and instruments for vehicle engine emission; rental of measurement apparatus and instruments for engine emission; rental of measurement apparatus and instruments for emission; rental of measurement apparatus and instruments for exhaust gases; rental of measurement apparatus and instruments for process gases; rental of measuring and analyzing apparatus and instruments for vehicle engine emission; rental of measuring and analyzing apparatus and instruments for engine emission; rental of measuring and analyzing apparatus and instruments for emission; rental of measuring and analyzing apparatus and instruments for exhaust gases; rental of measuring and analyzing apparatus and instruments for process gases; rental of on-board measurement apparatus and instruments for vehicle engine emission; rental of on-board measurement apparatus and instruments for engine emission; rental of on-board measurement apparatus and instruments for emission; rental of on-board measurement apparatus and instruments for exhaust gases; rental of on-board measurement apparatus and instruments for process gases; rental of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; rental of on-board measuring and analyzing apparatus and instruments for engine emission; rental of on-board measuring and analyzing apparatus and instruments for emission; rental of on-board measuring and analyzing apparatus and instruments for exhaust gases; rental of on-board measuring and analyzing apparatus and instruments for process gases; rental of portable measurement apparatus and instruments for vehicle engine emission; rental of portable measurement apparatus and instruments for engine emission; rental of portable measurement apparatus and instruments for emission; rental of portable measurement apparatus and instruments for exhaust gases; rental of portable measurement apparatus and instruments for process gases; rental of portable measuring and analyzing apparatus and instruments for vehicle engine emission; rental of portable measuring and analyzing apparatus and instruments for engine emission; rental of portable measuring and analyzing apparatus and instruments for emission; rental of portable measuring and analyzing apparatus and instruments for exhaust gases; rental of portable measuring and analyzing apparatus and instruments for process gases; rental of measurement apparatus and instruments for automobile emission; rental of measuring and analyzing apparatus and instruments for automobile emission; rental of measurement apparatus and instruments for vehicle emission; rental of measuring and analyzing apparatus and instruments for vehicle emission; rental of gas measurement apparatus and instruments; rental of gas measuring and analyzing apparatus and instruments; rental of vehicle engine testing apparatus and instruments; rental of automotive engine testing apparatus and instruments; rental of engine testing apparatus and instruments; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; calibration of measurement apparatus and instruments for vehicle engine emission; calibration of measurement apparatus and instruments for engine emission; calibration of measurement apparatus and instruments for emission; calibration of measurement apparatus and instruments for exhaust gases; calibration of measurement apparatus and instruments for process gases; calibration of measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of measuring and analyzing apparatus and instruments for engine emission; calibration of measuring and analyzing apparatus and instruments for emission; calibration of measuring and analyzing apparatus and instruments for exhaust gases; calibration of measuring and analyzing apparatus and instruments for process gases; calibration of on-board measurement apparatus and instruments for vehicle engine emission; calibration of on-board measurement apparatus and instruments for engine emission; calibration of on-board measurement apparatus and instruments for emission; calibration of on-board measurement apparatus and instruments for exhaust gases; calibration of on-board measurement apparatus and instruments for process gases; calibration of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of on-board measuring and analyzing apparatus and instruments for engine emission; calibration of on-board measuring and analyzing apparatus and instruments for emission; calibration of on-board measuring and analyzing apparatus and instruments for exhaust gases; calibration of on-board measuring and analyzing apparatus and instruments for process gases; calibration of portable measurement apparatus and instruments for vehicle engine emission; calibration of portable measurement apparatus and instruments for engine emission; calibration of portable measurement apparatus and instruments for emission; calibration of portable measurement apparatus and instruments for exhaust gases; calibration of portable measurement apparatus and instruments for process gases; calibration of portable measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of portable measuring and analyzing apparatus and instruments for engine emission; calibration of portable measuring and analyzing apparatus and instruments for emission; calibration of portable measuring and analyzing apparatus and instruments for exhaust gases; calibration of portable measuring and analyzing apparatus and instruments for process gases; calibration of measurement apparatus and instruments for automobile emission; calibration of measuring and analyzing apparatus and instruments for automobile emission; calibration of measurement apparatus and instruments for vehicle emission; calibration of measuring and analyzing apparatus and instruments for vehicle emission; calibration of gas measurement apparatus and instruments; calibration of gas measuring and analyzing apparatus and instruments; calibration of vehicle engine testing apparatus and instruments; calibration of automotive engine testing apparatus and instruments; calibration of engine testing apparatus and instruments; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of optical machines and apparatus; calibration of cinematographic machines and apparatus; calibration of photographic machines and apparatus; design of measurement apparatus and instruments for vehicle engine emission; design of measurement apparatus and instruments for engine emission; design of measurement apparatus and instruments for emission; design of measurement apparatus and instruments for exhaust gases; design of measurement apparatus and instruments for process gases; design of measuring and analyzing apparatus and instruments for vehicle engine emission; design of measuring and analyzing apparatus and instruments for engine emission; design of measuring and analyzing apparatus and instruments for emission; design of measuring and analyzing apparatus and instruments for exhaust gases; design of measuring and analyzing apparatus and instruments for process gases; design of on-board measurement apparatus and instruments for vehicle engine emission; design of on-board measurement apparatus and instruments for engine emission; design of on-board measurement apparatus and instruments for emission; design of on-board measurement apparatus and instruments for exhaust gases; design of on-board measurement apparatus and instruments for process gases; design of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; design of on-board measuring and analyzing apparatus and instruments for engine emission; design of on-board measuring and analyzing apparatus and instruments for emission; design of on-board measuring and analyzing apparatus and instruments for exhaust gases; design of on-board measuring and analyzing apparatus and instruments for process gases; design of portable measurement apparatus and instruments for vehicle engine emission; design of portable measurement apparatus and instruments for engine emission; design of portable measurement apparatus and instruments for emission; design of portable measurement apparatus and instruments for exhaust gases; design of portable measurement apparatus and instruments for process gases; design of portable measuring and analyzing apparatus and instruments for vehicle engine emission; design of portable measuring and analyzing apparatus and instruments for engine emission; design of portable measuring and analyzing apparatus and instruments for emission; design of portable measuring and analyzing apparatus and instruments for exhaust gases; design of portable measuring and analyzing apparatus and instruments for process gases; design of measurement apparatus and instruments for automobile emission; design of measuring and analyzing apparatus and instruments for automobile emission; design of measurement apparatus and instruments for vehicle emission; design of measuring and analyzing apparatus and instruments for vehicle emission; design of gas measurement apparatus and instruments; design of gas measuring and analyzing apparatus and instruments; design of vehicle engine testing apparatus and instruments; design of automotive engine testing apparatus and instruments; design of engine testing apparatus and instruments; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of optical machines and apparatus; design of cinematographic machines and apparatus; design of photographic machines and apparatus; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling gas measurement apparatus and instruments; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling gas measuring and analyzing apparatus and instruments; design, programming and maintenance of computer software for controlling engine testing apparatus and instruments; design, programming and maintenance of computer software; rental of computer software for controlling measurement apparatus and instruments for vehicle engine emission; rental of computer software for controlling measurement apparatus and instruments for engine emission; rental of computer software for controlling measurement apparatus and instruments for emission; rental of computer software for controlling measurement apparatus and instruments for exhaust gases; rental of computer software for controlling measurement apparatus and instruments for process gases; rental of computer software for controlling gas measurement apparatus and instruments; rental of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; rental of computer software for controlling measuring and analyzing apparatus and instruments for process gases; rental of computer software for controlling gas measuring and analyzing apparatus and instruments; rental of computer software for controlling engine testing apparatus and instruments; rental of computer software; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling gas measurement apparatus and instruments; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling gas measuring and analyzing apparatus and instruments; providing on-line non-downloadable computer software for controlling engine testing apparatus and instruments; providing on-line non-downloadable computer software; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

12. MATERIAL GAS SUPPLY SYSTEM, MATERIAL GAS SUPPLY METHOD, AND MATERIAL GAS SUPPLY PROGRAM

Application Number	JP2025009315
Publication Number	2025/197717
Status	In Force
Filing Date	2025-03-12
Publication Date	2025-09-25
Owner	HORIBA, LTD. (Japan)
Inventor	Saito, Takashi Ding, Li Ichikawa, Takato Shibuya, Kyoji Yamamoto, Tomomi

Abstract

The present invention reduces the burden of managing the flow rate of a material gas that is supplied to a processing device that uses a chemical reaction. The present invention comprises: a flow rate controller that controls the flow rate of the material gas that is supplied to the processing device; a gas analysis device that measures the concentration of a component to be measured that is included in a derivation gas emitted from the processing device; and a control device that inputs a flow rate setting value to the flow rate controller on the basis of the concentration measurement value of the component to be measured obtained by the gas analysis device. The control device determines a flow rate setting value to be inputted to the flow rate controller, on the basis of a control parameter determined by using a simulation model based on a chemical reaction occurring in the processing device or the volume of a reaction space in the processing device.

IPC Classes ?

G05D 7/06 - Control of flow characterised by the use of electric means

13. SPECIMEN MEASUREMENT CHIP, METHOD FOR MANUFACTURING SPECIMEN MEASUREMENT CHIP, SPECIMEN MEASUREMENT DEVICE, SPECIMEN MEASUREMENT METHOD, AND SPECIMEN MEASUREMENT PROGRAM

Application Number	JP2025009380
Publication Number	2025/192655
Status	In Force
Filing Date	2025-03-12
Publication Date	2025-09-18
Owner	HORIBA, LTD. (Japan)
Inventor	Anzai, Hiroshi Hirata, Katsuki

Abstract

A specimen measurement chip 2, which is used for measuring a specimen, has a space 22 in which a specimen or a reagent is accommodated so as to prevent erroneous detection of the accommodation state of the specimen or the reagent while obtaining a stable reflected light quantity. The specimen measurement chip 2 includes a detection unit 23 formed on an inner surface 2a forming the space 22 and detecting the accommodation state of the specimen or the reagent. The detection unit 23 includes: a linear groove 231 formed with a reflection surface 231x that reflects light on a bottom surface; and an air lead-out passage 232 communicating with one end 231a of the groove 231.

IPC Classes ?

G01N 35/08 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor using a stream of discrete samples flowing along a tube system, e.g. flow injection analysis
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor
G01N 37/00 - Details not covered by any other group of this subclass

14. THERMAL CONDUCTIVITY GAS ANALYZER

Application Number	JP2025006631
Publication Number	2025/182986
Status	In Force
Filing Date	2025-02-26
Publication Date	2025-09-04
Owner	HORIBA, LTD. (Japan)
Inventor	Shintaku Akira

Abstract

A thermal conductivity gas analyzer according to the present invention comprises: a plurality of cells respectively housing resistors constituting a Wheatstone bridge circuit; a first flow path section through which a sample gas or a reference gas flows; a second flow path section provided so as to branch off of the first flow path section; and a supply gas switching unit connected to the first flow path section. Each resistor is constituted by a thermal conductivity thin-film sensor or a thermal conductivity semiconductor sensor. The plurality of cells include measurement cells that respectively house resistors located on one pair of opposite sides of the Wheatstone bridge circuit. The second flow path section connects to the measurement cells. The supply gas switching unit alternately supplies the sample gas and the reference gas to the first flow path section.

IPC Classes ?

G01N 27/18 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of an electrically-heated body in dependence upon change of temperature caused by changes in the thermal conductivity of a surrounding material to be tested
G01N 25/18 - Investigating or analysing materials by the use of thermal means by investigating thermal conductivity

15. RADIATION TEMPERATURE MEASUREMENT DEVICE, RADIATION TEMPERATURE MEASUREMENT METHOD, AND RADIATION TEMPERATURE MEASUREMENT PROGRAM

Application Number	JP2025005873
Publication Number	2025/182774
Status	In Force
Filing Date	2025-02-20
Publication Date	2025-09-04
Owner	HORIBA, LTD. (Japan)
Inventor	Fujino, Sho Saito, Takashi Tominaga, Koji Hirai, Asuka

Abstract

A radiation temperature measurement device 100 that detects infrared rays radiated from a measurement subject W to measure the temperature of the measurement subject W, the radiation temperature measurement device 100 comprising: an infrared ray detection unit 2 that detects the respective infrared ray amounts of a plurality of wavelength components and that detects the infrared ray amount of each of a plurality of polarization components in at least one of the plurality of wavelength components; and a temperature computation unit 3 that computes the temperature of the measurement subject W on the basis of at least three kinds of infrared ray amounts detected by the infrared ray detection unit 2.

IPC Classes ?

G01J 5/59 - Radiation pyrometry, e.g. infrared or optical thermometry using polarisationDetails thereof
G01J 5/00 - Radiation pyrometry, e.g. infrared or optical thermometry
G01J 5/60 - Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature

16. UCMN

Application Number	1870108
Status	Registered
Filing Date	2025-06-09
Registration Date	2025-06-09
Owner	HORIBA, Ltd. (Japan)
NICE Classes ?	09 - Scientific and electric apparatus and instruments 37 - Construction and mining; installation and repair services 42 - Scientific, technological and industrial services, research and design

Goods & Services

Apparatus and instruments for measuring unburnt combustible content in ash, and parts and fittings therefor; apparatus and instruments for measuring and analyzing unburnt combustible content in ash, and parts and fittings therefor; gas measuring and analyzing apparatus and instruments, and parts and fittings therefor; mass concentration measuring apparatus and instruments, and parts and fittings therefor; mass concentration measuring and analyzing apparatus and instruments, and parts and fittings therefor; X-ray fluorescence apparatus and instruments for elemental analysis, and parts and fittings therefor; X-ray fluorescence apparatus and instruments for elemental measurement and analysis, and parts and fittings therefor; computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; computer software for controlling gas measuring and analyzing apparatus and instruments; computer software for controlling mass concentration measuring apparatus and instruments; computer software for controlling mass concentration measuring and analyzing apparatus and instruments; computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; computer software for measuring or testing machines and instruments; computer software for laboratory apparatus and instruments; computer software; electronic computer and data processing machines and apparatus and their parts; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; cinematographic machines and apparatus; photographic machines and apparatus. Repair and maintenance of apparatus and instruments for measuring unburnt combustible content in ash; repair and maintenance of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; repair and maintenance of gas measuring and analyzing apparatus and instruments; repair and maintenance of mass concentration measuring apparatus and instruments; repair and maintenance of mass concentration measuring and analyzing apparatus and instruments; repair and maintenance of X-ray fluorescence apparatus and instruments for elemental analysis; repair and maintenance of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; repair and maintenance of measuring or testing machines and instruments; repair and maintenance of laboratory apparatus and instruments; repair and maintenance of electronic machines and apparatus; repair and maintenance of optical machines and apparatus; repair and maintenance of cinematographic machines and apparatus; repair and maintenance of photographic machines and apparatus. Rental of apparatus and instruments for measuring unburnt combustible content in ash; rental of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; rental of gas measuring and analyzing apparatus and instruments; rental of mass concentration measuring apparatus and instruments; rental of mass concentration measuring and analyzing apparatus and instruments; rental of X-ray fluorescence apparatus and instruments for elemental analysis; rental of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of apparatus and instruments for measuring unburnt combustible content in ash; calibration of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; calibration of gas measuring and analyzing apparatus and instruments; calibration of mass concentration measuring apparatus and instruments; calibration of mass concentration measuring and analyzing apparatus and instruments; calibration of X-ray fluorescence apparatus and instruments for elemental analysis; calibration of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of electronic machines and apparatus; calibration of optical machines and apparatus; calibration of cinematographic machines and apparatus; calibration of photographic machines and apparatus; design of apparatus and instruments for measuring unburnt combustible content in ash; design of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; design of gas measuring and analyzing apparatus and instruments; design of mass concentration measuring apparatus and instruments; design of mass concentration measuring and analyzing apparatus and instruments; design of X-ray fluorescence apparatus and instruments for elemental analysis; design of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of electronic machines and apparatus; design of optical machines and apparatus; design of cinematographic machines and apparatus; design of photographic machines and apparatus; design, programming and maintenance of computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; design, programming and maintenance of computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; design, programming and maintenance of computer software for controlling gas measuring and analyzing apparatus and instruments; design, programming and maintenance of computer software for controlling mass concentration measuring apparatus and instruments; design, programming and maintenance of computer software for controlling mass concentration measuring and analyzing apparatus and instruments; design, programming and maintenance of computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; design, programming and maintenance of computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; design, programming and maintenance of computer software; rental of computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; rental of computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; rental of computer software for controlling gas measuring and analyzing apparatus and instruments; rental of computer software for controlling mass concentration measuring apparatus and instruments; rental of computer software for controlling mass concentration measuring and analyzing apparatus and instruments; rental of computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; rental of computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; rental of computer software; providing on-line non-downloadable computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; providing on-line non-downloadable computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; providing on-line non-downloadable computer software for controlling gas measuring and analyzing apparatus and instruments; providing on-line non-downloadable computer software for controlling mass concentration measuring apparatus and instruments; providing on-line non-downloadable computer software for controlling mass concentration measuring and analyzing apparatus and instruments; providing on-line non-downloadable computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; providing on-line non-downloadable computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; providing on-line non-downloadable computer software; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

17. PARTICLE ANALYSIS DEVICE

Application Number	18702425
Status	Pending
Filing Date	2023-01-17
First Publication Date	2025-08-14
Owner	HORIBA, Ltd. (Japan)
Inventor	Sakuramoto, Keijiro Mori, Tetsuya

Abstract

In order to enable a device to be installed in a limited space on the periphery of a line and to keep a path for transportation of a sample from the line short, the present invention is configured so as to comprise a flow cell through which a sample including particles flows, a light source for radiating light to the particles in the flow cell, a photodetector for detecting secondary light from the particles, and a computation circuit for detecting an autocorrelation function from a light intensity signal outputted from the photodetector and analyzing the autocorrelation function or the particles included in the sample, an optical system unit including the flow cell and the light source, and a control unit including the photodetector and the computation circuit being separate from each other and connected via a light guiding member for guiding the secondary light to the photodetector.

IPC Classes ?

G01N 15/0205 - Investigating particle size or size distribution by optical means

18. ENERGY ANALYSIS DEVICE, ENERGY MANAGEMENT SYSTEM, ENERGY ANALYSIS PROGRAM, AND ENERGY ANALYSIS METHOD

Application Number	JP2025002590
Publication Number	2025/164611
Status	In Force
Filing Date	2025-01-28
Publication Date	2025-08-07
Owner	HORIBA, LTD. (Japan)
Inventor	Higa, Kazushi Iwao, Keijiro Shiomi, Kenji Kakino, Toru

Abstract

The present invention enables efficient efforts for energy saving by analyzing electric power consumption data of a plurality of electric power supply facilities, the invention comprising: an electric power consumption data acquisition unit that acquires electric power consumption data of each of a plurality of electric power supply facilities for supplying electric power to a plurality of energy demand facilities; an electric power supply pattern model generation unit that performs multivariate analysis on the electric power consumption data, and generates an electric power supply pattern profile in which the plurality of electric power supply facilities are respectively classified into a plurality of electric power fluctuation patterns and/or an electric power supply pattern operation state sequence indicating operation states over time of the electric power supply pattern profile; and an electric power load amount calculation unit that, on the basis of the electric power supply pattern profile and/or the electric power supply pattern operation state sequence, calculates the electric power load amount of a plurality of energy demand facilities or the plurality of electric power supply facilities corresponding to the plurality of electric power fluctuation patterns, or the electric power load amount over time corresponding to the plurality of electric power fluctuation patterns.

IPC Classes ?

H02J 13/00 - Circuit arrangements for providing remote indication of network conditions, e.g. an instantaneous record of the open or closed condition of each circuitbreaker in the networkCircuit arrangements for providing remote control of switching means in a power distribution network, e.g. switching in and out of current consumers by using a pulse code signal carried by the network
G06Q 50/06 - Energy or water supply

19. MEXACUBE

Serial Number	79433442
Status	Pending
Filing Date	2025-07-30
Owner	HORIBA, Ltd. (Japan)
NICE Classes ?	09 - Scientific and electric apparatus and instruments 37 - Construction and mining; installation and repair services 42 - Scientific, technological and industrial services, research and design

Goods & Services

20. RADIATION DETECTION DEVICE AND RADIATION DETECTOR

Application Number	18851523
Status	Pending
Filing Date	2023-04-25
First Publication Date	2025-07-10
Owner	HORIBA, LTD. (Japan)
Inventor	Matsunaga, Daisuke Minowa, Hiroki

Abstract

A radiation detection device including an illumination unit illuminating a sample, an irradiation unit irradiating the sample with X-rays and a radiation detection element detecting X-rays generated from the sample is provided with a magnetic field production unit that produces a magnetic field in part of a space from the sample to the radiation detection element and a block that holds the magnetic field production unit. The block is located at a position where light from the illumination unit to the radiation detection element is shielded.

IPC Classes ?

G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01T 1/24 - Measuring radiation intensity with semiconductor detectors

21. RADIATION DETECTION ELEMENT, RADIATION DETECTOR, RADIATION DETECTION DEVICE, AND METHOD FOR MANUFACTURING RADIATION DETECTION ELEMENT

Application Number	18681896
Status	Pending
Filing Date	2022-08-18
First Publication Date	2025-07-10
Owner	HORIBA, LTD. (Japan)
Inventor	Ishikura, Koji

Abstract

A radiation detection element includes: a semiconductor part including an incidence surface to which radiations to be detected are incident; a first electrode provided on the incidence surface; and a second electrode that is provided on the incidence surface and is disposed at a position surrounding the periphery of the first electrode. The radiation detection element is a silicon drift-type radiation detection element, and is provided with an insulating protective film that covers the second electrode.

IPC Classes ?

G01T 1/24 - Measuring radiation intensity with semiconductor detectors
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
H10F 39/00 - Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group , e.g. radiation detectors comprising photodiode arrays
H10F 39/18 - Complementary metal-oxide-semiconductor [CMOS] image sensorsPhotodiode array image sensors

22. CONVEYANCE DEVICE, ANALYSIS SYSTEM, PROGRAM FOR CONVEYANCE DEVICE, AND CONVEYANCE METHOD

Application Number	18853181
Status	Pending
Filing Date	2023-03-31
First Publication Date	2025-07-10
Owner	HORIBA, Ltd. (Japan)
Inventor	Tatewaki, Yasuhiro Mori, Tetsuya

Abstract

To provide a conveyance device that is more user-friendly than conventional devices, and further enhance workability, a conveyance device that conveys a container accommodating a sample to an analysis device includes: a pallet in which a plurality of installation portions is provided, the container being installed in the installation portions; sensors that are provided for the respective installation portions in one-to-one correspondence, and acquire container information that is information obtained when the container is installed; a conveyance unit that picks up the container installed in the pallet, and conveys the container to the analysis device; and a conveyance control unit that causes the conveyance unit to pick up the container in accordance with a pick-up order determined on the basis of the container information.

IPC Classes ?

G01N 35/04 - Details of the conveyor system
B65G 1/137 - Storage devices mechanical with arrangements or automatic control means for selecting which articles are to be removed
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor

23. ION ANALYSIS DEVICE AND ION ANALYSIS METHOD

Application Number	JP2024041993
Publication Number	2025/142287
Status	In Force
Filing Date	2024-11-27
Publication Date	2025-07-03
Owner	HORIBA ADVANCED TECHNO, CO., LTD. (Japan) HORIBA, LTD. (Japan)
Inventor	Miyamura, Kazuhiro Kido, Masanori Okada, Yoichi Yamashita, Tsubasa

Abstract

Provided is an ion analysis device capable of performing measurements using a sample liquid with a smaller liquid volume than conventional methods. The ion analysis device comprises: a measurement electrode provided with a response unit which responds to ions; a reference electrode provided with a liquid junction section; a measurement flow path in which the response membrane and the liquid junction section are disposed; and a calculation unit that calculates the ion concentration in the sample liquid on the basis of the potential difference between the measurement electrode and the reference electrode, the device further comprising a hydrophilic section connecting the response unit and the liquid junction section inside the measurement flow path.

IPC Classes ?

G01N 27/416 - Systems
G01N 27/28 - Electrolytic cell components
G01N 27/30 - Electrodes, e.g. test electrodesHalf-cells
H01M 8/02 - Fuel cellsManufacture thereof Details
H01M 8/04 - Auxiliary arrangements, e.g. for control of pressure or for circulation of fluids
H01M 8/0444 - ConcentrationDensity

24. GAS ANALYSIS DEVICE, GAS ANALYSIS METHOD, AND PROGRAM FOR GAS ANALYSIS DEVICE

Application Number	JP2024043601
Publication Number	2025/142454
Status	In Force
Filing Date	2024-12-10
Publication Date	2025-07-03
Owner	HORIBA, LTD. (Japan)
Inventor	Mizutani, Naoto Nakamura, Kentaro

Abstract

This gas analysis device is for analyzing a target gas containing hydrogen gas that is a main component and at least one impurity gas that is a sub-component. The gas analysis device comprises: a comparison chamber where a first resistance element that has a constant current flowing therethrough and that generates heat is disposed, and where hydrogen gas is introduced into; a measurement chamber where a second resistance element that has a constant current flowing therethrough and that generates heat is disposed, and where the target gas is introduced into; a bridge circuit that is formed by comprising the first resistance element and the second resistance element in a closed circuit and that detects the resistivity of the second resistance element or a related value thereof; a calibration curve data storage unit that is for storing calibration curve data that indicates, using the hydrogen gas as a base gas and a predetermined single component gas other than the hydrogen gas as a span gas, the relationship between the resistivity of the second resistance element detected by the bridge circuit or a related value thereof and the concentration of the span gas; and a concentration calculation unit for estimating the total concentration of the impurity gas in the target gas in terms of a gas component in which the thermal conductivity is greater than or equal to that of oxygen, on the basis of the calibration curve data and the resistivity of the second resistance element detected by the bridge circuit or the related value thereof.

IPC Classes ?

G01N 25/18 - Investigating or analysing materials by the use of thermal means by investigating thermal conductivity
G01N 27/12 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body in dependence upon absorption of a fluidInvestigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body in dependence upon reaction with a fluid

25. MEASUREMENT PROBE, MEASUREMENT PROBE UNIT, MEASUREMENT DEVICE, AND MEASUREMENT METHOD

Application Number	JP2024044569
Publication Number	2025/142627
Status	In Force
Filing Date	2024-12-17
Publication Date	2025-07-03
Owner	HORIBA, LTD. (Japan)
Inventor	Wakabayashi Satoru

Abstract

Provided is a measurement probe for realizing a measurement device capable of measuring characteristic values of biopolymers, such as protein, in real time at a lower concentration than conventional devices. The measurement probe is used by being connected to a light source and a detector by means of an optical fiber, and comprises: a cylindrical housing having a first port and a second port formed at one end, the first port introducing light from a first optical fiber and outputting light to the first optical fiber, and the second port outputting light to a second optical fiber; a reflective member that is located inside the housing, is provided at an end of the housing on the opposite side to the end at which the first port and the second port are formed, and reflects and refracts light introduced from the first port toward the second port; and a measurement target liquid accommodating portion formed between two window members that are disposed on an output optical path passing between the reflective member and the second port.

IPC Classes ?

G01N 21/01 - Arrangements or apparatus for facilitating the optical investigation
G01N 21/47 - Scattering, i.e. diffuse reflection
G01N 21/59 - Transmissivity
G01N 21/64 - FluorescencePhosphorescence

26. VEHICLE TESTING SYSTEM, VEHICLE TESTING METHOD, AND VEHICLE TESTING PROGRAM

Application Number	JP2024043828
Publication Number	2025/142489
Status	In Force
Filing Date	2024-12-11
Publication Date	2025-07-03
Owner	HORIBA, LTD. (Japan)
Inventor	Shiota Aoi Kawazoe Hiroshi

Abstract

This vehicle testing system comprises: a first output pattern acquiring unit that acquires, as a first output pattern, travel data when a target vehicle travels in a prescribed environment; a second output pattern acquiring unit that acquires, as a second output pattern, travel data when a traveling vehicle travels along a prescribed travel route; a data acquiring unit that acquires, from the first output pattern, a plurality of items of similar data and a plurality of items of instantaneous energy consumption data; and a calculating unit that adds up a plurality of instantaneous energy consumptions to calculate a total energy consumption when the target vehicle is assumed to travel along the prescribed travel route.

IPC Classes ?

G01M 17/007 - Wheeled or endless-tracked vehicles

27. FLUORESCENCE MEASUREMENT PROBE, FLUORESCENCE MEASUREMENT PROBE UNIT, AND FLUORESCENCE MEASURING DEVICE

Application Number	JP2024044582
Publication Number	2025/142635
Status	In Force
Filing Date	2024-12-17
Publication Date	2025-07-03
Owner	HORIBA, LTD. (Japan)
Inventor	Wakabayashi, Satoru

Abstract

Provided is a fluorescence measuring device capable of measuring biopolymers such as proteins in real time at lower concentrations than in conventional devices. This fluorescence measurement probe is used by being connected by an optical fiber to a light source for irradiating a liquid being measured with excitation light and a detector for detecting fluorescence derived from the liquid being measured that is excited by the excitation light from the light source, the fluorescence measurement probe being provided with: a port for introducing the excitation light from the optical fiber and for guiding out fluorescence and scattered light from the liquid being measured to the optical fiber; a condensing optical system for collimating and/or condensing the excitation light, the fluorescence, and the scattered light; a polarizing plate transparent to the excitation light, the fluorescence, and the scattered light; and a housing for internally accommodating the condensing optical system and the polarizing plate and having an opening portion for injecting the excitation light into the liquid being measured and taking in the fluorescence and the scattered light from the liquid being measured.

IPC Classes ?

G01N 21/64 - FluorescencePhosphorescence

28. HYDROGEN ELECTROCHEMICAL SYSTEM, METHOD FOR DETERMINING STATE OF HYDROGEN CELL STACK, AND PROGRAM

Application Number	JP2024045705
Publication Number	2025/142931
Status	In Force
Filing Date	2024-12-24
Publication Date	2025-07-03
Owner	HORIBA, LTD. (Japan)
Inventor	Matsunaga Shimpachi Higa Kazushi Yamashita Tsubasa

Abstract

In the present invention, a hydrogen electrochemical system 100 comprises an acquisition unit 541, a storage unit 53, and a determination unit 544. The acquisition unit 541 acquires at least distribution information Ds2, De2, and Dt2 indicating the distribution of a physical quantity Q in a hydrogen cell stack 1. In the hydrogen cell stack 1, water is generated by an electrochemical reaction in which hydrogen is used, or vice versa. The storage unit 53 stores correlation data Dc. The correlation data Dc indicates a correlation between the state of the hydrogen cell stack 1 and a feature amount φ that is converted from at least the information Ds2 and De2 regarding the distribution in the hydrogen cell stack 1 in a state including a normal state and one or more abnormal states. On the basis of the correlation information Dc, the determination unit 544 determines the state of the hydrogen cell stack 1 from at least the distribution information Dt2 of the hydrogen cell stack 1 in operation.

IPC Classes ?

H01M 8/04 - Auxiliary arrangements, e.g. for control of pressure or for circulation of fluids
C25B 1/04 - Hydrogen or oxygen by electrolysis of water
C25B 9/00 - Cells or assemblies of cellsConstructional parts of cellsAssemblies of constructional parts, e.g. electrode-diaphragm assembliesProcess-related cell features
C25B 15/025 - Measuring, analysing or testing during electrolytic production of electrolyte parameters
C25B 15/027 - Temperature
H01M 8/10 - Fuel cells with solid electrolytes
H01M 8/0432 - TemperatureAmbient temperature
H01M 8/04492 - HumidityAmbient humidityWater content
H01M 8/04664 - Failure or abnormal function
H01M 8/04992 - Processes for controlling fuel cells or fuel cell systems characterised by the implementation of mathematical or computational algorithms, e.g. feedback control loops, fuzzy logic, neural networks or artificial intelligence

29. PARTICLE NUMBER MEASUREMENT SYSTEM, BRAKE INSPECTION SYSTEM, AND PARTICLE NUMBER MEASUREMENT METHOD

Application Number	JP2024036850
Publication Number	2025/134506
Status	In Force
Filing Date	2024-10-16
Publication Date	2025-06-26
Owner	HORIBA, LTD. (Japan)
Inventor	Kitahara, Takahiro Fukushima, Suguru

Abstract

The present invention reduces the cost for introducing a particle number measurement system, and reduces the difference between the uncertainty in measurement of the number of solid particles and the uncertainty in measurement of the total number of particles. The present invention comprises: a first diluter for diluting a sample gas; an evaporator for vaporizing volatile particles contained in the sample gas diluted by the first diluter; a second diluter for diluting the sample gas that has passed through the evaporator; a first particle number measurement device for measuring the number of particles contained in the sample gas diluted by the second diluter as the number of solid particles obtained by removing the volatile particles; and a second particle number measurement device for measuring the number of particles contained in the sample gas that has been diluted by the first diluter and is yet to pass through the evaporator as the total number of particles including the volatile particles.

IPC Classes ?

G01N 15/06 - Investigating concentration of particle suspensions
G01M 17/007 - Wheeled or endless-tracked vehicles
G01N 1/02 - Devices for withdrawing samples
G01N 15/00 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials

30. PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE

Application Number	JP2024042708
Publication Number	2025/134758
Status	In Force
Filing Date	2024-12-03
Publication Date	2025-06-26
Owner	HORIBA, LTD. (Japan)
Inventor	Sugasawa, Hirosuke

Abstract

The present invention is a particle size distribution measurement device, wherein is provided a history data management part 33 that facilitates integrated recognition of various stored operations, states of devices, and instantaneous values of particle size measurement results, and that causes a history data storage part D1 to store an operation history indicating the history of operations performed on the particle size distribution measurement device 100 by an operator, a measurement result history indicating the history of particle size measurement results, or a device state history indicating the history of the state of the particle size distribution measurement device 100, in a format that can be displayed as a time-series graph.

IPC Classes ?

G01N 15/0205 - Investigating particle size or size distribution by optical means

31. PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PARTICLE SIZE DISTRIBUTION MEASUREMENT PROGRAM

Application Number	JP2024043046
Publication Number	2025/134788
Status	In Force
Filing Date	2024-12-05
Publication Date	2025-06-26
Owner	HORIBA, LTD. (Japan)
Inventor	Sakuramoto, Keijiro Mori, Tetsuya

Abstract

This particle size distribution measurement system comprises: a cell that accommodates a test liquid containing particles; a test liquid supply unit that samples the test liquid from a generation flow passage through which the test liquid flows, and supplies the test liquid to the cell via a flow passage; a particle size distribution measurement unit that measures the particle size distribution of the particles by irradiating the test liquid with light and detecting scattered light produced from the particles; a cleaning liquid supply unit that, after the measurement of the particle size distribution is complete, supplies a cleaning liquid to the cell via a flow passage, said cleaning liquid being a liquid that cleans the cell; and a contamination determination unit that determines contamination of the cell on the basis of transmitted light and/or scattered light from the cell during a condition in which the cleaning liquid is supplied to the cell.

IPC Classes ?

G01N 15/0205 - Investigating particle size or size distribution by optical means
G01N 1/00 - SamplingPreparing specimens for investigation
G01N 21/15 - Preventing contamination of the components of the optical system or obstruction of the light path

32. INFORMATION PROCESSING METHOD, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM

Application Number	JP2024041560
Publication Number	2025/134691
Status	In Force
Filing Date	2024-11-25
Publication Date	2025-06-26
Owner	HORIBA, LTD. (Japan)
Inventor	Murata, Shunsuke

Abstract

Provided are an information processing method, an information processing device, and a computer program for outputting a response corresponding to a request of a user with respect to an analysis device.　In the present invention, a query pertaining to an analysis device is acquired, a language generation model is used to acquire a response pertaining to control of the analysis device corresponding to the query, and the response is output.

IPC Classes ?

G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

33. RADIATION DETECTION DEVICE, CONTROL METHOD, AND COMPUTER PROGRAM

Application Number	JP2024041367
Publication Number	2025/126801
Status	In Force
Filing Date	2024-11-22
Publication Date	2025-06-19
Owner	HORIBA, LTD. (Japan)
Inventor	Matsunaga, Daisuke Bamba, Tomohiro

Abstract

Provided are a radiation detection device, a control method, and a computer program capable of appropriately adjusting the temperature of a radiation detection element.　The radiation detection device comprises: a sample chamber inside which a sample is disposed; a radiation detection element that is disposed inside the sample chamber and is for detecting radiation generated from the sample; an atmosphere adjustment unit that adjusts the atmosphere inside the sample chamber to either a state in which the inside of the sample chamber is depressurized or a state in which a predetermined gas is introduced into the sample chamber; a temperature adjustment unit that adjusts the temperature of the radiation detection element; and a control unit. When the atmosphere adjustment unit adjusts the atmosphere inside the sample chamber to the state in which the predetermined gas is introduced, the control unit causes the temperature adjustment unit to adjust the temperature of the radiation detection element to a higher temperature than when the atmosphere adjustment unit adjusts the atmosphere inside the sample chamber to the state in which the inside of the sample chamber is depressurized.

IPC Classes ?

H01J 37/244 - DetectorsAssociated components or circuits therefor
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01T 7/00 - Details of radiation-measuring instruments
H01J 37/252 - Tubes for spot-analysing by electron or ion beamsMicroanalysers

34. BATTERY CHARGING DEVICE, BATTERY CHARGING METHOD, AND BATTERY CHARGING PROGRAM

Application Number	JP2024041531
Publication Number	2025/121172
Status	In Force
Filing Date	2024-11-22
Publication Date	2025-06-12
Owner	HORIBA, LTD. (Japan)
Inventor	Matsunaga, Shimpachi Tatsukawa, Shogo

Abstract

The present invention is for efficiently measuring internal resistance for use as a battery degradation index during battery charging, and comprises: a battery charging unit 2 that supplies charging current and/or voltage to a battery B; a battery management unit 3 that manages the charging state of the battery B; a pulse signal generation unit 4 that superimposes, at one or more charging points corresponding to the charging state of the battery B, pulse current or voltage on the charging current or voltage and supplies the same to the battery; an internal resistance calculation unit 5 that calculates the internal resistance of the battery B on the basis of the current value and the voltage value of the battery obtained when charging power superposed with pulse power has been supplied; and a data management unit 6 that records, in a memory, the internal resistance calculated by the internal resistance calculation unit 5.

IPC Classes ?

H02J 7/10 - Regulation of the charging current or voltage using discharge tubes or semiconductor devices using semiconductor devices only
G01R 31/382 - Arrangements for monitoring battery or accumulator variables, e.g. SoC
G01R 31/385 - Arrangements for measuring battery or accumulator variables
G01R 31/389 - Measuring internal impedance, internal conductance or related variables
G01R 31/392 - Determining battery ageing or deterioration, e.g. state of health
H01M 10/44 - Methods for charging or discharging
H01M 10/48 - Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
H02J 7/00 - Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries

35. PARTICLE ANALYZING DEVICE, PARTICLE ANALYSIS METHOD, AND PARTICLE ANALYSIS PROGRAM

Application Number	18841496
Status	Pending
Filing Date	2023-03-02
First Publication Date	2025-06-05
Owner	HORIBA, Ltd. (Japan)
Inventor	Tatewaki, Yasuhiro

Abstract

In analysis of a particle by a PTA method, in order to enable each particle to be analyzed for each type while suppressing increase in size and cost of a device even in a case where excitation wavelengths of fluorescent markers or particles having property of autofluorescence overlap each other, a light irradiation unit (2) that irradiates a sample emitting fluorescence of a plurality of colors with excitation light, one or a plurality of filters (5) that transmits the fluorescence of the plurality of colors while cutting off excitation light, an imaging unit (3) having color identification ability to image fluorescence passing through the filter (5), and an analysis unit (43) that obtains a diffusion rate due to Brownian motion of a particle included in a sample from image data of fluorescence obtained by the imaging unit (3) and analyzes physical property of the particle are included.

IPC Classes ?

G01N 15/1434 - Optical arrangements

36. SAMPLE CARRIER AND SAMPLE ANALYSIS SYSTEM

Application Number	JP2024038894
Publication Number	2025/115509
Status	In Force
Filing Date	2024-10-31
Publication Date	2025-06-05
Owner	HORIBA, LTD. (Japan)
Inventor	Kawakami, Shun Park, Sangwoon

Abstract

This sample carrier is used in a sample analyzer for extracting and analyzing a component, as a gas, generated by heating a measurement sample, and is detachably attached to a predetermined sample input position provided to the sample analyzer. The sample carrier comprises: a container body which has an accommodation chamber for accommodating the measurement sample therein, and which has formed on the bottom surface thereof a sample outlet port for discharging the measurement sample in the accommodation chamber; a bottom plate which is rotatably attached to a bottom part of the container body through a seal member, and on which through-holes are formed in a manner opening to the upper surface and the lower surface; and a distance adjustment mechanism for adjusting an inter-surface distance between the upper surface of the bottom plate and the bottom surface of the container body. The sample carrier is configured such that, by having one of the container body and the bottom plate rotate with respect to the other, the sample outlet port moves between: a predetermined sealed position where the sample outlet port is blocked by the upper surface of the bottom plate and the accommodating chamber is sealed airtight; and an open position where the sample outlet port opens to the through-holes of the bottom plate and the measurement sample can be discharged. The distance adjustment mechanism adjusts an inter-surface distance while the sample outlet port is moving between the sealed position and the open position so as to be longer than the inter-surface distance when the sample outlet port is at the sealed position.

IPC Classes ?

G01N 31/12 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroupsApparatus specially adapted for such methods using combustion
G01N 1/00 - SamplingPreparing specimens for investigation

37. PROCESSING ADJUSTING DEVICE, PARTICLE SIZE DISTRIBUTION MEASURING SYSTEM, PROCESSING ADJUSTING METHOD, AND PROCESSING ADJUSTING PROGRAM

Application Number	JP2024040665
Publication Number	2025/115654
Status	In Force
Filing Date	2024-11-15
Publication Date	2025-06-05
Owner	HORIBA, LTD. (Japan)
Inventor	Sakuramoto, Keijiro Mori, Tetsuya

Abstract

This processing adjusting device is for adjusting processes in a particle size distribution measuring system comprising a particle size distribution measuring unit that measures the particle size distribution of a sample, and a sample supply unit that samples the sample and supplies the sample to the particle size distribution measuring unit, the processing adjusting device comprising: a sampling interval accepting unit that accepts a sampling interval, which is a time from the start of a sampling process for sampling the sample to the start of the next sampling process; and a process time adjusting unit that, if the sampling interval accepted by the sampling interval accepting unit is equal to or less than a prescribed value, adjusts the processing time of at least one of the sampling process for sampling the sample, a measuring process for measuring the particle size distribution of the sample, a cleaning process for cleaning the particle size distribution measuring unit or the sample supply unit, and a standby process for waiting until the start of the next sampling process.

IPC Classes ?

G01N 15/0205 - Investigating particle size or size distribution by optical means
G01N 1/00 - SamplingPreparing specimens for investigation
G01N 15/00 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor

38. PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PARTICLE SIZE DISTRIBUTION MEASUREMENT PROGRAM

Application Number	JP2024040664
Publication Number	2025/115653
Status	In Force
Filing Date	2024-11-15
Publication Date	2025-06-05
Owner	HORIBA, LTD. (Japan)
Inventor	Sakuramoto, Keijiro Mori, Tetsuya

Abstract

This particle size distribution measurement system comprises: a particle size distribution measurement unit that measures the particle size distribution of specimens; a specimen supply unit that samples the specimens and supplies the sampled specimens to the particle size distribution measurement unit through a flow path through which the sampled specimens flow; and an arrival time calculation unit that calculates, on the basis of flow path information that is information about the flow path, an arrival time that is the period of time from when the specimens are sampled to when the specimens reach the particle size distribution measurement unit.

IPC Classes ?

G01N 15/0205 - Investigating particle size or size distribution by optical means
G01N 1/00 - SamplingPreparing specimens for investigation
G01N 1/10 - Devices for withdrawing samples in the liquid or fluent state
G01N 15/00 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials
G01N 15/0227 - Investigating particle size or size distribution by optical means using imagingInvestigating particle size or size distribution by optical means using holography

39. MACHINE LEARNING DEVICE, VEHICLE TESTING SYSTEM, MACHINE LEARNING METHOD, AND VEHICLE TESTING METHOD

Application Number	18868716
Status	Pending
Filing Date	2023-05-15
First Publication Date	2025-05-29
Owner	HORIBA, LTD. (Japan)
Inventor	Komatsu, Yoji Nagaoka, Makoto

Abstract

The present invention makes it possible to simplify the task of reproducing a load such as a road gradient resistance or the like when a vehicle is actually traveling on a road, and includes a learning data acquisition unit that acquires learning data formed by load data that includes a road gradient resistance of a travel route and driving resistance variables deriving from a vehicle's behavior, and by vehicle traveling data that includes a vehicle's speed, accelerator pedal position, and brake pedal position when that vehicle is traveling on the travel route, and a machine learning unit that employs machine learning to determine a correlation between the load data and the vehicle traveling data, and then creates a simulated gradient prediction model that shows the correlation between the load data and the vehicle traveling data.

IPC Classes ?

G06F 30/27 - Design optimisation, verification or simulation using machine learning, e.g. artificial intelligence, neural networks, support vector machines [SVM] or training a model
G01M 17/007 - Wheeled or endless-tracked vehicles
G06F 119/14 - Force analysis or force optimisation, e.g. static or dynamic forces

40. ANALYSIS DEVICE, ANALYSIS SYSTEM, ANALYSIS METHOD, AND PROGRAM

Application Number	JP2024038226
Publication Number	2025/105150
Status	In Force
Filing Date	2024-10-25
Publication Date	2025-05-22
Owner	HORIBA, LTD. (Japan)
Inventor	Yamaguchi, Kazuki

Abstract

The objective of the present invention is to accurately calculate an amount of particulate matter without being affected by changes in the amount of light emitted onto the particulate matter. An analysis device (100) comprises: a holding member (1) that holds particulate matter (FP); a light source (3) that emits light toward an imaging target area (VA) including a holding area of the holding member (1) in which the particulate matter (FP) is held; a two-dimensional sensor (4) that images the imaging target area (VA); and a calculating unit (5) that calculates particle amount-related information relating to the amount of particulate matter (FP) on the basis of analysis image data acquired by employing the two-dimensional sensor (4) to image the imaging target area (VA) for use in analyzing the particulate matter (FP), and an impact resulting from a change in the amount of light from the light source (3) when the analysis image data were acquired, relative to a reference amount of light.

IPC Classes ?

G01N 15/075 - Investigating concentration of particle suspensions by optical means
G01N 1/02 - Devices for withdrawing samples
G01N 21/17 - Systems in which incident light is modified in accordance with the properties of the material investigated
G06T 7/00 - Image analysis
G06V 20/69 - Microscopic objects, e.g. biological cells or cellular parts

41. PARTICLE ANALYSIS DEVICE, PARTICLE ANALYSIS DEVICE PROGRAM, AND PARTICLE ANALYSIS METHOD

Application Number	18841503
Status	Pending
Filing Date	2023-03-28
First Publication Date	2025-05-22
Owner	HORIBA, Ltd. (Japan)
Inventor	Sugasawa, Hirosuke Tatewaki, Yasuhiro Igushi, Tatsuo

Abstract

A particle analysis device can take a fluorescence observation mode in which fluorescence emitted by a fluorescent marker added to a particle or by the particle itself is imaged by irradiating the particle with excitation light, and a scattered light observation mode in which scattered light produced by irradiating the particle with the light is imaged. A particle specifying unit specifies the particle to which the fluorescent marker is added or the particle that emits the fluorescence from fluorescence image data obtained in the fluorescence observation mode. An analyzing unit analyzes physical properties of the particle by obtaining diffusion speed due to the Brownian motion of the particle specified by the particle specifying unit from the image data of the scattered light obtained in the scattered light observation mode having a frame number larger than that in the fluorescence observation mode.

IPC Classes ?

G01N 15/1434 - Optical arrangements
G01N 15/01 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials specially adapted for biological cells, e.g. blood cells
G01N 33/58 - Chemical analysis of biological material, e.g. blood, urineTesting involving biospecific ligand binding methodsImmunological testing involving labelled substances

42. X-RAY ANALYSIS DEVICE

Application Number	JP2024038984
Publication Number	2025/105205
Status	In Force
Filing Date	2024-10-31
Publication Date	2025-05-22
Owner	HORIBA, LTD. (Japan)
Inventor	Aoyama, Tomoki Ohashi, Satoshi Tajima, Mikiya

Abstract

An x-ray analysis device according to the present invention is to analyze the elements included in a measurement sample transported in a prescribed direction and comprises an x-ray irradiation unit that radiates x-rays toward the measurement sample, an x-ray detection unit that faces the measurement sample and detects x-ray fluorescence produced from the measurement sample, and a standard sample that has a known element content and is provided in a region of overlap between a region irradiated with the x-rays radiated from the x-ray irradiation unit and a region in which x-ray fluorescence can be detected by the x-ray detection unit.

IPC Classes ?

G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

43. HYDROGEN DETECTION DEVICE AND HYDROGEN DETECTION METHOD

Application Number	JP2024033736
Publication Number	2025/100115
Status	In Force
Filing Date	2024-09-20
Publication Date	2025-05-15
Owner	HORIBA, LTD. (Japan)
Inventor	Shiba, Takumi Naya, Hiroshi

Abstract

This hydrogen detection device for detecting hydrogen contained in a gas in a chamber or in a pipe comprises: a casing which is inserted into the chamber or the pipe and has an internal space into which the gas can be introduced; a physical quantity change part which is provided in the internal space and in which a physical quantity changes according to the concentration of the hydrogen; and a physical quantity detection part which is provided in the internal space and detects the physical quantity in the physical quantity change part. The internal space is separated into a first space and a second space by a separation member. The gas is introduced into the first space and the physical quantity change part is housed in the first space. The gas is not introduced into the second space and the physical quantity detection part is housed in the second space.

IPC Classes ?

G01N 21/78 - Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a change of colour

44. PARTICLE SIZE DISTRIBUTION MEASURING DEVICE, PARTICLE SIZE DISTRIBUTION MEASURING METHOD, PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASURING DEVICE, AND KIT FOR PARTICLE SIZE DISTRIBUTION MEASURING DEVICE

Application Number	18728676
Status	Pending
Filing Date	2023-01-18
First Publication Date	2025-05-15
Owner	HORIBA, Ltd. (Japan)
Inventor	Tatewaki, Yasuhiro

Abstract

A particle size distribution measuring device includes: a measurement cell including a sample accommodation space that accommodates a sample obtained by dispersing a plurality of particles in a dispersion medium; a stirring means that stirs the sample by sucking and discharging the sample in the measurement cell; a light irradiation unit that irradiates the sample in the measurement cell with light; a light detection unit that detects scattered light or fluorescent light generated from the sample in the measurement cell; and an analysis unit that measures a particle size distribution of a particle group including the plurality of particles using a detection signal obtained by the light detection unit.

IPC Classes ?

G01N 15/0205 - Investigating particle size or size distribution by optical means
G01N 1/38 - Diluting, dispersing or mixing samples
G01N 15/01 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials specially adapted for biological cells, e.g. blood cells

45. PITOT TUBE FLOWMETER, GAS ANALYSIS DEVICE, AND GAS ANALYSIS METHOD

Application Number	18835696
Status	Pending
Filing Date	2023-03-02
First Publication Date	2025-05-08
Owner	HORIBA, LTD. (Japan)
Inventor	Mizutani, Naoto Nagaoka, Makoto Inoue, Kentaro Uraoka, Masaru Iseki, Hirotaka

Abstract

The present invention makes a pitot tube type flowmeter less affected by the flow velocity distribution caused by the flow passage shape on the upstream side, and includes a pitot tube having total pressure holes for detecting a total pressure of a fluid and static pressure holes for detecting a static pressure of the fluid, and a differential pressure sensor that is connected to the pitot tube and detects a differential pressure between the total pressure and the static pressure. The pitot tube includes a main tube portion, and a plurality of branch tube portions, which branches off from the main tube portion and in which the total pressure holes and the static pressure holes are formed. Each of the main tube portion and the plurality of branch tube portions has a shape that reduces a pressure loss.

IPC Classes ?

G01F 1/46 - Pitot tubes
G01P 5/165 - Arrangements or constructions of Pitot tubes

46. DILUTION MECHANISM, PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASUREMENT

Application Number	18728729
Status	Pending
Filing Date	2023-01-17
First Publication Date	2025-05-01
Owner	HORIBA, Ltd. (Japan) HORIBA Advanced Techno, Co., Ltd. (Japan)
Inventor	Sakuramoto, Keijiro Mori, Tetsuya Habu, Kazunori

Abstract

A dilution mechanism includes: a sample line that guides the sample containing the particles to the particle size distribution measurement device; a dilution line that merges with the sample line and through which a diluent flows; a concentration adjusting unit that adjusts the concentration of the particles contained in the diluted sample; a conductivity measuring unit that measures a conductivity of the diluted sample; a control unit that controls the concentration adjusting unit to bring the conductivity measured by the conductivity measuring unit or a conductivity-related value that is a value calculated from the conductivity, to a predetermined target value.

IPC Classes ?

G01N 15/06 - Investigating concentration of particle suspensions
G01N 1/38 - Diluting, dispersing or mixing samples
G01N 15/14 - Optical investigation techniques, e.g. flow cytometry

47. DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING DEVICE, DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING METHOD, AND DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING PROGRAM

Application Number	JP2024037561
Publication Number	2025/089267
Status	In Force
Filing Date	2024-10-22
Publication Date	2025-05-01
Owner	HORIBA, LTD. (Japan)
Inventor	Sakuramoto, Keijiro

Abstract

Provided is a dynamic light scattering type particle diameter distribution measuring device comprising: a light irradiation unit that irradiates a sample flowing through a flow path with light; a light detection unit that detects light scattered by the sample; a particle diameter distribution calculation unit that calculates the particle diameter distribution of the sample on the basis of the light intensity obtained by the light detection unit; a flow rate acquisition unit that acquires the flow rate of the sample flowing through the flow path; and a particle diameter distribution correction unit that corrects the particle diameter distribution calculated by the particle diameter distribution calculation unit, on the basis of the flow rate acquired by the flow rate acquisition unit.

IPC Classes ?

G01N 15/0205 - Investigating particle size or size distribution by optical means

48. SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETECTION APPARATUS AND RECORDING MEDIUM

Application Number	18682769
Status	Pending
Filing Date	2022-08-12
First Publication Date	2025-04-24
Owner	HORIBA, LTD. (Japan)
Inventor	Murata, Shunsuke Valiev, Ildar

Abstract

A signal processing method for processing a signal including a response wave generated in response to detection of radiation, includes: measuring a feature corresponding to a duration of a response wave or a response wave group composed of a plurality of response waves; counting, for each wave height, the number of response waves or response wave groups whose measured features are included in a predetermined first range in which a feature of a single response wave is included; and performing correction processing of subtracting a specific value from a counted number according to a response wave or a response wave group whose feature is not included in the first range.

IPC Classes ?

G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
G01T 1/17 - Circuit arrangements not adapted to a particular type of detector

49. RADIATION DETECTION ELEMENT MANUFACTURING METHOD, RADIATION DETECTION ELEMENT, AND RADIATION DETECTOR

Application Number	JP2024035360
Publication Number	2025/079486
Status	In Force
Filing Date	2024-10-03
Publication Date	2025-04-17
Owner	HORIBA, LTD. (Japan)
Inventor	Ishikura, Koji

Abstract

Provided are a radiation detection element manufacturing method, a radiation detection element, and a radiation detector that make it possible to accurately detect radiation having low energy.　This radiation detection element manufacturing method comprises: forming an oxide layer composed of an oxide of a semiconductor on a first semiconductor layer; forming a second semiconductor layer on the oxide layer; and implanting, into the first semiconductor layer via the second semiconductor layer and the oxide layer, ions of a dopant that alters a semiconductor forming the first semiconductor layer to a semiconductor of a different type, thereby forming a doping layer composed of a semiconductor doped with the dopant between the first semiconductor layer and the oxide layer.

IPC Classes ?

G01T 1/24 - Measuring radiation intensity with semiconductor detectors

50. X-RAY ANALYSIS DEVICE, X-RAY ANALYSIS METHOD, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM

Application Number	JP2024034558
Publication Number	2025/070683
Status	In Force
Filing Date	2024-09-27
Publication Date	2025-04-03
Owner	HORIBA, LTD. (Japan)
Inventor	Aoyama, Tomoki

Abstract

Provided are: an X-ray analysis device that is capable of individually measuring the amounts of elements contained in layers on the obverse surface side and the reverse surface side of a multilayer sample; an X-ray analysis method; an information processing device; and a computer program.　This X-ray analysis device is provided with: an emission unit that emits X-rays to a sample in which a plurality of layers are laminated, so as to sequentially penetrate a first layer, an intermediate layer, and a second layer; a fluorescent X-ray detector that detects fluorescent X-rays generated from the first layer or the second layer; a penetrating X-ray detector that detects penetrating X-rays that have penetrated the sample; and an analysis unit. The analysis unit calculates the amount of a specific element contained in one of the first layer or the second layer in accordance with the intensity of fluorescent X-rays having a prescribed first energy, calculates the total amount of the specific element contained in the first layer and the second layer in accordance with the intensity of penetrating X-rays having a prescribed second energy higher than the first energy, and calculates the amount of the specific element contained in the other of the first layer or the second layer.

IPC Classes ?

G01N 23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

51. PLATINALINK

Application Number	1847626
Status	Registered
Filing Date	2024-12-13
Registration Date	2024-12-13
Owner	HORIBA, Ltd. (Japan)
NICE Classes ?	09 - Scientific and electric apparatus and instruments 37 - Construction and mining; installation and repair services 42 - Scientific, technological and industrial services, research and design

Goods & Services

Computer software for verifying data integrity; computer software for verifying data accuracy, completeness and consistency; computer software for access control, user identification, verification and security management; computer software for generating reports regarding data integrity; computer software for generating reports regarding data accuracy, completeness and consistency; computer software for measuring, controlling, testing, experimenting, data collection and management of engines, brakes and drives and apparatus attached thereto for vehicles and automobiles; computer software for measuring, controlling, testing, experimenting, data collection and management of pharmaceuticals, cosmetics, foodstuffs and dietary supplements; computer software for measuring, controlling, testing, experimenting, data collection and management of solid samples, gaseous samples and liquid samples; computer software for use with measuring or testing machines and instruments; computer software for use with laboratory apparatus and instruments; computer software; electronic computer and data processing machines and apparatus and their parts; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus. Repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of electronic machines and apparatus; repair or maintenance of optical machines and apparatus. Design, programming and maintenance of computer software for verifying data integrity; design, programming and maintenance of computer software for verifying data accuracy, completeness and consistency; design, programming and maintenance of computer software for access control, user identification, verification and security management; design, programming and maintenance of computer software; computer software design, computer programming, or maintenance of computer software; rental of computer software for verifying data integrity; rental of computer software for verifying data accuracy, completeness and consistency; rental of computer software for access control, user identification, verification and security management; rental of computer software; providing on-line non-downloadable computer software for verifying data integrity; providing on-line non-downloadable computer software for verifying data accuracy, completeness and consistency; providing on-line non-downloadable computer software for access control, user identification, verification and security management; providing on-line non-downloadable computer software; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of measuring or testing machines and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of electronic machines and apparatus; calibration of optical machines and apparatus; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of electronic machines and apparatus; design of optical machines and apparatus; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; technological advice relating to computers, automobiles and industrial machines; testing or research on measuring or testing machines and instruments.

52. HORIBA PLATINALINK

Application Number	1847627
Status	Registered
Filing Date	2024-12-13
Registration Date	2024-12-13
Owner	HORIBA, Ltd. (Japan)
NICE Classes ?	09 - Scientific and electric apparatus and instruments 37 - Construction and mining; installation and repair services 42 - Scientific, technological and industrial services, research and design

Goods & Services

53. ANALYSIS DEVICE AND ANALYSIS METHOD

Application Number	JP2024031091
Publication Number	2025/062997
Status	In Force
Filing Date	2024-08-29
Publication Date	2025-03-27
Owner	HORIBA, LTD. (Japan)
Inventor	Park, Sangwoon

Abstract

This analysis device is provided with: an impulse heating furnace or a high-frequency heating furnace that heats a sample to generate a sample gas containing elements that constitute the sample; a suction flow path that sucks the sample gas generated in the impulse heating furnace or the high-frequency heating furnace by means of a suction unit; and an element detecting unit that is provided in the suction flow path to detect the elements contained in the sample gas.

IPC Classes ?

G01N 31/12 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroupsApparatus specially adapted for such methods using combustion

54. VEHICLE ELEMENT RESPONSE LEARNING METHOD, VEHICLE ELEMENT RESPONSE CALCULATION METHOD, VEHICLE ELEMENT RESPONSE LEARNING SYSTEM, AND VEHICLE ELEMENT RESPONSE LEARNING PROGRAM

Application Number	18293282
Status	Pending
Filing Date	2022-07-29
First Publication Date	2025-03-20
Owner	HORIBA, LTD. (Japan)
Inventor	Tabata, Kunio Roberts, Philip Bates, Luke Whelan, Steven

Abstract

The present invention is to accurately obtain a vehicle element response data under a desired driving environment by simulation without performing actual road driving and is a vehicle element response learning method for generating a trained model related to a response of a vehicle element that is a vehicle or a part of the vehicle, and the method includes: (1) an input step of giving an input including parameters related to a vehicle speed, a load, and a temperature assuming actual road driving, to the vehicle element; (2) an acquisition step of acquiring response data of the vehicle element and acquiring, as training data, input data representing the input and the response data; and (3) a generation step of generating the trained model related to the response of the vehicle element, from the training data by using machine learning.

IPC Classes ?

G01M 17/007 - Wheeled or endless-tracked vehicles

55. ANALYSIS DEVICE, SPECIMEN EVALUATION SYSTEM, AND ANALYSIS METHOD

Application Number	JP2024031162
Publication Number	2025/053065
Status	In Force
Filing Date	2024-08-30
Publication Date	2025-03-13
Owner	HORIBA, LTD. (Japan) HORIBA ADVANCED TECHNO, CO., LTD. (Japan)
Inventor	Miyamura, Kazuhiro Okada, Yoichi Yamashita, Tsubasa

Abstract

Provided is an analysis device used in a specimen evaluation device that evaluates the state of a specimen by analyzing a waste liquid from the specimen. This analysis device comprises a component concentration measurement unit that is connected to a discharge gas flow passage through which a post-dilution waste liquid obtained by diluting the waste liquid discharged from the specimen by a diluent flows and that measures the concentration of a component contained in the post-dilution waste liquid.

IPC Classes ?

H01M 8/0444 - ConcentrationDensity
C25B 15/023 - Measuring, analysing or testing during electrolytic production
G01N 1/22 - Devices for withdrawing samples in the gaseous state
G01N 5/00 - Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid
H01M 8/04 - Auxiliary arrangements, e.g. for control of pressure or for circulation of fluids
H01M 8/02 - Fuel cellsManufacture thereof Details
H01M 8/10 - Fuel cells with solid electrolytes
H01M 8/12 - Fuel cells with solid electrolytes operating at high temperature, e.g. with stabilised ZrO2 electrolyte

56. SPECIMEN TESTING SYSTEM, INFORMATION PROCESSING METHOD, AND COMPUTER PROGRAM

Application Number	JP2024028237
Publication Number	2025/047353
Status	In Force
Filing Date	2024-08-07
Publication Date	2025-03-06
Owner	HORIBA, LTD. (Japan)
Inventor	Tabata, Kunio Shimura, Miyoko Yamamoto, Mitsunobu

Abstract

Provided are a specimen testing system, an information processing method, and a computer program for preventing alteration of data pertaining to measurement.　The specimen testing system comprises a measurement device and an information processing device. The measurement device acquires, in accordance with a prescribed rule, a measurement result required to assess the state of a specimen, generates measurement data representing the measurement result, and stores, in association with each other: protected device data that includes device data and a hash vale for the device data, said device data representing a result of testing whether the state of the measurement device follows the prescribed rule; and protected measurement data that includes the measurement data and a hash value for the measurement data.

IPC Classes ?

G06F 21/64 - Protecting data integrity, e.g. using checksums, certificates or signatures

57. ENERGY MANAGEMENT SYSTEM, ENERGY MANAGEMENT METHOD, AND ENERGY MANAGEMENT PROGRAM

Application Number	JP2024027995
Publication Number	2025/033401
Status	In Force
Filing Date	2024-08-06
Publication Date	2025-02-13
Owner	HORIBA, LTD. (Japan)
Inventor	Iwao, Keijiro Kakino, Toru Ishikuma, Toru

Abstract

The present invention is an energy management system that realizes energy conservation focusing on a frequency distribution indicating the frequency of energy consumption amounts in an energy demand facility, the energy management system managing consumed energy in the energy demand facility, wherein the energy management system comprises a clustering unit for clustering past energy consumption amounts for the energy demand facility into a plurality of clusters on the basis of a prescribed condition, a modeling unit for modeling a frequency distribution indicating the frequency of the energy consumption amounts in each cluster into a distribution having at least one positive skew, and a schedule adjustment unit for adjusting the operation schedule of the energy demand facility so as to reduce the variance of the modeled distribution.

IPC Classes ?

G06Q 50/04 - Manufacturing

58. GAS ANALYSIS DEVICE, GAS ANALYSIS METHOD, AND PROGRAM FOR GAS ANALYSIS DEVICE

Application Number	18696835
Status	Pending
Filing Date	2022-10-03
First Publication Date	2025-01-30
Owner	HORIBA, LTD. (Japan)
Inventor	Nagura, Naoki Kawabuchi, Yasushi Takahashi, Daichi Hara, Kenji Kikuta, Takayuki Yoshioka, Masaya Nakamura, Kotaro

Abstract

A gas analysis device includes a sample cell into which sample gas is introduced, a light source that irradiates the sample cell with light, a photodetector that detects light intensity of light which passes through the sample cell irradiated by the light source, a concentration calculation unit which calculates a concentration of a measurement target component contained in the sample gas based on light intensity outputted from the photodetector, and a light intensity output unit that outputs, comparably with a reference light intensity set in advance, a light intensity at calibration detected by the photodetector during calibration.

IPC Classes ?

G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
G01N 1/22 - Devices for withdrawing samples in the gaseous state
G01N 21/03 - Cuvette constructions
G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

59.

Miscellaneous Design

Application Number	1835060
Status	Registered
Filing Date	2024-11-28
Registration Date	2024-11-28
Owner	HORIBA, Ltd. (Japan)
NICE Classes ?	09 - Scientific and electric apparatus and instruments 10 - Medical apparatus and instruments

Goods & Services

Computer software; computer software for medical use; computer software for electronic chart for medical purposes; computer software for veterinary use; computer software for electronic chart for veterinary purposes; computer programs; measuring or testing machines and instruments; laboratory apparatus and instruments; photographic machines and apparatus; optical machines and apparatus. Medical apparatus and instruments; diagnostic apparatus and instruments; veterinary apparatus and instruments; veterinary diagnostic apparatus and instruments.

60. BLOOD ANALYSIS APPARATUS, BLOOD ANALYSIS METHOD, AND RECORDING MEDIUM

Application Number	18715686
Status	Pending
Filing Date	2022-11-28
First Publication Date	2025-01-23
Owner	HORIBA, Ltd. (Japan)
Inventor	Isshiki, Ryota Ikeda, Motohide Osawa, Kenta

Abstract

A blood analysis apparatus includes: a container information acquisition portion that acquires container information on the type of sample container to be used; a needle that sucks and discharges a blood sample contained in the sample container; a blood analysis portion having a chamber that receives the blood sample sucked from the sample container and discharged into it with the needle; and a control portion that controls suction and discharge of the blood sample with the needle based on the container information. The control portion sets the amount of blood sample to be sucked with the needle based on the container information.

IPC Classes ?

G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
G01N 1/14 - Suction devices, e.g. pumpsEjector devices
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor

61. OUTPUT DEVICE, BLOOD ANALYSIS APPARATUS, BLOOD ANALYSIS METHOD, AND RECORDING MEDIUM

Application Number	18715671
Status	Pending
Filing Date	2022-11-28
First Publication Date	2025-01-16
Owner	HORIBA, Ltd. (Japan)
Inventor	Nishimori, Masashi Ohashi, Akika Nakagawa, Yohei

Abstract

An output device includes: a measurement information reception portion configured to receive measurement information including a measurement result on a blood sample; a code information generation portion configured to generate code information by adding the measurement information to browsing destination information indicating a browsing destination at which to browse the measurement information; and an output portion configured to output the code information.

IPC Classes ?

G16H 10/40 - ICT specially adapted for the handling or processing of patient-related medical or healthcare data for data related to laboratory analysis, e.g. patient specimen analysis
G01N 33/48 - Biological material, e.g. blood, urineHaemocytometers
G06F 21/60 - Protecting data
G06K 19/06 - Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code

62. RADIATION DETECTION DEVICE AND SIGNAL PROCESSING METHOD

Application Number	JP2024021278
Publication Number	2025/013496
Status	In Force
Filing Date	2024-06-12
Publication Date	2025-01-16
Owner	HORIBA, LTD. (Japan)
Inventor	Matsunaga, Daisuke Murata, Shunsuke Ohashi, Satoshi Valiev, Ildar Aoyama, Tomoki Okubo, Yuji

Abstract

Provided are a radiation detection device and a signal processing method that are capable of preventing damage to a radiation detector.　The radiation detection device comprises: a radiation detector that outputs a signal in response to the entry of radiation or light; and a stop processing unit that determines whether excessive radiation or excessive light has entered the radiation detector on the basis of the signal output from the radiation detector, and that stops the operation of the radiation detector or stops the generation of radiation or light when it is determined that excessive radiation or excessive light has entered the radiation detector.

IPC Classes ?

G01T 1/17 - Circuit arrangements not adapted to a particular type of detector
G01T 1/24 - Measuring radiation intensity with semiconductor detectors

63. VERIDRIVE

Application Number	1833419
Status	Registered
Filing Date	2024-11-26
Registration Date	2024-11-26
Owner	HORIBA, Ltd. (Japan)
NICE Classes ?	09 - Scientific and electric apparatus and instruments 37 - Construction and mining; installation and repair services 42 - Scientific, technological and industrial services, research and design

Goods & Services

Measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measurement apparatus and instruments for engine emission, and parts and fittings therefor; measurement apparatus and instruments for emission, and parts and fittings therefor; measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; measurement apparatus and instruments for process gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; on-board measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for emission, and parts and fittings therefor; on-board measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measurement apparatus and instruments for process gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; portable measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for emission, and parts and fittings therefor; portable measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measurement apparatus and instruments for process gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; measurement apparatus and instruments for automobile emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for automobile emission, and parts and fittings therefor; measurement apparatus and instruments for vehicle emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle emission, and parts and fittings therefor; vehicle engine testing apparatus and instruments, and parts and fittings therefor; automotive engine testing apparatus and instruments, and parts and fittings therefor; engine testing apparatus and instruments, and parts and fittings therefor; computer software for controlling measurement apparatus and instruments for vehicle engine emission; computer software for controlling measurement apparatus and instruments for engine emission; computer software for controlling measurement apparatus and instruments for emission; computer software for controlling measurement apparatus and instruments for exhaust gases; computer software for controlling measurement apparatus and instruments for process gases; computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; computer software for controlling measuring and analyzing apparatus and instruments for engine emission; computer software for controlling measuring and analyzing apparatus and instruments for emission; computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; computer software for controlling measuring and analyzing apparatus and instruments for process gases; computer software for controlling engine testing apparatus and instruments; computer software; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; cinematographic machines and apparatus; photographic machines and apparatus. Repair or maintenance of measurement apparatus and instruments for vehicle engine emission; repair or maintenance of measurement apparatus and instruments for engine emission; repair or maintenance of measurement apparatus and instruments for emission; repair or maintenance of measurement apparatus and instruments for exhaust gases; repair or maintenance of measurement apparatus and instruments for process gases; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for emission; repair or maintenance of measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of measuring and analyzing apparatus and instruments for process gases; repair or maintenance of on-board measurement apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measurement apparatus and instruments for engine emission; repair or maintenance of on-board measurement apparatus and instruments for emission; repair or maintenance of on-board measurement apparatus and instruments for exhaust gases; repair or maintenance of on-board measurement apparatus and instruments for process gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for process gases; repair or maintenance of portable measurement apparatus and instruments for vehicle engine emission; repair or maintenance of portable measurement apparatus and instruments for engine emission; repair or maintenance of portable measurement apparatus and instruments for emission; repair or maintenance of portable measurement apparatus and instruments for exhaust gases; repair or maintenance of portable measurement apparatus and instruments for process gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for process gases; repair or maintenance of measurement apparatus and instruments for automobile emission; repair or maintenance of measuring and analyzing apparatus and instruments for automobile emission; repair or maintenance of measurement apparatus and instruments for vehicle emission; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle emission; repair or maintenance of vehicle engine testing apparatus and instruments; repair or maintenance of automotive engine testing apparatus and instruments; repair or maintenance of engine testing apparatus and instruments; repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of optical machines and apparatus; repair or maintenance of cinematographic machines and apparatus; repair or maintenance of photographic machines and apparatus. Rental of measurement apparatus and instruments for vehicle engine emission; rental of measurement apparatus and instruments for engine emission; rental of measurement apparatus and instruments for emission; rental of measurement apparatus and instruments for exhaust gases; rental of measurement apparatus and instruments for process gases; rental of measuring and analyzing apparatus and instruments for vehicle engine emission; rental of measuring and analyzing apparatus and instruments for engine emission; rental of measuring and analyzing apparatus and instruments for emission; rental of measuring and analyzing apparatus and instruments for exhaust gases; rental of measuring and analyzing apparatus and instruments for process gases; rental of on-board measurement apparatus and instruments for vehicle engine emission; rental of on-board measurement apparatus and instruments for engine emission; rental of on-board measurement apparatus and instruments for emission; rental of on-board measurement apparatus and instruments for exhaust gases; rental of on-board measurement apparatus and instruments for process gases; rental of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; rental of on-board measuring and analyzing apparatus and instruments for engine emission; rental of on-board measuring and analyzing apparatus and instruments for emission; rental of on-board measuring and analyzing apparatus and instruments for exhaust gases; rental of on-board measuring and analyzing apparatus and instruments for process gases; rental of portable measurement apparatus and instruments for vehicle engine emission; rental of portable measurement apparatus and instruments for engine emission; rental of portable measurement apparatus and instruments for emission; rental of portable measurement apparatus and instruments for exhaust gases; rental of portable measurement apparatus and instruments for process gases; rental of portable measuring and analyzing apparatus and instruments for vehicle engine emission; rental of portable measuring and analyzing apparatus and instruments for engine emission; rental of portable measuring and analyzing apparatus and instruments for emission; rental of portable measuring and analyzing apparatus and instruments for exhaust gases; rental of portable measuring and analyzing apparatus and instruments for process gases; rental of measurement apparatus and instruments for automobile emission; rental of measuring and analyzing apparatus and instruments for automobile emission; rental of measurement apparatus and instruments for vehicle emission; rental of measuring and analyzing apparatus and instruments for vehicle emission; rental of vehicle engine testing apparatus and instruments; rental of automotive engine testing apparatus and instruments; rental of engine testing apparatus and instruments; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; calibration of measurement apparatus and instruments for vehicle engine emission; calibration of measurement apparatus and instruments for engine emission; calibration of measurement apparatus and instruments for emission; calibration of measurement apparatus and instruments for exhaust gases; calibration of measurement apparatus and instruments for process gases; calibration of measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of measuring and analyzing apparatus and instruments for engine emission; calibration of measuring and analyzing apparatus and instruments for emission; calibration of measuring and analyzing apparatus and instruments for exhaust gases; calibration of measuring and analyzing apparatus and instruments for process gases; calibration of on-board measurement apparatus and instruments for vehicle engine emission; calibration of on-board measurement apparatus and instruments for engine emission; calibration of on-board measurement apparatus and instruments for emission; calibration of on-board measurement apparatus and instruments for exhaust gases; calibration of on-board measurement apparatus and instruments for process gases; calibration of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of on-board measuring and analyzing apparatus and instruments for engine emission; calibration of on-board measuring and analyzing apparatus and instruments for emission; calibration of on-board measuring and analyzing apparatus and instruments for exhaust gases; calibration of on-board measuring and analyzing apparatus and instruments for process gases; calibration of portable measurement apparatus and instruments for vehicle engine emission; calibration of portable measurement apparatus and instruments for engine emission; calibration of portable measurement apparatus and instruments for emission; calibration of portable measurement apparatus and instruments for exhaust gases; calibration of portable measurement apparatus and instruments for process gases; calibration of portable measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of portable measuring and analyzing apparatus and instruments for engine emission; calibration of portable measuring and analyzing apparatus and instruments for emission; calibration of portable measuring and analyzing apparatus and instruments for exhaust gases; calibration of portable measuring and analyzing apparatus and instruments for process gases; calibration of measurement apparatus and instruments for automobile emission; calibration of measuring and analyzing apparatus and instruments for automobile emission; calibration of measurement apparatus and instruments for vehicle emission; calibration of measuring and analyzing apparatus and instruments for vehicle emission; calibration of vehicle engine testing apparatus and instruments; calibration of automotive engine testing apparatus and instruments; calibration of engine testing apparatus and instruments; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of optical machines and apparatus; calibration of cinematographic machines and apparatus; calibration of photographic machines and apparatus; design of measurement apparatus and instruments for vehicle engine emission; design of measurement apparatus and instruments for engine emission; design of measurement apparatus and instruments for emission; design of measurement apparatus and instruments for exhaust gases; design of measurement apparatus and instruments for process gases; design of measuring and analyzing apparatus and instruments for vehicle engine emission; design of measuring and analyzing apparatus and instruments for engine emission; design of measuring and analyzing apparatus and instruments for emission; design of measuring and analyzing apparatus and instruments for exhaust gases; design of measuring and analyzing apparatus and instruments for process gases; design of on-board measurement apparatus and instruments for vehicle engine emission; design of on-board measurement apparatus and instruments for engine emission; design of on-board measurement apparatus and instruments for emission; design of on-board measurement apparatus and instruments for exhaust gases; design of on-board measurement apparatus and instruments for process gases; design of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; design of on-board measuring and analyzing apparatus and instruments for engine emission; design of on-board measuring and analyzing apparatus and instruments for emission; design of on-board measuring and analyzing apparatus and instruments for exhaust gases; design of on-board measuring and analyzing apparatus and instruments for process gases; design of portable measurement apparatus and instruments for vehicle engine emission; design of portable measurement apparatus and instruments for engine emission; design of portable measurement apparatus and instruments for emission; design of portable measurement apparatus and instruments for exhaust gases; design of portable measurement apparatus and instruments for process gases; design of portable measuring and analyzing apparatus and instruments for vehicle engine emission; design of portable measuring and analyzing apparatus and instruments for engine emission; design of portable measuring and analyzing apparatus and instruments for emission; design of portable measuring and analyzing apparatus and instruments for exhaust gases; design of portable measuring and analyzing apparatus and instruments for process gases; design of measurement apparatus and instruments for automobile emission; design of measuring and analyzing apparatus and instruments for automobile emission; design of measurement apparatus and instruments for vehicle emission; design of measuring and analyzing apparatus and instruments for vehicle emission; design of vehicle engine testing apparatus and instruments; design of automotive engine testing apparatus and instruments; design of engine testing apparatus and instruments; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of optical machines and apparatus; design of cinematographic machines and apparatus; design of photographic machines and apparatus; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling engine testing apparatus and instruments; design, programming and maintenance of computer software; rental of computer software for controlling measurement apparatus and instruments for vehicle engine emission; rental of computer software for controlling measurement apparatus and instruments for engine emission; rental of computer software for controlling measurement apparatus and instruments for emission; rental of computer software for controlling measurement apparatus and instruments for exhaust gases; rental of computer software for controlling measurement apparatus and instruments for process gases; rental of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; rental of computer software for controlling measuring and analyzing apparatus and instruments for process gases; rental of computer software for controlling engine testing apparatus and instruments; rental of computer software; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling engine testing apparatus and instruments; providing on-line non-downloadable computer software; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

64. ANALYSIS DEVICE AND ANALYSIS METHOD

Application Number	18574020
Status	Pending
Filing Date	2022-05-25
First Publication Date	2025-01-09
Owner	HORIBA, LTD. (Japan)
Inventor	Tachibana, Kohei Nakamura, Keishi Niina, Kodai Miyawaki, Daisuke Watanabe, Tsuyoshi Ido, Takuya

Abstract

To appropriately take explosion-proof measures for an analysis device while suppressing consumption of a purge gas, an analysis device includes a filling unit, an irradiation unit, a propagation unit, a housing, a purge gas introduction unit, and an explosion-proof gas introduction unit. The filling unit is filled with a sample gas containing a gas to be measured. The irradiation unit emits measurement light to be used for analyzing the gas to be measured. The propagation unit is disposed between the filling unit and the irradiation unit, so as to form a propagation space for propagating the measurement light emitted from the irradiation unit to the filling unit. The housing houses the filling unit, the irradiation unit, and the propagation unit. The purge gas introduction unit introduces the purge gas into the propagation space. The explosion-proof gas introduction unit introduces an explosion-proof gas into the internal space of the housing.

IPC Classes ?

G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups

65. GATELINK

Application Number	1831423
Status	Registered
Filing Date	2024-11-28
Registration Date	2024-11-28
Owner	HORIBA, Ltd. (Japan)
NICE Classes ?	09 - Scientific and electric apparatus and instruments 10 - Medical apparatus and instruments

Goods & Services

66. GAS ANALYSIS DEVICE, FUEL GAS SUPPLY MECHANISM, AND GAS ANALYSIS METHOD

Application Number	JP2024018439
Publication Number	2025/004598
Status	In Force
Filing Date	2024-05-20
Publication Date	2025-01-02
Owner	HORIBA, LTD. (Japan)
Inventor	Kondo, Yosuke Kasugai, Tetsuya Nishigai, Hiroki

Abstract

The present invention is a fuel gas supply mechanism for replacing a fuel gas cylinder without causing an accidental fire of hydrogen flame in a hydrogen flame ionization detection device, and comprises a first fuel gas port 51 to which a first fuel gas cylinder 10a is connected, a second fuel gas port 52 to which a second fuel gas cylinder 10b is connected, a first fuel gas flow passage 53 that connects the first fuel gas port 51 and an FID detector 4, a second fuel gas flow passage 54 that connects the second fuel gas port 52 and the FID detector 4, and a fuel gas backflow prevention mechanism 50 that prevents backflow from the first fuel gas flow passage 53 to the second fuel gas flow passage 54 or backflow from the second fuel gas flow passage 54 to the first fuel gas flow passage 53.

IPC Classes ?

G01N 27/626 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosolsInvestigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electric discharges, e.g. emission of cathode using heat to ionise a gas
G01M 15/10 - Testing internal-combustion engines by monitoring exhaust gases

67. ANALYSIS DEVICE AND ANALYSIS METHOD

Application Number	JP2024021190
Publication Number	2025/004791
Status	In Force
Filing Date	2024-06-11
Publication Date	2025-01-02
Owner	HORIBA, LTD. (Japan)
Inventor	Nakamura, Ryuhei Ito, Hiroshi Matsumoto, Erika

Abstract

The present invention acquires analysis results relating to the mass concentration and the elements of an analysis object in a short time and with a simple device configuration. An analysis device (100) comprises a β ray source (51), a detection unit (7, 7', 7"), and an analysis unit (9). The β ray source (51) irradiates the analysis object with β rays. The detection unit (7, 7', 7") simultaneously detects transmitted β rays that have passed through the analysis object and fluorescent X-rays that have been produced by irradiating the analysis object with the β rays, and outputs detection signals. The analysis unit (9) acquires, from the detection signals, a first signal produced by detecting the transmitted β rays and a second signal produced by detecting the fluorescent X-rays. The analysis unit (9) calculates information relating to the mass concentration of the analysis object on the basis of the first signal, and calculates information relating to the elements included in the analysis object on the basis of the second signal.

IPC Classes ?

G01N 23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
G01N 23/02 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material

68. BATTERY CASE EVALUATION SYSTEM, BATTERY CASE EVALUATION PROGRAM, AND BATTERY CASE EVALUATION METHOD

Application Number	JP2024023511
Publication Number	2025/005247
Status	In Force
Filing Date	2024-06-28
Publication Date	2025-01-02
Owner	HORIBA, LTD. (Japan)
Inventor	Matsunaga, Shimpachi Hatakeyama, Hiroshi Tatsukawa, Shogo

Abstract

A battery case evaluation system 100 for evaluating the thermal properties of a battery case BC constituting a battery pack or of a component of said battery case BC, said system being equipped with a simulation battery 10 which is installed in the battery case BC and simulates the thermal behavior of an actual battery which is a component of a battery pack, a power supply device 20 which supplies power to the simulation battery 10, and a control device 30 which controls the power supply device 20, wherein the control device 30 is configured so as to have: a parameter reception unit 31 which receives an input profile expressing the change over time in the current, voltage or power supplied to the actual battery as one evaluation parameter; a resistance value calculation unit 331 which calculates a resistance value of the actual battery which changes over time on the basis of the simulation battery temperature and the input profile; and a supply power control unit 33 which controls the power supply device 20 by using the resistance value calculated by the resistance value calculation unit 331.

IPC Classes ?

G01R 31/367 - Software therefor, e.g. for battery testing using modelling or look-up tables
G01N 25/18 - Investigating or analysing materials by the use of thermal means by investigating thermal conductivity
G01R 31/382 - Arrangements for monitoring battery or accumulator variables, e.g. SoC
G01R 31/385 - Arrangements for measuring battery or accumulator variables
G01R 31/389 - Measuring internal impedance, internal conductance or related variables
G01R 31/392 - Determining battery ageing or deterioration, e.g. state of health
H01M 10/48 - Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte

69. TEST SAMPLE TESTING SYSTEM, TEMPERATURE ADJUSTMENT DEVICE, TEST SAMPLE TESTING METHOD, AND TEST SAMPLE TESTING PROGRAM

Application Number	JP2024021305
Publication Number	2025/004803
Status	In Force
Filing Date	2024-06-12
Publication Date	2025-01-02
Owner	HORIBA, LTD. (Japan)
Inventor	Tatsukawa, Shogo Hatakeyama, Hiroshi Matsunaga, Shimpachi

Abstract

The present invention is for testing a test sample while simulating heat input or heat dissipation via an actual power line during actual use, and is a test sample testing system 100 for testing a test sample W, which is an electrical device, the test sample testing system 100 comprising: a test power line 4 that is connected to the test sample W; and a temperature adjustment device 5 for adjusting the temperature of the test power line 4 connected to the test sample W.

IPC Classes ?

G01M 17/007 - Wheeled or endless-tracked vehicles
G01R 31/36 - Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]

70. ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM

Application Number	JP2024023176
Publication Number	2025/005137
Status	In Force
Filing Date	2024-06-26
Publication Date	2025-01-02
Owner	HORIBA, LTD. (Japan)
Inventor	Matsumoto, Erika Ito, Hiroshi

Abstract

The present invention efficiently performs analysis regarding the amount of an analyte and analysis regarding an element. An analysis device (100) comprises a radiation source, a detector (5), and an analysis unit (6). The radiation source irradiates particulate matter (FP) with radiation. The detector (5) detects transmitted radiation passing through the particulate matter (FP) and a fluorescent X-ray generated through the irradiation of the particulate matter (FP) with radiation. The analysis unit (6) performs analysis regarding the amount of the particulate matter (FP) on the basis of the transmitted radiation detected by the detector (5), and performs analysis regarding an element contained in the particulate matter (FP) on the basis of the fluorescent X-ray detected by the detector (5).

IPC Classes ?

G01N 23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
G01N 1/02 - Devices for withdrawing samples
G01N 23/02 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

71. FUEL CELL EVALUATION SYSTEM, INCLINATION TEST DEVICE, FUEL CELL EVALUATION METHOD, AND PROGRAM FOR FUEL CELL EVALUATION SYSTEM

Application Number	JP2024020546
Publication Number	2024/262315
Status	In Force
Filing Date	2024-06-05
Publication Date	2024-12-26
Owner	HORIBA, LTD. (Japan)
Inventor	Mizutaka, Toshio Tabata, Kunio Komada, Mineyuki

Abstract

This fuel cell evaluation system evaluates a test piece that is a fuel cell to be mounted on a movable body or a portion of the fuel cell, the fuel cell evaluation system comprising: a hydrogen gas supply line for supplying hydrogen gas to the test piece; an electric discharge unit that controls an electric discharge load on the test piece; and an inclination test device that has a mounting base on which the test piece is mounted and that inclines the mounting base so as to change the orientation of the test piece according to the movement state of the movable body.

IPC Classes ?

H01M 8/04 - Auxiliary arrangements, e.g. for control of pressure or for circulation of fluids
H01M 8/00 - Fuel cellsManufacture thereof
H01M 8/04746 - PressureFlow

72. METHOD FOR GENERATING DATA FOR PARTICLE ANALYSIS, NON-TRANSITORY COMPUTER PROGRAM FOR GENERATING DATA FOR PARTICLE ANALYSIS, AND DEVICE FOR GENERATING DATA FOR PARTICLE ANALYSIS

Application Number	18813339
Status	Pending
Filing Date	2024-08-23
First Publication Date	2024-12-19
Owner	HORIBA, Ltd. (Japan)
Inventor	Koshikawa, Hiroyuki Akiyama, Hisashi Mori, Tetsuya Matsuo, Kosuke Nakatani, Hitoshi Katsuda, Toshihiro

Abstract

In relation to application of artificial intelligence to image analysis of particles, to make it possible to provide data for machine learning corresponding to user demands while making it possible to reduce, as much as possible, man-hours taken to, for example, prepare vast amounts of actual image data obtained by actually capturing images of particles, the present invention generates virtual particle image data, which is image data of a virtual particle, on the basis of a predetermined condition, generates label data corresponding to the virtual particle, and associates the virtual particle image data with the label data.

IPC Classes ?

G01N 15/1433 - Signal processing using image recognition
G01N 15/14 - Optical investigation techniques, e.g. flow cytometry
G06N 20/00 - Machine learning

73. TEST SPECIMEN TESTING SYSTEM, TEST SPECIMEN DRIVING SYSTEM, TEST SPECIMEN TESTING METHOD, AND TEST SPECIMEN TESTING PROGRAM

Application Number	JP2024018448
Publication Number	2024/257552
Status	In Force
Filing Date	2024-05-20
Publication Date	2024-12-19
Owner	HORIBA, LTD. (Japan)
Inventor	Furukawa, Kazuki Saito, Takashi

Abstract

The present invention relates to a test specimen testing system for testing a test specimen by controlling vehicle pedals of the test specimen to target operation amounts while imparting running resistance to the test specimen, the test specimen testing system comprising; a driving device 2 for driving the test specimen V by operating the vehicle pedals V3, V4 of the test specimen V or inputting operation signals corresponding to the operation of the vehicle pedals; a dynamometer 4 that imparts running resistance corresponding to the vehicle speed of the test specimen V being driven by the driving device 2; a data acquiring unit 31 that acquires target operation amount data, which are time-series data of the target operation amounts of the vehicle pedals V3, V4; and a driving device control unit 33 that performs feed-forward control of a driving robot 2 on the basis of the target operation amount data acquired by the data acquiring unit 31.

IPC Classes ?

G01M 17/007 - Wheeled or endless-tracked vehicles

74. ANALYSIS DEVICE AND ANALYSIS METHOD

Application Number	18704347
Status	Pending
Filing Date	2022-11-25
First Publication Date	2024-12-19
Owner	HORIBA, LTD. (Japan)
Inventor	Hanada, Takaaki Nagura, Naoki Shibuya, Kyoji Hara, Kenji

Abstract

The present invention measures with high accuracy a concentration of a measurement target component contained in a combustion gas, in which a concentration of nitric oxide is calculated based on absorption by the nitric oxide, a concentration of nitrogen dioxide is calculated based on absorption by the nitrogen dioxide, a concentration of nitrous oxide is calculated based on absorption by the nitrous oxide, a concentration of ammonia is calculated based on absorption by the ammonia, a concentration of ethane is calculated based on absorption by the ethane, a concentration of formaldehyde or acetaldehyde is calculated based on absorption by the formaldehyde or the acetaldehyde, a concentration of sulfur dioxide is calculated based on absorption by the sulfur dioxide, a concentration of methane is calculated based on absorption by the methane, and a concentration of methanol or ethanol is calculated based on absorption by the methanol or the ethanol.

IPC Classes ?

G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

75. MACHINE LEARNING DEVICE, EXHAUST GAS ANALYSIS DEVICE, MACHINE LEARNING METHOD, EXHAUST GAS ANALYSIS METHOD, MACHINE LEARNING PROGRAM, AND EXHAUST GAS ANALYSIS PROGRAM

Application Number	18717865
Status	Pending
Filing Date	2022-10-26
First Publication Date	2024-12-19
Owner	HORIBA, LTD. (Japan)
Inventor	Nagaoka, Makoto Saito, Takashi

Abstract

A machine learning device used in an exhaust gas analysis device that irradiates combustion exhaust gas with light, performs a detection of light transmitted through the combustion exhaust gas, and analyzes the combustion exhaust gas based on a detection signal includes a training data reception unit that receives training data including a reference value of a specific component concentration and at least one of spectrum data obtained by irradiating the combustion exhaust gas with light or an individual component concentration selected based on an element balance formula for determining the specific component concentration, or an arithmetic value of a specific component concentration calculated using the individual component concentration in the element balance formula, and a machine learning unit that performs machine learning on a relationship between the reference value and at least one of the spectrum data, the individual component concentration, or the arithmetic value using the training data.

IPC Classes ?

G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
G06N 20/00 - Machine learning

76. PLATINALINK

Serial Number	79420709
Status	Pending
Filing Date	2024-12-13
Owner	HORIBA, Ltd. (Japan)
NICE Classes ?	09 - Scientific and electric apparatus and instruments 37 - Construction and mining; installation and repair services 42 - Scientific, technological and industrial services, research and design

Goods & Services

Downloadable computer software for verifying data integrity; downloadable computer software for verifying data accuracy, completeness and consistency; downloadable computer software for access control, user identification, verification and security management; downloadable computer software for generating reports regarding data integrity; downloadable computer software for generating reports regarding data accuracy, completeness and consistency; downloadable computer software for measuring, controlling, testing, experimenting, data collection and management of engines, brakes and drives and apparatus attached thereto for vehicles and automobiles; downloadable computer software for measuring, controlling, testing, experimenting, data collection and management of pharmaceuticals, cosmetics, foodstuffs and dietary supplements; downloadable computer software for measuring, controlling, testing, experimenting, data collection and management of solid samples, gaseous samples and liquid samples; downloadable computer software for use with measuring or testing machines and instruments; downloadable computer software for use with laboratory apparatus and instruments; electronic computer and data processing machines and apparatus being computers and data processing equipment and their parts; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing engines, brakes and drives for vehicles and automobiles, and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring, testing, and detecting fuel and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing water electrolysis apparatus and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring, testing, and detecting process gases and exhaust gases and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring, testing, and detecting gases and particulate matter in the air and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing industrial wastewater and domestic waste water and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing water and sewage and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing soil and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring, testing, and detecting radioactive substances and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for identifying and measuring concentration of substances contained in drug, and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for identifying and measuring concentration of substances contained in food and beverage, and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for identifying and measuring concentration of substances contained in cosmetics, and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for identifying and measuring concentration of substances contained in fertilizers and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring, testing, and detecting microorganism, bacteria and vaccine, and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring, testing, and detecting cells, proteins and genetic matter, and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing materials of electronic components, and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing solvents and for manufacturing electronic components, and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing solvents and ultrapure water for manufacturing electronic components, and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing solvents and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing synthetic resins and plastics, and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing metals and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing glasses and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing ceramics and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing catalysts and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing rubber and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing carbon and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing paper and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing battery materials and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing cement and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing ore minerals and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing colorants and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for verification and authentication of work of art, and apparatus attached thereto; measuring or testing machines and instruments, namely, scientific analyzers for measuring and testing solid samples, gaseous samples and liquid samples, and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring, testing, and detecting fuel and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing water electrolysis apparatus and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring, testing, and detecting process gases and exhaust gases and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring, testing, and detecting gases and particulate matter in the air and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing industrial wastewater and domestic waste water and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing water and sewage and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing soil and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring, testing, and detecting radioactive substances and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for identifying and measuring concentration of substances contained in drug, and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for identifying and measuring concentration of substances contained in food, and beverage and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for identifying and measuring concentration of substances contained in cosmetics, and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for identifying and measuring concentration of substances contained in fertilizers and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring, testing, and detecting microorganism, bacteria and vaccine, and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring, testing, and detecting cells, proteins and genetic matter, and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing materials of electronic components, and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing solvents and for manufacturing electronic components, and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing solvents and ultrapure water for manufacturing electronic components, and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing solvents and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing synthetic resins and plastics, and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing metals and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing glasses and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing ceramics and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing catalysts and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing rubber and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing carbon and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing paper and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing battery materials and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing cement and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing ore minerals and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing colorants and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for verification and authentication of work of art, and apparatus attached thereto; measuring or testing machines and instruments for laboratory use, namely, scientific analyzers for measuring and testing solid samples, gaseous samples and liquid samples, and apparatus attached thereto; optical machines and apparatus, namely, microscopes, and accessories therefor Repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of electronic machines and apparatus, namely, computers and data processing equipment; repair or maintenance of optical machines and apparatus, namely, microscopes Design, programming and maintenance of computer software for verifying data integrity; design, programming and maintenance of computer software for verifying data accuracy, completeness and consistency; design, programming and maintenance of computer software for access control, user identification, verification and security management; computer software design, computer programming, or maintenance of computer software for verifying data integrity, for verifying data accuracy, completeness and consistency, and for access control, user identification, verification and security management; rental of computer software for verifying data integrity; rental of computer software for verifying data accuracy, completeness and consistency; rental of computer software for access control, user identification, verification and security management; providing on-line non-downloadable computer software for verifying data integrity; providing on-line non-downloadable computer software for verifying data accuracy, completeness and consistency; providing on-line non-downloadable computer software for access control, user identification, verification and security management; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of measuring or testing machines and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of electronic machines and apparatus; calibration of optical machines and apparatus; custom design of measuring or testing machines and instruments; custom design of laboratory apparatus and instruments; custom design of electronic machines and apparatus; custom design of optical machines and apparatus; designing of machines, apparatus, instruments, including their parts or systems composed of such machines, apparatus and instruments; technological advice relating to computers, automobiles and industrial machines; testing or research on measuring or testing machines and instruments

77. HORIBA PLATINALINK

Serial Number	79420710
Status	Pending
Filing Date	2024-12-13
Owner	HORIBA, Ltd. (Japan)
NICE Classes ?	09 - Scientific and electric apparatus and instruments 37 - Construction and mining; installation and repair services 42 - Scientific, technological and industrial services, research and design

Goods & Services

78. ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM

Application Number	JP2024018060
Publication Number	2024/247732
Status	In Force
Filing Date	2024-05-16
Publication Date	2024-12-05
Owner	HORIBA, LTD. (Japan)
Inventor	Shibuya, Kyoji Niina, Kodai Okuda, Naoki Miyawaki, Daisuke Ido, Takuya

Abstract

The purpose of the present invention is to easily determine whether an obtained analysis result is abnormal. An analysis device (100) is provided with an irradiation unit (5), a detection unit (75), and a calculation unit (91). The irradiation unit (5) has a laser that radiates a measurement light (L) toward a sample gas (SG). The detection unit (75) detects the measurement light (L) that has passed through the sample gas (SG). The calculation unit (91) outputs a signal for determining whether the analysis result of a predetermined gas is abnormal on the basis of a residual between detection signal information based on a detection signal obtained by detecting the measurement light (L) by the detection unit (75) and reference signal information based on a reference signal obtained in advance by causing the predetermined gas to absorb the measurement light (L).

IPC Classes ?

G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

79. CELL FOR SPECTROSCOPIC ANALYSIS, SPECTROSCOPIC ANALYSIS DEVICE, AND SPECTROSCOPIC ANALYSIS METHOD

Application Number	JP2024019843
Publication Number	2024/248081
Status	In Force
Filing Date	2024-05-30
Publication Date	2024-12-05
Owner	HORIBA, LTD. (Japan)
Inventor	Ueno, Kusuo Murakami, Tatsuki Minowa, Hiroki

Abstract

In order to prevent cracking of a translucent plate even in cases where a wide range of a sample is measured while speeding up the measurement in a non-exposed environment by pressing and flattening the sample with a translucent plate such as a glass plate, or in cases where the translucent plate is thin, this cell 100 which is used for spectroscopic analysis and holds a sample S is provided with: a base 10 for supporting the sample S; a sealing member 20 that surrounds the sample S on the base 10; a translucent plate 30 for having the sample S sandwiched between itself and the base 10; and a decompression flow path L that is in communication with a sample space which is surrounded by the base 10, the sealing member 20, and the translucent plate 30.

IPC Classes ?

G01N 21/03 - Cuvette constructions
G01N 21/65 - Raman scattering

80. ANALYSIS DEVICE, PROGRAM FOR ANALYSIS DEVICE, AND ANALYSIS METHOD

Application Number	JP2024017471
Publication Number	2024/241920
Status	In Force
Filing Date	2024-05-10
Publication Date	2024-11-28
Owner	HORIBA, LTD. (Japan)
Inventor	Shibuya, Kyoji Hamauchi, Shota Niina, Kodai Yamamoto, Tomomi

Abstract

The present invention is an analysis device 100 that analyzes acetylene in a sample gas containing acetylene and at least one type of hydrocarbon other than acetylene. The analysis device 100 includes: a laser light source 2 that irradiates the sample gas with a laser beam; a photodetector 3 that detects the intensity of sample light, which is the laser beam that has passed through the sample gas; and a signal processing device 4 that calculates the concentration of acetylene on the basis of the output signal of the photodetector 3. The signal processing device 4 calculates the concentration of acetylene on the basis of the absorption of acetylene between 7.56 μm and 7.66 μm or between 7.27 μm and 7.83 μm.

IPC Classes ?

G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

81. RADIATION TEMPERATURE MEASUREMENT DEVICE, RADIATION TEMPERATURE MEASUREMENT METHOD, AND PROGRAM FOR RADIATION TEMPERATURE MEASUREMENT DEVICE

Application Number	JP2024010200
Publication Number	2024/241674
Status	In Force
Filing Date	2024-03-15
Publication Date	2024-11-28
Owner	HORIBA, LTD. (Japan)
Inventor	Fujino, Sho Tominaga, Koji

Abstract

Provided is a radiation temperature measurement device that measures the temperature of an object-to-be-measured having a substrate and a thin film formed on the surface of the substrate, wherein the radiation temperature measurement device comprises: an infrared detection unit that detects the amount of infrared rays radiated from the object-to-be-measured; a substrate spectral characteristic data storage unit that stores substrate spectral characteristic data indicating the temperature characteristics of the spectral characteristics of the substrate; an individual spectral characteristic data reception unit that receives an input of individual spectral characteristic data indicating information pertaining to the reflectance and transmittance of the object-to-be-measured at a prescribed temperature; a spectral characteristic calculation unit that calculates the temperature characteristics of the spectral characteristics of the object-to-be-measured on the basis of the substrate spectral characteristic data and the individual spectral characteristic data; and a temperature calculation unit that calculates the temperature of the object-to-be-measured on the basis of the amount of infrared rays detected by the infrared detection unit and the temperature characteristics of the spectral characteristics of the object-to-be-measured calculated by the spectral characteristic calculation unit.

IPC Classes ?

G01J 5/70 - Passive compensation of pyrometer measurements, e.g. using ambient temperature sensing or sensing of temperature within housing
G01J 5/00 - Radiation pyrometry, e.g. infrared or optical thermometry
G01J 5/60 - Radiation pyrometry, e.g. infrared or optical thermometry using determination of colour temperature
H01L 21/66 - Testing or measuring during manufacture or treatment

82. ION ANALYSIS DEVICE AND FUEL CELL EVALUATION SYSTEM

Application Number	18564875
Status	Pending
Filing Date	2022-06-02
First Publication Date	2024-11-21
Owner	HORIBA, LTD. (Japan) HORIBA ADVANCED TECHNO, CO., LTD. (Japan)
Inventor	Okada, Yoichi Tanaka, Yoshinori Sasai, Kohei Watanabe, Shunta Miyamura, Kazuhiro

Abstract

An ion analysis device includes a sampling unit configured to sample condensate of exhaust gas flowing through an exhaust gas line in a fuel cell; and a sensor unit configured to measure an ion concentration of the condensate, in which the sampling unit is configured to sample the condensate of the exhaust gas from a first reservoir that is provided to the exhaust gas line and where the condensate of the exhaust gas is collected, or to sample the exhaust gas from the exhaust gas line and to collect condensate of the sampled exhaust gas in a second reservoir.

IPC Classes ?

H01M 8/0444 - ConcentrationDensity
G01N 1/22 - Devices for withdrawing samples in the gaseous state
H01M 8/04492 - HumidityAmbient humidityWater content
H01M 8/04664 - Failure or abnormal function
H01M 8/04828 - HumidityWater content

83. EXHAUST GAS SAMPLING DEVICE, EXHAUST GAS ANALYSIS SYSTEM, EXHAUST GAS SAMPLING METHOD, AND PROGRAM FOR EXHAUST GAS SAMPLING DEVICE

Application Number	18701045
Status	Pending
Filing Date	2022-10-03
First Publication Date	2024-10-17
Owner	HORIBA, LTD. (Japan)
Inventor	Kimura, Takeshi Kuriaki, Kazunori Higuchi, Masahiro Komatsu, Yoji Tomita, Jun

Abstract

An exhaust gas sampling device that collects an exhaust gas emitted from a vehicle including an engine or a part of the vehicle into a sampling bag includes a main channel through which the exhaust gas flows, a main valve that opens and shuts the main channel, a dilution gas channel that is connected downstream from the main valve in the main channel and introduces a dilution gas into the main channel, a purge gas channel that branches from the dilution gas channel and has a downstream end connected downstream from the main valve in the main channel and upstream from a junction of the dilution gas channel and a purge pump that is disposed in the purge gas channel, sucks a part of the dilution gas flowing through the dilution gas channel, and delivers the sucked part as a purge gas to the main channel.

IPC Classes ?

G01M 15/10 - Testing internal-combustion engines by monitoring exhaust gases
G01N 1/22 - Devices for withdrawing samples in the gaseous state

84. TEST SYSTEM, TEST METHOD, AND PROGRAM RECORDING MEDIUM FOR TEST SYSTEM

Application Number	18292121
Status	Pending
Filing Date	2022-07-25
First Publication Date	2024-10-10
Owner	HORIBA, LTD. (Japan)
Inventor	Michikita, Toshiyuki Kawazoe, Hiroshi Furukawa, Kazuki Hirose, Yoku Shiomi, Kenji

Abstract

A test system that conducts a test of a test subject that is a vehicle or a part thereof that includes an electronic control device, comprises a drive test device for conducting a drive test of the test subject, an automatic driving robot that drives the test subject, and a signal control unit that is connected to the test subject by wire or wirelessly and that transmits, to the electronic control device, a test signal for evaluating the electronic control device.

IPC Classes ?

G01M 17/007 - Wheeled or endless-tracked vehicles
G06F 21/57 - Certifying or maintaining trusted computer platforms, e.g. secure boots or power-downs, version controls, system software checks, secure updates or assessing vulnerabilities

85. SILICON DRIFT DETECTION ELEMENT, SILICON DRIFT DETECTOR, AND RADIATION DETECTION DEVICE

Application Number	18744506
Status	Pending
Filing Date	2024-06-14
First Publication Date	2024-10-10
Owner	HORIBA, LTD. (Japan)
Inventor	Matsunaga, Daisuke Aoyama, Junichi Okubo, Yuji Ikawa, Seiji

Abstract

A silicon drift detector includes a housing and a silicon drift detection element that is disposed inside the housing. The housing includes an opening that is not closed. The silicon drift detection element includes a top surface facing the opening, and a light shielding film is provided on the top surface.

IPC Classes ?

G01T 1/24 - Measuring radiation intensity with semiconductor detectors
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
H01L 31/0203 - Containers; Encapsulations
H01L 31/0216 - Coatings
H01L 31/0224 - Electrodes
H01L 31/08 - SEMICONDUCTOR DEVICES NOT COVERED BY CLASS - Details thereof in which radiation controls flow of current through the device, e.g. photoresistors

86. TEST SPECIMEN DISPLAY RECOGNITION DEVICE, TEST SPECIMEN TESTING SYSTEM, TEST SPECIMEN DISPLAY SETTING DEVICE, TEST SPECIMEN DISPLAY RECOGNITION METHOD, AND TEST SPECIMEN DISPLAY RECOGNITION PROGRAM

Application Number	JP2024013028
Publication Number	2024/204704
Status	In Force
Filing Date	2024-03-29
Publication Date	2024-10-03
Owner	HORIBA, LTD. (Japan)
Inventor	Komatsu, Yoji Michikita, Toshiyuki Yoshinaka, Yuji Prasad, Rohit Shiv Yabushita, Hirotaka Matsueda, Atsuo Otake, Ryoga

Abstract

The present invention provides a test specimen display recognition device for identifying a test specimen display for indicating a state of a test specimen, from an image obtained by imaging a meter panel of the test specimen by means of a camera, the test specimen display recognition device comprising: a setting information accepting unit for accepting a selection signal indicating the type of an image recognition algorithm for identifying the test specimen display from the image; a setting information storage unit for storing the selection signal accepted by the setting information accepting unit as setting information; and a test sample display recognition unit for acquiring the setting information from the setting information storage unit and identifying an instructed value indicated by test specimen display on the basis of the setting information.

IPC Classes ?

G01M 17/007 - Wheeled or endless-tracked vehicles
G06T 7/00 - Image analysis

87. PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE

Application Number	18257390
Status	Pending
Filing Date	2021-11-24
First Publication Date	2024-09-19
Owner	HORIBA, LTD. (Japan)
Inventor	Yamaguchi, Tetsuji

Abstract

A centrifugal sedimentation-type particle size distribution measurement device that measures the particle size distribution in a measurement sample by rotating a measurement cell that contains the measurement sample and causing particles in the measurement sample to sediment, said particle size distribution measurement device comprising: a light source that irradiates the measurement cell with light; a scattered light detector that detects the intensity of scattered light caused by the particles in the measurement cell; and a particle size distribution calculation unit that measures the particle size distribution in the measurement sample on the basis of the change over time in the scattered light intensity, said change being caused by the particle sedimentation.

IPC Classes ?

G01N 15/0205 - Investigating particle size or size distribution by optical means
G01N 15/04 - Investigating sedimentation of particle suspensions

88. CENTRIFUGAL SEDIMENTATION-TYPE MEASUREMENT APPARATUS AND CENTRIFUGAL SEDIMENTATION-TYPE MEASUREMENT METHOD

Application Number	JP2024005978
Publication Number	2024/190313
Status	In Force
Filing Date	2024-02-20
Publication Date	2024-09-19
Owner	HORIBA, LTD. (Japan)
Inventor	Yamaguchi, Tetsuji Igushi, Tatsuo Sato, Yusui Yashiki, Shota

Abstract

With the purpose of enabling multiple kinds of substances contained in a sample to be analyzed all at once without requiring replacement of light sources and other such labor by using a centrifugal sedimentation-type measurement apparatus, this invention additionally involves a second light source that illuminates a cell with light having a wavelength different from the wavelength of light from a first light source, and a second detector that detects secondary light generated due to the sample being illuminated with the light from the second light source.

IPC Classes ?

G01N 15/04 - Investigating sedimentation of particle suspensions

89. SPECIMEN ANALYZER, SPECIMEN ANALYSIS SYSTEM, AND SPECIMEN DISPENSING METHOD

Application Number	JP2024007536
Publication Number	2024/190437
Status	In Force
Filing Date	2024-02-29
Publication Date	2024-09-19
Owner	HORIBA, LTD. (Japan)
Inventor	Hirata Katsuki Sano Tomoki

Abstract

This specimen analyzer is provided with a specimen measuring cell and a dispensing mechanism for dispensing a specimen. The dispensing mechanism dispenses a specimen into the specimen measuring cell and a test device that is held at a different position from the specimen measuring cell.

IPC Classes ?

G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor
G01N 35/08 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor using a stream of discrete samples flowing along a tube system, e.g. flow injection analysis
G01N 37/00 - Details not covered by any other group of this subclass

90. ELEMENTAL ANALYSIS DEVICE AND ELEMENTAL ANALYSIS METHOD

Application Number	JP2024005932
Publication Number	2024/181221
Status	In Force
Filing Date	2024-02-20
Publication Date	2024-09-06
Owner	HORIBA, LTD. (Japan)
Inventor	Yamada, Takahiro Kawakami, Shun Park, Sangwoon

Abstract

An elemental analysis device 100 comprises: a heating furnace 1 that heats a sample to generate a sample gas G; a flow path L1 through which the sample gas G flows; a flow rate adjusting unit 3 provided in the flow path L1 to adjust the flow rate of the sample gas G; an oxidizer 4 provided downstream of the flow rate adjusting unit 3 in the flow path L1 to oxidize the sample gas G; and an analyzing unit 5 provided downstream of the oxidizer 4 in the flow path L1 to analyze elements contained in the sample gas G.

IPC Classes ?

G01N 31/12 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroupsApparatus specially adapted for such methods using combustion
G01N 31/00 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroupsApparatus specially adapted for such methods

91. PARTICLE IMAGE ANALYSIS APPARATUS, PARTICLE IMAGE ANALYSIS SYSTEM, PARTICLE IMAGE ANALYSIS METHOD, AND PROGRAM FOR PARTICLE IMAGE ANALYSIS APPARATUS

Application Number	18572629
Status	Pending
Filing Date	2022-03-25
First Publication Date	2024-08-29
Owner	HORIBA, LTD. (Japan)
Inventor	Tatewaki, Yasuhiro

Abstract

A particle analysis apparatus includes: an individual particle image generation unit that extracts individual particles from the original image and generates individual particle images; a particle characteristic calculation unit that calculates one or a plurality of types of particle characteristics for a particle in each of the individual particle images, based on the each of the individual particle images; a classification unit that classifies, with respect to a plurality of classes defined by some or all of the one or plurality of types of particle characteristics, the particles into the classes that correspond to the calculated one or plurality of particle characteristics; and an individual particle image storing unit that stores in a storage the individual particle images of particles belonging to each of the plurality of classes.

IPC Classes ?

G06V 20/69 - Microscopic objects, e.g. biological cells or cellular parts
G01N 15/0205 - Investigating particle size or size distribution by optical means
G06V 10/98 - Detection or correction of errors, e.g. by rescanning the pattern or by human interventionEvaluation of the quality of the acquired patterns

92. BENCH TEST DEVICE AND BENCH TEST METHOD

Application Number	18564931
Status	Pending
Filing Date	2022-05-27
First Publication Date	2024-08-15
Owner	HORIBA, LTD. (Japan)
Inventor	Kawazoe, Hiroshi

Abstract

The present invention is to inexpensively configure a bench test device with a steering function for testing a vehicle. A bench test device for testing a test piece, which is a vehicle or a part thereof, includes a rotating body on which a wheel which is a steering wheel of the test piece is placed, a support bench which rotatably supports the rotating body along with rotation of the wheel, and a movement mechanism that moves the support bench on an installation surface using a rotational force of the wheel.

IPC Classes ?

G01M 17/007 - Wheeled or endless-tracked vehicles

93. PARTICLE DIAMETER DISTRIBUTION MEASUREMENT DEVICE, PARTICLE DIAMETER DISTRIBUTION MEASUREMENT METHOD, AND PARTICLE DIAMETER DISTRIBUTION MEASUREMENT PROGRAM

Application Number	JP2024002288
Publication Number	2024/166705
Status	In Force
Filing Date	2024-01-25
Publication Date	2024-08-15
Owner	HORIBA, LTD. (Japan)
Inventor	Sugasawa, Hirosuke

Abstract

A particle diameter distribution measurement device 100 comprising an imaging means 3 that images particles in a cell 1 and an analysis unit 41 that calculates a particle diameter distribution by calculating diffusion velocity due to Brownian motion of the particles in imaging data obtained by the imaging means 3, said particle diameter distribution measurement device 100 being provided with: a data group acquisition unit 43 that acquires, at each of a plurality of focus positions in the cell 1, an imaging data group which comprises a plurality of pieces of imaging data obtained by the imaging means 3; a variable value calculation unit 44 that calculates a variable value of a prescribed evaluation parameter obtained from each of the plurality of pieces of imaging data constituting the imaging data groups; and a focus position determination unit 45 that, on the basis of variable values respectively corresponding to the plurality of focus positions, determines a measurement focus position to be used during measurement.

IPC Classes ?

G01N 15/0227 - Investigating particle size or size distribution by optical means using imagingInvestigating particle size or size distribution by optical means using holography
G03B 13/36 - Autofocus systems

94. TEST OBJECT TESTING SYSTEM, TRAVEL RESISTANCE CALCULATION DEVICE, TRAVEL RESISTANCE CALCULATION PROGRAM, AND TEST OBJECT TESTING METHOD

Application Number	18563896
Status	Pending
Filing Date	2022-05-24
First Publication Date	2024-08-08
Owner	HORIBA, LTD. (Japan)
Inventor	Kawazoe, Hiroshi

Abstract

The present invention is a test object testing device that reproduces real driving in a real world with high accuracy using a bench test device and tests a test object that is a vehicle or a part of the vehicle, the test object testing device including a dynamometer that applies a load to the test object, a travel route setting unit that sets a travel route using a map, a road information acquisition unit that acquires road information of the travel route from a map, a travel resistance calculation unit that calculates a travel resistance of the test object on the basis of the road information, and a dynamometer control unit that controls the dynamometer on the basis of the travel resistance.

IPC Classes ?

G01C 21/00 - NavigationNavigational instruments not provided for in groups

95. TCA

Application Number	019054282
Status	Registered
Filing Date	2024-07-15
Registration Date	2025-01-09
Owner	HORIBA, Ltd. (Japan)
NICE Classes ?	09 - Scientific and electric apparatus and instruments

Goods & Services

Hydrogen gas analyzers, and parts and accessories thereof; hydrogen meters, and parts and accessories thereof; measuring apparatus for measuring the concentration of hydrogen, and parts and accessories thereof; apparatus for analyzing gases, and parts and accessories thereof; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; computer software for use with the aforesaid goods.

96. TCA

Serial Number	98648442
Status	Pending
Filing Date	2024-07-15
Owner	HORIBA, Ltd. (Japan)
NICE Classes ?	09 - Scientific and electric apparatus and instruments

Goods & Services

Hydrogen gas analyzers, and structural parts and fittings; hydrogen meters, and structural parts and fittings; measuring apparatus for measuring the concentration of hydrogen, namely, gas flow meters, apparatus for analyzing hydrogen gas, and structural parts and fittings; apparatus for analyzing gases, and structural parts and fittings; downloadable and recorded computer software for use with the aforesaid goods, namely, computer software for controlling analyzing apparatus, computer software for operating and directing analyzing apparatus, computer software for acquiring, analyzing and managing measured data, computer software for managing maintenance deadlines, computer software for checking and monitoring the status of machines and apparatus, computer software for creating calibration curve used for measuring, computer software for detecting and alarming anomalies in machines and apparatus

97. ANALYSIS DEVICE, ANALYSIS METHOD, AND OZONE DECOMPOSER

Application Number	JP2023041259
Publication Number	2024/142653
Status	In Force
Filing Date	2023-11-16
Publication Date	2024-07-04
Owner	HORIBA, LTD. (Japan)
Inventor	Otsuka, Gaku Yamada, Ryusuke Mizumoto, Kazunori

Abstract

The present invention addresses the problem of generating, from a sample gas, a suitable reference gas from which components other than ozone are not excessively removed. An analysis device (100) comprises: a measurement cell (1) into which a sample gas (Gs) and a reference gas (Gr) are alternately introduced; a light source (3) that outputs measurement light (L); a detection unit (5) that detects measurement light (L) which has passed through the measurement cell (1); a computation unit (91) that analyzes the ozone contained in the sample gas (Gs); and an ozone decomposer (71) that generates the reference gas (Gr) from the sample gas (Gs) by means of heating. The ozone decomposer (71) includes: an introduction tube (71a) for introducing the sample gas (Gs); a heating unit (71b) that heats the introduction tube (71a); and a porous first filling material (71c) that is filled into the heated portion of the introduction tube (71a) heated by the heating unit (71b), and that comprises a substance which is inert to sulfur dioxide.

IPC Classes ?

G01N 21/33 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
G01N 21/61 - Non-dispersive gas analysers

98. SPECTROSCOPIC ANALYSIS DEVICE AND SPECTROSCOPIC ANALYSIS METHOD

Application Number	JP2023045761
Publication Number	2024/143122
Status	In Force
Filing Date	2023-12-20
Publication Date	2024-07-04
Owner	HORIBA, LTD. (Japan)
Inventor	Wakabayashi, Satoru Uchigashima, Mikiko Naka, Nobuyuki

Abstract

Provided are a spectroscopic analysis device and a spectroscopic analysis method that can analyze components in a liquid sample over a wide concentration range.　The spectroscopic analysis device comprises: a first analysis unit that performs fluorescence spectroscopic analysis and/or absorption spectroscopic analysis on a first component contained in a liquid sample by using secondary light generated from the liquid sample irradiated with primary light; a second analysis unit that performs Raman spectroscopic analysis on a second component contained in the liquid sample by using the secondary light generated from the liquid sample irradiated with primary light; a concentration measurement unit that measures the concentration of the first component and the second component contained in the liquid sample; and a control unit. The control unit causes the first analysis unit or the second analysis unit to perform analysis in accordance with the concentration measured by the concentration measurement unit.

IPC Classes ?

G01N 21/65 - Raman scattering
G01N 21/17 - Systems in which incident light is modified in accordance with the properties of the material investigated
G01N 21/27 - ColourSpectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection
G01N 21/64 - FluorescencePhosphorescence

99. VEHICLE DIAGNOSIS DEVICE, VEHICLE DIAGNOSIS METHOD, AND VEHICLE DIAGNOSIS PROGRAM

Application Number	JP2023037166
Publication Number	2024/142547
Status	In Force
Filing Date	2023-10-13
Publication Date	2024-07-04
Owner	HORIBA, LTD. (Japan)
Inventor	Shiota Aoi Kawazoe Hiroshi Saito Takashi Tanaka Sayaka Nishikawa Masahiro

Abstract

This vehicle diagnosis device comprises: a feature data acquisition unit for acquiring a plurality of items of feature data included in a prescribed output pattern of a vehicle; a real data acquisition unit for acquiring output data based on real travel by the vehicle in a prescribed period in the past, and real measured data indicating real measured quantities with regard to a parameter required for vehicle diagnosis during travel of the vehicle in the prescribed period; an equivalent pattern generation unit for generating an equivalent output pattern regarded as equivalent to the prescribed output pattern by splicing out, from the output data of the prescribed period, points or segments similar to the plurality of items of feature data; and a real measured quantity extraction unit for extracting the real measured quantities of each of the points or each of the segments included in the equivalent output pattern from the real measured data in the prescribed period.

IPC Classes ?

G01R 31/392 - Determining battery ageing or deterioration, e.g. state of health
B60L 3/00 - Electric devices on electrically-propelled vehicles for safety purposesMonitoring operating variables, e.g. speed, deceleration or energy consumption
B60L 15/20 - Methods, circuits or devices for controlling the propulsion of electrically-propelled vehicles, e.g. their traction-motor speed, to achieve a desired performanceAdaptation of control equipment on electrically-propelled vehicles for remote actuation from a stationary place, from alternative parts of the vehicle or from alternative vehicles of the same vehicle train for control of the vehicle or its driving motor to achieve a desired performance, e.g. speed, torque, programmed variation of speed
B60L 50/60 - Electric propulsion with power supplied within the vehicle using propulsion power supplied by batteries or fuel cells using power supplied by batteries
B60L 58/12 - Methods or circuit arrangements for monitoring or controlling batteries or fuel cells, specially adapted for electric vehicles for monitoring or controlling batteries responding to state of charge [SoC]
B60L 58/16 - Methods or circuit arrangements for monitoring or controlling batteries or fuel cells, specially adapted for electric vehicles for monitoring or controlling batteries responding to battery ageing, e.g. to the number of charging cycles or the state of health [SoH]
F02D 45/00 - Electrical control not provided for in groups
G01M 17/007 - Wheeled or endless-tracked vehicles
G01R 31/367 - Software therefor, e.g. for battery testing using modelling or look-up tables
G01R 31/382 - Arrangements for monitoring battery or accumulator variables, e.g. SoC
G01R 31/385 - Arrangements for measuring battery or accumulator variables
G01R 31/389 - Measuring internal impedance, internal conductance or related variables
H01M 10/42 - Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
H01M 10/48 - Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte

100. GAS MEASUREMENT SYSTEM AND GAS MEASUREMENT METHOD

Application Number	JP2023040601
Publication Number	2024/142622
Status	In Force
Filing Date	2023-11-10
Publication Date	2024-07-04
Owner	HORIBA, LTD. (Japan)
Inventor	Oida Takuji Ishida Kentaro Yokota Yoshihiro Fujiwara Masahiko

Abstract

A gas measurement system comprising a first oxygen concentration sensor which measures, as a first oxygen concentration, the concentration of oxygen in an exhaust gas exhausted from a test specimen on the basis of a pressure difference between the oxygen in the exhaust gas and a first reference gas in which the concentration of oxygen is a first predetermined concentration, a first reference gas supply unit which supplies the first reference gas to the first oxygen concentration sensor, and a calculation unit which calculates an oxygen consumption amount of the test specimen on the basis of a flow amount of the exhaust gas and the first oxygen concentration. The first predetermined concentration of the first reference gas is set within a first predetermined range with respect to the first oxygen concentration.

IPC Classes ?

B60L 58/30 - Methods or circuit arrangements for monitoring or controlling batteries or fuel cells, specially adapted for electric vehicles for monitoring or controlling fuel cells
G01N 1/22 - Devices for withdrawing samples in the gaseous state
G01N 27/74 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables of fluids

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