Zing Semiconductor Corporation

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Quantité totale PI 72
Rang # Quantité totale PI 19 539
Note d'activité PI 2,8/5.0    67
Rang # Activité PI 10 717

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Dernier brevet 2026 - Monocrystalline silicon wafer an...
Premier brevet 2016 - Fabrication method for forming v...

Derniers inventions, produits et services

2026 Invention Monocrystalline silicon wafer and forming method therefor. The present invention provides a mono...
Invention Silicon crystal, silicon crystal defect treatment method, and defect characterization method. A ...
2025 Invention Crystal growing apparatus and rf-soi substrate. The present invention provides a crystal growing...
Invention Monocrystalline silicon ingot product, monocrystalline growth device and monocrystalline growth m...
Invention Method for determining whether crystal orientation of <111> ingot is in optimal rotation an...
Invention Method for measuring bmds in heavily doped p-type silicon wafers, method and system for acquiring...
Invention Grinding carrier assembly, grinding apparatus, and grinding method. A grinding carrier assembly, ...
Invention Heater for single crystal furnace and single crystal furnace. A heater for a single crystal furna...
Invention Crystal bar cutting machine and support device therefor. A support device for a crystal bar cutti...
Invention Standard sheet and manufacturing method therefor, semiconductor material defect correction method...
Invention Characterization and evaluation methods for wafer warpage topography, and characterization and ev...
Invention Quartz support member, semiconductor process chamber and semiconductor process method. Provided i...
2024 Invention Monocrystalline silicon wafer and forming method therefor. The present invention provides a monoc...
Invention Silicon crystal, silicon crystal defect treatment method, and defect characterization method. A s...
Invention Method and apparatus for diameter measurement of czochralski monocrystalline silicon, and device ...
Invention Magnetic control apparatus. Provided in the present invention is a magnetic control apparatus, co...
Invention Structure of high-resistivity silicon-on-insulator embedded with charge capture layer and manufac...
2023 Invention Method, apparatus, system and computer storage medium of controlling crystal growth. The present...
Invention Crystal growing method, apparatus and rf-soi substrate. The present invention provides a crystal...
Invention Epitaxy susceptor, epitaxy growth apparatus and manufacturing method of semiconductor device. Th...
Invention Method for determining types of defects in monocrystalline silicon wafer. The present invention p...
Invention Soi wafer. A SOI wafer is disclosed. The SOI wafer may be characterized by surface roughness of ...
Invention Method for detecting temperature of thermal chamber. The present application provides a method fo...
2022 Invention Method of growing a single-crystal silicon. The present invention provides a method of growing a...
Invention Standard wafers, method of making the same and calibration method. The present invention provide...
Invention Semiconductor substrate and manufacture thereof. The present application provides a semiconducto...
Invention Method of detecting crystallographic defects and method of growing an ingot. The invention provid...
Invention Method for characterizing defects in silicon crystal. The present application provides a method f...
Invention Soi wafer and method of final processing the same. A SOI wafer and a method of final processing ...
Invention Surface treatment of soi wafer. The present application provides a method of surface treatment o...
Invention Process of surface treatment of soi wafer. The present application provides a process of surface...
Invention Soi structured semiconductor silicon wafer and method of making the same. A SOI structured semic...
2021 Invention Measuring method of resistivity of a wafer. The invention provides a measuring method of resistiv...
Invention Method for verification of conductivity type of silicon wafer. −cm to rapidly and accurately dete...
Invention Detection method of metal impurity in wafer. The present application provides a detection method ...
Invention Crystal growth method and crystal growth apparatus. A crystal growth method and a crystal growth...
Invention Silicon on insulator structure and method of making the same. The present invention provides a me...
Invention Method for calculating liquid-solid interface morphology during growth of ingot. The present inve...
Invention Method and apparatus of monocrystal growth. The present invention provides a method and an appara...
Invention Silicon on insulator structure and method of making the same. A method of making a silicon on ins...
Invention Seeding method for crystal growth. A seeding method for crystal growth comprising: a first seedin...
Invention Method and device of chemical mechanical polishing. The present application provides a method an...
2020 Invention Heat shield device and smelting furnace. Disclosed are a heat shield device and a smelting furna...
Invention Polishing pad, polishing apparatus and a method for polishing silicon wafer. The present inventio...
Invention Process for preparing epitaxy wafer and epitaxy wafer therefrom. The present application provide...
Invention Apparatus and method for ingot growth. The present application provides an apparatus and a method...
Invention Semiconductor crystal growth method and device. A semiconductor crystal growth method and device ...
Invention Semiconductor crystal growth device. The present invention provides a semiconductor crystal grow...