- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 11/27 - Measuring arrangements characterised by the use of optical techniques for measuring angles or tapersMeasuring arrangements characterised by the use of optical techniques for testing the alignment of axes for testing the alignment of axes
Patent holdings for IPC class G01B 11/27
Total number of patents in this class: 1165
10-year publication summary
|
103
|
102
|
120
|
104
|
74
|
102
|
85
|
86
|
96
|
59
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| KLA Corporation | 1871 |
79 |
| ASML Netherlands B.V. | 7987 |
77 |
| KLA-Tencor Corporation | 2517 |
41 |
| Robert Bosch GmbH | 44252 |
21 |
| Hunter Engineering Company | 272 |
19 |
| Nikon Corporation | 7229 |
18 |
| Raytheon Company | 8435 |
17 |
| Samsung Electronics Co., Ltd. | 158605 |
15 |
| Prüftechnik Dieter Busch GmbH | 143 |
15 |
| ASML Holding N.V. | 487 |
13 |
| The Boeing Company | 20196 |
11 |
| Canon Inc. | 44134 |
11 |
| Applied Materials, Inc. | 20514 |
10 |
| FARO Technologies, Inc. | 802 |
10 |
| Kioxia Corporation | 10879 |
10 |
| Auros Technology, Inc. | 75 |
10 |
| SNAP-ON Incorporated | 1494 |
9 |
| Ford Global Technologies, LLC | 21582 |
8 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 48629 |
8 |
| EV Group E. Thallner GmbH | 427 |
7 |
| Other owners | 756 |