- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 15/04 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
Patent holdings for IPC class G01B 15/04
Total number of patents in this class: 369
10-year publication summary
|
23
|
31
|
25
|
28
|
36
|
31
|
28
|
21
|
15
|
9
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hitachi High-Technologies Corporation | 1987 |
62 |
| Hitachi High-Tech Corporation | 5846 |
54 |
| KLA Corporation | 1849 |
12 |
| Kioxia Corporation | 10815 |
10 |
| Nikon Corporation | 7228 |
9 |
| Vega Grieshaber KG | 767 |
7 |
| Wadeco Co., Ltd. | 19 |
6 |
| Applied Materials, Inc. | 20375 |
5 |
| Tokyo Electron Limited | 13807 |
5 |
| Tsinghua University | 6211 |
5 |
| Volume Graphics GmbH | 79 |
5 |
| Werth Messtechnik GmbH | 48 |
5 |
| Applied Materials Israel, Ltd. | 676 |
4 |
| Rigaku Corporation | 497 |
4 |
| Vayyar Imaging Ltd. | 159 |
4 |
| Topgolf Callaway Brands Corp. | 762 |
4 |
| International Business Machines Corporation | 62634 |
3 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 48302 |
3 |
| Omron Corporation | 7360 |
3 |
| FEI Company | 1052 |
3 |
| Other owners | 156 |