- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 15/04 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
Patent holdings for IPC class G01B 15/04
Total number of patents in this class: 355
10-year publication summary
|
11
|
23
|
32
|
25
|
28
|
36
|
31
|
27
|
19
|
9
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hitachi High-Technologies Corporation | 2004 |
62 |
| Hitachi High-Tech Corporation | 5264 |
52 |
| KLA Corporation | 1522 |
11 |
| Kioxia Corporation | 10288 |
10 |
| Nikon Corporation | 7166 |
9 |
| Vega Grieshaber KG | 755 |
7 |
| Applied Materials, Inc. | 18475 |
6 |
| Wadeco Co., Ltd. | 19 |
6 |
| Tokyo Electron Limited | 12599 |
5 |
| Volume Graphics GmbH | 78 |
5 |
| Werth Messtechnik GmbH | 53 |
5 |
| Applied Materials Israel, Ltd. | 606 |
4 |
| Tsinghua University | 5855 |
4 |
| Rigaku Corporation | 431 |
4 |
| Vayyar Imaging Ltd. | 156 |
4 |
| Topgolf Callaway Brands Corp. | 2042 |
4 |
| International Business Machines Corporation | 61144 |
3 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 42288 |
3 |
| Omron Corporation | 7244 |
3 |
| FEI Company | 941 |
3 |
| Other owners | 145 |