- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 9/02003 - Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using beat frequencies
Patent holdings for IPC class G01B 9/02003
Total number of patents in this class: 59
10-year publication summary
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0
|
0
|
0
|
2
|
1
|
11
|
11
|
12
|
11
|
5
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| ASML Netherlands B.V. | 7418 |
5 |
| Carl Zeiss SMT GmbH | 3011 |
3 |
| Mitutoyo Corporation | 1250 |
3 |
| Aurora Operations, Inc. | 1251 |
3 |
| Raytheon Company | 8385 |
2 |
| Omron Corporation | 7264 |
2 |
| Tsinghua University | 5940 |
2 |
| Nippon Telegraph and Telephone Corporation | 17365 |
2 |
| Harbin Institute of Technology | 442 |
2 |
| Oxford University Innovation Limited | 1544 |
2 |
| UT-Battelle, LLC | 1463 |
2 |
| Beijing U-precision Tech Co., Ltd. | 59 |
2 |
| OnPoint Technologies, LLC | 40 |
2 |
| Q*bird B.V. | 4 |
2 |
| NEC Corporation | 35827 |
1 |
| Hitachi, Ltd. | 15531 |
1 |
| FUJIFILM Corporation | 29489 |
1 |
| Panasonic Intellectual Property Management Co., Ltd. | 31696 |
1 |
| Lockheed Martin Corporation | 3275 |
1 |
| Hamamatsu Photonics K.K. | 4434 |
1 |
| Other owners | 19 |