- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 9/02017 - Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
Patent holdings for IPC class G01B 9/02017
Total number of patents in this class: 61
10-year publication summary
|
0
|
1
|
0
|
3
|
7
|
8
|
12
|
11
|
11
|
2
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Carl Zeiss SMT GmbH | 3210 |
3 |
| KLA Corporation | 1788 |
3 |
| VDL Enabling Technologies Group B.V. | 20 |
3 |
| Qunnect Inc. | 30 |
3 |
| ASML Netherlands B.V. | 7732 |
2 |
| Omron Corporation | 7337 |
2 |
| IDOM, S.A.U, a legal entity | 15 |
2 |
| Medlumics S.L. | 77 |
2 |
| The Research Foundation for The State University of New York | 1709 |
2 |
| Nova Ltd. | 190 |
2 |
| Apple Inc. | 58049 |
1 |
| Hitachi, Ltd. | 15881 |
1 |
| Mitsubishi Electric Corporation | 47556 |
1 |
| Panasonic Intellectual Property Management Co., Ltd. | 33462 |
1 |
| Corning Incorporated | 10420 |
1 |
| The General Hospital Corporation | 4803 |
1 |
| Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V. | 5173 |
1 |
| AMO Development, LLC | 631 |
1 |
| AOSense, Inc. | 33 |
1 |
| Associated Universities, Inc. | 47 |
1 |
| Other owners | 27 |