- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 9/02017 - Interferometers characterised by the beam path configuration with multiple interactions between the target object and light beams, e.g. beam reflections occurring from different locations
Patent holdings for IPC class G01B 9/02017
Total number of patents in this class: 68
10-year publication summary
|
1
|
2
|
0
|
3
|
9
|
8
|
13
|
11
|
12
|
8
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Carl Zeiss SMT GmbH | 3339 |
4 |
| ASML Netherlands B.V. | 7939 |
3 |
| Medlumics S.L. | 77 |
3 |
| KLA Corporation | 1856 |
3 |
| VDL Enabling Technologies Group B.V. | 20 |
3 |
| Qunnect Inc. | 34 |
3 |
| Omron Corporation | 7370 |
2 |
| FANUC Corporation | 7235 |
2 |
| IDOM, S.A.U, a legal entity | 15 |
2 |
| The Research Foundation for The State University of New York | 1743 |
2 |
| Nova Ltd. | 195 |
2 |
| Apple Inc. | 58885 |
1 |
| Hitachi, Ltd. | 16113 |
1 |
| Mitsubishi Electric Corporation | 48048 |
1 |
| Panasonic Intellectual Property Management Co., Ltd. | 34035 |
1 |
| Corning Incorporated | 10510 |
1 |
| The General Hospital Corporation | 4871 |
1 |
| Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V. | 5259 |
1 |
| AMO Development, LLC | 633 |
1 |
| AOSense, Inc. | 33 |
1 |
| Other owners | 30 |