- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/203 - Measuring back scattering
Patent holdings for IPC class G01N 23/203
Total number of patents in this class: 573
10-year publication summary
|
44
|
31
|
46
|
47
|
51
|
44
|
34
|
42
|
24
|
15
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| The Boeing Company | 20102 |
55 |
| Nuctech Company Limited | 1434 |
36 |
| Rapiscan Systems, Inc. | 286 |
29 |
| American Science and Engineering, Inc. | 102 |
25 |
| FEI Company | 1023 |
24 |
| Tsinghua University | 6080 |
22 |
| ASML Netherlands B.V. | 7680 |
17 |
| Troxler Electronic Laboratories, Inc. | 81 |
11 |
| Viken Detection Corporation | 63 |
10 |
| Hitachi High-Tech Corporation | 5593 |
10 |
| Commissariat à l'énergie atomique et aux energies alternatives | 10972 |
9 |
| Bruker Nano GmbH | 67 |
9 |
| Oxford Instruments NanoTechnology Tools Limited | 142 |
9 |
| Hitachi High-Technologies Corporation | 1993 |
8 |
| Halliburton Energy Services, Inc. | 21125 |
7 |
| Applied Materials Israel, Ltd. | 637 |
7 |
| KLA Corporation | 1762 |
7 |
| University of Florida Research Foundation, Inc. | 4127 |
6 |
| Inversa Systems Ltd. | 30 |
6 |
| Shenzhen Xpectvision Technology Co., Ltd. | 377 |
6 |
| Other owners | 260 |