- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/2055 - Analysing diffraction patterns
Patent holdings for IPC class G01N 23/2055
Total number of patents in this class: 231
10-year publication summary
|
10
|
10
|
29
|
22
|
22
|
28
|
35
|
21
|
20
|
14
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Rigaku Corporation | 504 |
25 |
| The Regents of the University of California | 20902 |
7 |
| KLA Corporation | 1879 |
6 |
| FEI Company | 1062 |
4 |
| Oxford Instruments NanoTechnology Tools Limited | 142 |
4 |
| Bruker Technologies Ltd. | 71 |
4 |
| LG Energy Solution, Ltd. | 19461 |
4 |
| ASML Netherlands B.V. | 8019 |
3 |
| California Institute of Technology | 4038 |
3 |
| Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.) | 2841 |
3 |
| Kobe Steel, Ltd. | 900 |
3 |
| Shin-Etsu Handotai Co., Ltd. | 1305 |
3 |
| Sigray, Inc. | 89 |
3 |
| Premex Inc. | 33 |
3 |
| Malvern PANalytical B.V. | 135 |
3 |
| Bruker AXS, LLC | 22 |
3 |
| Kioxia Corporation | 11017 |
3 |
| Nova Ltd. | 195 |
3 |
| Resonac Corporation | 3672 |
3 |
| Samsung Electronics Co., Ltd. | 159029 |
2 |
| Other owners | 139 |