- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/2208 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement all measurements being of secondary emission, e.g. combination of SE measurement and characteristic X-ray measurement
Patent holdings for IPC class G01N 23/2208
Total number of patents in this class: 38
10-year publication summary
|
0
|
2
|
2
|
5
|
4
|
5
|
7
|
4
|
5
|
1
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Nova Measuring Instruments Inc. | 70 |
5 |
| Veracio Ltd. | 68 |
3 |
| Samsung Electronics Co., Ltd. | 152016 |
2 |
| Commonwealth Scientific and Industrial Research Organisation | 1668 |
2 |
| Enersoft Inc. | 47 |
2 |
| JEOL Ltd. | 614 |
2 |
| Oxford Instruments NanoTechnology Tools Limited | 142 |
2 |
| Chrysos Corporation Limited | 18 |
2 |
| Schlumberger Technology Corporation | 11326 |
1 |
| Genentech, Inc. | 4050 |
1 |
| Howmedica Osteonics Corp. | 1382 |
1 |
| Aramco Services Company | 4157 |
1 |
| GLOBALFOUNDRIES U.S. Inc. | 6400 |
1 |
| Korea Atomic Energy Research Institute | 454 |
1 |
| Lkr Leichtmetallkompetenzzentrum Ranshofen GmbH | 20 |
1 |
| National Institute for Materials Science | 1091 |
1 |
| Rigaku Corporation | 470 |
1 |
| Saudi Arabian Oil Company | 13886 |
1 |
| SciAps, Inc. | 38 |
1 |
| Shin-Etsu Handotai Co., Ltd. | 1294 |
1 |
| Other owners | 6 |