- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/2209 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using wavelength dispersive spectroscopy [WDS]
Patent holdings for IPC class G01N 23/2209
Total number of patents in this class: 69
10-year publication summary
0
|
1
|
2
|
9
|
11
|
13
|
14
|
7
|
9
|
2
|
2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
Shimadzu Corporation | 6128 |
15 |
Rigaku Corporation | 426 |
15 |
JEOL Ltd. | 570 |
9 |
Sigray, Inc. | 77 |
4 |
Applied Materials Israel, Ltd. | 597 |
2 |
Commissariat à l'énergie atomique et aux energies alternatives | 10810 |
2 |
Easyxafs, LLC | 6 |
2 |
Applied Materials, Inc. | 18344 |
1 |
Bruker AXS GmbH | 47 |
1 |
Bruker Nano GmbH | 65 |
1 |
Elemental Scientific, Inc. | 269 |
1 |
FEI Company | 932 |
1 |
George Mason Research Foundation, Inc. | 88 |
1 |
HORIBA, Ltd. | 805 |
1 |
Institut National de La Recherche Scientifique | 251 |
1 |
Lintec Corporation | 1953 |
1 |
Saudi Arabian Oil Company | 12808 |
1 |
UChicago Argonne, LLC | 910 |
1 |
Università della Calabria | 47 |
1 |
University of Massachusetts | 2214 |
1 |
Other owners | 7 |