- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/2273 - Measuring photoelectron spectra, e.g. electron spectroscopy for chemical analysis [ESCA] or X-ray photoelectron spectroscopy [XPS]
Patent holdings for IPC class G01N 23/2273
Total number of patents in this class: 156
10-year publication summary
|
6
|
9
|
13
|
17
|
18
|
23
|
18
|
22
|
24
|
2
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Nova Measuring Instruments Inc. | 71 |
23 |
| Sumitomo Electric Industries, Ltd. | 16017 |
7 |
| Scienta Omicron AB | 20 |
5 |
| Samsung Electronics Co., Ltd. | 152534 |
4 |
| Semiconductor Energy Laboratory Co., Ltd. | 11643 |
4 |
| Sigray, Inc. | 86 |
4 |
| SPECS Surface Nano Analysis GmbH | 54 |
4 |
| VG Systems Limited | 18 |
4 |
| Toshiba Corporation | 12684 |
3 |
| Sumitomo Chemical Company, Limited | 9057 |
3 |
| Rigaku Corporation | 471 |
3 |
| Halliburton Energy Services, Inc. | 21153 |
2 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 46877 |
2 |
| Sumitomo Rubber Industries, Ltd. | 4711 |
2 |
| University of South Florida | 1867 |
2 |
| Analytical Mechanics Associates, Inc. | 10 |
2 |
| FEI Company | 1027 |
2 |
| KLA-Tencor Corporation | 2524 |
2 |
| Korea Research Institute of Standards and Science | 685 |
2 |
| Nankai University | 245 |
2 |
| Other owners | 74 |