- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 30/02 - Non-SPM analysing devices, e.g. SEM [Scanning Electron Microscope], spectrometer or optical microscope
Patent holdings for IPC class G01Q 30/02
Total number of patents in this class: 247
10-year publication summary
|
19
|
25
|
23
|
14
|
16
|
18
|
15
|
17
|
11
|
3
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Fractilia, LLC | 28 |
20 |
| Bruker Nano, Inc. | 382 |
18 |
| Carl Zeiss SMT GmbH | 3342 |
13 |
| The Regents of the University of California | 20790 |
7 |
| Centre National de La Recherche Scientifique | 11042 |
6 |
| Hitachi, Ltd. | 16146 |
6 |
| Nearfield Instruments B.V. | 61 |
5 |
| Lehigh University | 172 |
4 |
| University of Notre Dame du Lac | 610 |
4 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 48490 |
3 |
| Olympus Corporation | 12932 |
3 |
| President and Fellows of Harvard College | 6096 |
3 |
| Cedars-Sinai Medical Center | 1209 |
3 |
| JPK Instruments AG | 14 |
3 |
| KLA-Tencor Corporation | 2518 |
3 |
| Korea Research Institute of Standards and Science | 691 |
3 |
| Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2442 |
3 |
| Horiba France SAS | 77 |
3 |
| Gtheranostics Co., Ltd. | 8 |
3 |
| Samsung Electronics Co., Ltd. | 158156 |
2 |
| Other owners | 132 |