- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 30/06 - Display or data processing devices for error compensation
Patent holdings for IPC class G01Q 30/06
Total number of patents in this class: 90
10-year publication summary
|
1
|
4
|
11
|
5
|
11
|
7
|
7
|
10
|
5
|
3
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Fractilia, LLC | 29 |
20 |
| Bruker Nano, Inc. | 381 |
11 |
| Nearfield Instruments B.V. | 62 |
10 |
| Shimadzu Corporation | 6364 |
9 |
| Infinitesima Limited | 72 |
5 |
| Carl Zeiss SMT GmbH | 3352 |
2 |
| FEI Company | 1057 |
2 |
| JPK Instruments AG | 14 |
2 |
| The Penn State Research Foundation | 1622 |
2 |
| Rutgers, The State University of New Jersey | 1981 |
2 |
| Hitachi High-Tech Corporation | 5918 |
2 |
| LG Chem, Ltd. | 17950 |
1 |
| International Business Machines Corporation | 62748 |
1 |
| Hitachi High-Technologies Corporation | 1987 |
1 |
| Hitachi High-Tech Science Corporation | 48 |
1 |
| Seagate Technology LLC | 3962 |
1 |
| Massachusetts Institute of Technology | 10282 |
1 |
| University of Florida Research Foundation, Inc. | 4188 |
1 |
| The Governors of the University of Alberta | 874 |
1 |
| Institut Curie | 615 |
1 |
| Other owners | 14 |