- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/32 - AC mode
Patent holdings for IPC class G01Q 60/32
Total number of patents in this class: 157
10-year publication summary
|
14
|
21
|
12
|
14
|
10
|
6
|
6
|
7
|
6
|
8
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2461 |
34 |
| Bruker Nano, Inc. | 386 |
16 |
| Oxford Instruments Asylum Research, Inc. | 31 |
10 |
| Nearfield Instruments B.V. | 63 |
9 |
| National University Corporation Kanazawa University | 262 |
7 |
| Centre National de La Recherche Scientifique | 11122 |
5 |
| Olympus Corporation | 12900 |
5 |
| Osaka University | 3252 |
5 |
| ASML Netherlands B.V. | 8033 |
4 |
| Oxford Instruments plc | 18 |
4 |
| Specs Zürich GmbH | 5 |
3 |
| Shimadzu Corporation | 6376 |
2 |
| Anasys Instruments | 4 |
2 |
| Ecole Polytechnique Federale de Lausanne (epfl) | 1621 |
2 |
| Korea Research Institute of Standards and Science | 691 |
2 |
| Universidad Autonoma de Madrid | 202 |
2 |
| Universite D'angers | 175 |
2 |
| Universite de Bourgogne | 175 |
2 |
| Ecole Nationale Supérieure d'Ingénieurs de Caen | 65 |
2 |
| Universite de Caen Normandie | 127 |
2 |
| Other owners | 37 |