- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 70/00 - General aspects of SPM probes, their manufacture or their related instrumentation, insofar as they are not specially adapted to a single SPM technique covered by group
Patent holdings for IPC class G01Q 70/00
Total number of patents in this class: 34
10-year publication summary
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0
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0
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4
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2
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2
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6
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2
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2
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1
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1
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| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Nearfield Instruments B.V. | 51 |
7 |
| Carl Zeiss SMT GmbH | 2999 |
2 |
| Bruker Nano, Inc. | 340 |
2 |
| Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2378 |
2 |
| RHK Technology, Inc. | 15 |
2 |
| Hitachi, Ltd. | 15513 |
1 |
| Shimadzu Corporation | 6179 |
1 |
| Centro de Investigación Cooperativa en Biomateriales (CIC biomaGUNE) | 3 |
1 |
| Cornell University | 3307 |
1 |
| Infinitesima Limited | 68 |
1 |
| Institut National de La Recherche Agronomique (inra) | 161 |
1 |
| Lehigh University | 167 |
1 |
| NanoWorld AG | 21 |
1 |
| National University Corporation Kanazawa University | 244 |
1 |
| Quantum Design International, Inc. | 29 |
1 |
| Southwest Jiaotong University | 166 |
1 |
| Universidad de Barcelona | 94 |
1 |
| Universidade Federal de Minas Gerais - Ufmg | 193 |
1 |
| Veeco Instruments Inc. | 329 |
1 |
| Xi'an Jiaotong University | 661 |
1 |
| Other owners | 4 |