- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 70/04 - Probe holders with compensation for temperature or vibration induced errors
Patent holdings for IPC class G01Q 70/04
Total number of patents in this class: 26
10-year publication summary
|
3
|
2
|
1
|
3
|
2
|
2
|
2
|
2
|
0
|
0
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2456 |
5 |
| Bruker Nano, Inc. | 384 |
4 |
| Bruker Nano GmbH | 66 |
2 |
| National University Corporation Kanazawa University | 261 |
2 |
| The Penn State Research Foundation | 1636 |
2 |
| Nearfield Instruments B.V. | 63 |
2 |
| Carl Zeiss SMT GmbH | 3370 |
1 |
| Danmarks Tekniske Universitet | 1041 |
1 |
| Infinitesima Limited | 73 |
1 |
| KLA-Tencor Corporation | 2517 |
1 |
| Oxford Instruments Asylum Research Corporation | 1 |
1 |
| Technische Universiteit Delft | 774 |
1 |
| Universiteit leiden | 203 |
1 |
| Unisoku Co., Ltd. | 5 |
1 |
| Hitachi High-Tech Analysis Corporation | 286 |
1 |
| Other owners | 0 |