- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 70/08 - Probe characteristics
Patent holdings for IPC class G01Q 70/08
Total number of patents in this class: 66
10-year publication summary
|
5
|
2
|
5
|
6
|
2
|
3
|
7
|
5
|
4
|
2
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Carl Zeiss SMT GmbH | 3007 |
7 |
| Board of Regents of The Nevada System of Higher Education, on Behalf of The University of Nevada, Reno | 133 |
4 |
| Bruker Nano, Inc. | 341 |
3 |
| CBN Nano Technologies Inc. | 62 |
3 |
| The Regents of the University of California | 19989 |
2 |
| Hitachi High-Tech Science Corporation | 288 |
2 |
| Shimadzu Corporation | 6183 |
2 |
| Oxford Instruments Asylum Research, Inc. | 31 |
2 |
| Park Systems Corp. | 34 |
2 |
| Stc. UNM | 85 |
2 |
| Quantum Silicon Inc. | 24 |
2 |
| Samsung Electronics Co., Ltd. | 147003 |
1 |
| Schlumberger Technology Corporation | 10802 |
1 |
| International Business Machines Corporation | 61344 |
1 |
| Micron Technology, Inc. | 26251 |
1 |
| Hitachi, Ltd. | 15521 |
1 |
| Massachusetts Institute of Technology | 10066 |
1 |
| Korea Advanced Institute of Science and Technology | 4382 |
1 |
| Aalto University Foundation | 296 |
1 |
| Applied Nanostructures, Inc. | 7 |
1 |
| Other owners | 26 |