- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 70/08 - Probe characteristics
Patent holdings for IPC class G01Q 70/08
Total number of patents in this class: 73
10-year publication summary
|
2
|
5
|
7
|
2
|
3
|
7
|
5
|
5
|
4
|
3
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Carl Zeiss SMT GmbH | 3370 |
7 |
| Board of Regents of The Nevada System of Higher Education, on Behalf of The University of Nevada, Reno | 132 |
4 |
| The Regents of the University of California | 20902 |
3 |
| Bruker Nano, Inc. | 384 |
3 |
| Park Systems Corp. | 40 |
3 |
| CBN Nano Technologies Inc. | 59 |
3 |
| Samsung Electronics Co., Ltd. | 159029 |
2 |
| Hitachi High-Tech Science Corporation | 48 |
2 |
| Shimadzu Corporation | 6372 |
2 |
| Korea Advanced Institute of Science and Technology | 4708 |
2 |
| Oxford Instruments Asylum Research, Inc. | 31 |
2 |
| Stc. UNM | 85 |
2 |
| Quantum Silicon Inc. | 27 |
2 |
| Schlumberger Technology Corporation | 11940 |
1 |
| International Business Machines Corporation | 62805 |
1 |
| Micron Technology, Inc. | 27793 |
1 |
| Hitachi, Ltd. | 16206 |
1 |
| Massachusetts Institute of Technology | 10305 |
1 |
| Aalto University Foundation | 299 |
1 |
| Applied Nanostructures, Inc. | 7 |
1 |
| Other owners | 29 |