- All sections
- G - Physics
- G01R - Measuring electric variablesmeasuring magnetic variables
- G01R 31/26 - Testing of individual semiconductor devices
Patent holdings for IPC class G01R 31/26
Total number of patents in this class: 4962
10-year publication summary
|
306
|
349
|
293
|
315
|
293
|
303
|
304
|
296
|
280
|
150
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Advantest Corporation | 1692 |
175 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 48248 |
129 |
| Samsung Electronics Co., Ltd. | 157557 |
123 |
| Mitsubishi Electric Corporation | 47971 |
122 |
| Tokyo Electron Limited | 13796 |
118 |
| Texas Instruments Incorporated | 19663 |
113 |
| Infineon Technologies AG | 8400 |
93 |
| International Business Machines Corporation | 62621 |
68 |
| Kabushiki Kaisha Nihon Micronics | 433 |
64 |
| Fuji Electric Co., Ltd. | 5469 |
49 |
| Samsung Display Co., Ltd. | 38570 |
48 |
| Intel Corporation | 47102 |
44 |
| Robert Bosch GmbH | 44128 |
42 |
| SK Hynix Inc. | 12452 |
42 |
| Hamamatsu Photonics K.K. | 4669 |
42 |
| Enplas Corporation | 886 |
40 |
| Renesas Electronics Corporation | 5879 |
38 |
| Changxin Memory Technologies, Inc. | 4933 |
38 |
| Teradyne, Inc. | 512 |
33 |
| Boe Technology Group Co., Ltd. | 44004 |
31 |
| Other owners | 3510 |