- All sections
- G - Physics
- G01R - Measuring electric variablesmeasuring magnetic variables
- G01R 31/3167 - Testing of combined analog and digital circuits
Patent holdings for IPC class G01R 31/3167
Total number of patents in this class: 117
10-year publication summary
|
9
|
10
|
8
|
12
|
9
|
9
|
9
|
13
|
3
|
1
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Samsung Electronics Co., Ltd. | 154406 |
6 |
| Qualcomm Incorporated | 90545 |
6 |
| Texas Instruments Incorporated | 19635 |
6 |
| Xilinx, Inc. | 3927 |
5 |
| Robert Bosch GmbH | 43646 |
4 |
| Advantest Corporation | 1704 |
4 |
| ROHDE & Schwarz GmbH & Co. KG | 1988 |
4 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 47518 |
3 |
| NPX B.V. | 2757 |
3 |
| Cirrus Logic, Inc. | 1790 |
3 |
| Leviton Manufacturing Co., Inc. | 821 |
3 |
| NXP USA, Inc. | 4440 |
3 |
| International Business Machines Corporation | 62279 |
2 |
| SK Hynix Inc. | 12181 |
2 |
| Huawei Technologies Co., Ltd. | 120661 |
2 |
| STMicroelectronics S.r.l. | 3401 |
2 |
| Tektronix, Inc. | 667 |
2 |
| Teradyne, Inc. | 512 |
2 |
| WesternGeco L.L.C. | 554 |
2 |
| NXP B.V. | 1528 |
2 |
| Other owners | 51 |