- All sections
- G - Physics
- G01R - Measuring electric variablesmeasuring magnetic variables
- G01R 31/319 - Tester hardware, i.e. output processing circuits
Patent holdings for IPC class G01R 31/319
Total number of patents in this class: 1090
10-year publication summary
|
62
|
80
|
66
|
95
|
101
|
105
|
88
|
84
|
73
|
35
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Advantest Corporation | 1692 |
165 |
| Teradyne, Inc. | 512 |
49 |
| Tektronix, Inc. | 660 |
40 |
| ROHDE & Schwarz GmbH & Co. KG | 1996 |
39 |
| Samsung Electronics Co., Ltd. | 157557 |
30 |
| Texas Instruments Incorporated | 19663 |
28 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 48248 |
24 |
| International Business Machines Corporation | 62621 |
20 |
| Intel Corporation | 47102 |
19 |
| Micron Technology, Inc. | 27626 |
15 |
| Analog Devices, Inc. | 3321 |
13 |
| Qualcomm Incorporated | 91997 |
12 |
| Infineon Technologies AG | 8400 |
11 |
| STMicroelectronics S.r.l. | 3378 |
11 |
| Xcerra Corporation | 91 |
11 |
| Aehr Test Systems | 74 |
10 |
| Anritsu Corporation | 429 |
10 |
| SK Hynix Inc. | 12452 |
9 |
| Advantest Test Solutions, Inc. | 49 |
9 |
| Changxin Memory Technologies, Inc. | 4933 |
9 |
| Other owners | 556 |