- All sections
- G - Physics
- G01R - Measuring electric variablesmeasuring magnetic variables
- G01R 31/319 - Tester hardware, i.e. output processing circuits
Patent holdings for IPC class G01R 31/319
Total number of patents in this class: 1073
10-year publication summary
|
63
|
61
|
79
|
66
|
95
|
98
|
104
|
88
|
81
|
68
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Advantest Corporation | 1770 |
173 |
| Teradyne, Inc. | 518 |
51 |
| ROHDE & Schwarz GmbH & Co. KG | 1971 |
38 |
| Tektronix, Inc. | 672 |
35 |
| Samsung Electronics Co., Ltd. | 149087 |
30 |
| Texas Instruments Incorporated | 19495 |
28 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 46161 |
23 |
| International Business Machines Corporation | 61721 |
21 |
| Intel Corporation | 46460 |
18 |
| Aehr Test Systems | 85 |
16 |
| Qualcomm Incorporated | 87585 |
14 |
| Micron Technology, Inc. | 26558 |
14 |
| Analog Devices, Inc. | 3360 |
12 |
| STMicroelectronics S.r.l. | 3439 |
11 |
| Anritsu Corporation | 412 |
11 |
| Infineon Technologies AG | 8287 |
10 |
| Advantest Test Solutions, Inc. | 47 |
9 |
| Changxin Memory Technologies, Inc. | 4928 |
9 |
| SK Hynix Inc. | 11676 |
8 |
| NPX B.V. | 2615 |
8 |
| Other owners | 534 |