- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 11/06 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness for measuring thickness
Patent holdings for IPC class G01B 11/06
Total number of patents in this class: 2983
10-year publication summary
|
205
|
238
|
245
|
251
|
255
|
278
|
238
|
234
|
245
|
85
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Applied Materials, Inc. | 20112 |
108 |
| KLA-Tencor Corporation | 2523 |
74 |
| Tokyo Electron Limited | 13577 |
56 |
| KLA Corporation | 1795 |
50 |
| ASML Netherlands B.V. | 7770 |
40 |
| Hamamatsu Photonics K.K. | 4611 |
38 |
| Precitec Optronik GmbH | 82 |
38 |
| Samsung Electronics Co., Ltd. | 154751 |
36 |
| Nova Ltd. | 191 |
34 |
| Koh Young Technology Inc. | 353 |
25 |
| Hitachi High-Tech Corporation | 5676 |
24 |
| Gecko Robotics, Inc. | 132 |
23 |
| Mitutoyo Corporation | 1251 |
22 |
| Ebara Corporation | 2273 |
21 |
| KEYENCE Corporation | 508 |
21 |
| Korea Research Institute of Standards and Science | 685 |
21 |
| Corning Incorporated | 10431 |
19 |
| LG Energy Solution, Ltd. | 17861 |
19 |
| Onto Innovation Inc. | 377 |
18 |
| Sikora AG | 61 |
17 |
| Other owners | 2279 |