- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensions; measuring angles; measuring areas; measuring irregularities of surfaces or contours
- G01B 11/14 - Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
Patent holdings for IPC class G01B 11/14
Total number of patents in this class: 2334
10-year publication summary
|
244
|
253
|
218
|
177
|
168
|
123
|
113
|
87
|
77
|
0
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| ASML Netherlands B.V. | 7120 |
63 |
| FARO Technologies, Inc. | 797 |
47 |
| Dr. Johannes Heidenhain GmbH | 405 |
46 |
| Nikon Corporation | 7116 |
43 |
| KLA-Tencor Corporation | 2551 |
43 |
| The Boeing Company | 19900 |
39 |
| Canon Inc. | 38016 |
34 |
| Mitutoyo Corporation | 1218 |
34 |
| Carl Zeiss SMT GmbH | 2805 |
25 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 40493 |
22 |
| Leica Geosystems AG | 641 |
22 |
| Samsung Electronics Co., Ltd. | 138320 |
19 |
| Mitsubishi Heavy Industries, Ltd. | 8504 |
19 |
| FUJIFILM Corporation | 28467 |
18 |
| KEYENCE Corporation | 406 |
18 |
| Pixart Imaging Inc. | 1605 |
18 |
| Omron Corporation | 7153 |
16 |
| Boe Technology Group Co., Ltd. | 38724 |
15 |
| Toshiba Corporation | 12022 |
13 |
| Tokyo Electron Limited | 12067 |
13 |
| Other owners | 1767 |