- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 11/14 - Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
Patent holdings for IPC class G01B 11/14
Total number of patents in this class: 2362
10-year publication summary
|
241
|
249
|
215
|
174
|
165
|
122
|
106
|
84
|
79
|
74
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| ASML Netherlands B.V. | 7585 |
60 |
| FARO Technologies, Inc. | 807 |
48 |
| Dr. Johannes Heidenhain GmbH | 408 |
46 |
| KLA-Tencor Corporation | 2538 |
42 |
| Nikon Corporation | 7303 |
40 |
| The Boeing Company | 20163 |
38 |
| Canon Inc. | 41108 |
35 |
| Mitutoyo Corporation | 1249 |
31 |
| Carl Zeiss SMT GmbH | 3088 |
25 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 46161 |
23 |
| Leica Geosystems AG | 612 |
21 |
| Samsung Electronics Co., Ltd. | 149087 |
19 |
| FUJIFILM Corporation | 29817 |
19 |
| KEYENCE Corporation | 471 |
19 |
| Mitsubishi Heavy Industries, Ltd. | 8875 |
18 |
| Pixart Imaging Inc. | 1683 |
17 |
| Omron Corporation | 7306 |
15 |
| Boe Technology Group Co., Ltd. | 41781 |
15 |
| Toshiba Corporation | 12548 |
14 |
| Applied Materials, Inc. | 19248 |
14 |
| Other owners | 1803 |