- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 11/14 - Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
Patent holdings for IPC class G01B 11/14
Total number of patents in this class: 2364
10-year publication summary
|
249
|
215
|
174
|
165
|
122
|
106
|
84
|
80
|
79
|
7
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| ASML Netherlands B.V. | 7658 |
60 |
| FARO Technologies, Inc. | 807 |
47 |
| Dr. Johannes Heidenhain GmbH | 409 |
46 |
| KLA-Tencor Corporation | 2525 |
42 |
| Nikon Corporation | 7273 |
39 |
| The Boeing Company | 20104 |
37 |
| Canon Inc. | 41645 |
36 |
| Mitutoyo Corporation | 1250 |
31 |
| Carl Zeiss SMT GmbH | 3152 |
26 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 46560 |
23 |
| Leica Geosystems AG | 608 |
20 |
| Samsung Electronics Co., Ltd. | 151303 |
19 |
| FUJIFILM Corporation | 30016 |
19 |
| KEYENCE Corporation | 480 |
19 |
| Mitsubishi Heavy Industries, Ltd. | 8962 |
18 |
| Pixart Imaging Inc. | 1698 |
17 |
| Omron Corporation | 7333 |
15 |
| Boe Technology Group Co., Ltd. | 42451 |
15 |
| Toshiba Corporation | 12536 |
14 |
| Applied Materials, Inc. | 19628 |
14 |
| Other owners | 1807 |