- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 11/14 - Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures
Patent holdings for IPC class G01B 11/14
Total number of patents in this class: 2341
10-year publication summary
|
244
|
253
|
218
|
177
|
168
|
124
|
113
|
88
|
80
|
39
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| ASML Netherlands B.V. | 7301 |
62 |
| FARO Technologies, Inc. | 799 |
47 |
| Dr. Johannes Heidenhain GmbH | 408 |
46 |
| KLA-Tencor Corporation | 2546 |
43 |
| Nikon Corporation | 7155 |
41 |
| The Boeing Company | 19994 |
38 |
| Canon Inc. | 39365 |
34 |
| Mitutoyo Corporation | 1240 |
32 |
| Carl Zeiss SMT GmbH | 2935 |
25 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 42036 |
22 |
| Leica Geosystems AG | 628 |
22 |
| Samsung Electronics Co., Ltd. | 143812 |
19 |
| FUJIFILM Corporation | 29208 |
19 |
| KEYENCE Corporation | 432 |
19 |
| Mitsubishi Heavy Industries, Ltd. | 8641 |
18 |
| Pixart Imaging Inc. | 1654 |
18 |
| Omron Corporation | 7233 |
15 |
| Boe Technology Group Co., Ltd. | 40580 |
15 |
| Toshiba Corporation | 12273 |
14 |
| Applied Materials, Inc. | 18383 |
14 |
| Other owners | 1778 |