- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 15/00 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
Patent holdings for IPC class G01B 15/00
Total number of patents in this class: 551
10-year publication summary
|
50
|
35
|
50
|
41
|
32
|
18
|
18
|
39
|
37
|
10
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hitachi High-Technologies Corporation | 1992 |
83 |
| Hitachi High-Tech Corporation | 5669 |
49 |
| KLA-Tencor Corporation | 2523 |
14 |
| KLA Corporation | 1790 |
11 |
| Applied Materials Israel, Ltd. | 648 |
9 |
| Precision Planting LLC | 1169 |
9 |
| Samsung Electronics Co., Ltd. | 154406 |
8 |
| Advantest Corporation | 1704 |
8 |
| The Boeing Company | 20094 |
7 |
| ASML Netherlands B.V. | 7762 |
7 |
| May Patents Ltd. | 160 |
7 |
| Siemens AG | 24189 |
6 |
| Tsinghua University | 6112 |
6 |
| Nuctech Company Limited | 1432 |
6 |
| Applied Materials, Inc. | 20085 |
5 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 47518 |
5 |
| Arcam AB | 202 |
5 |
| General Electric Company | 13808 |
4 |
| NEC Corporation | 36702 |
4 |
| Robert Bosch GmbH | 43646 |
4 |
| Other owners | 294 |