- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 15/00 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
Patent holdings for IPC class G01B 15/00
Total number of patents in this class: 531
10-year publication summary
|
37
|
49
|
35
|
48
|
40
|
32
|
16
|
16
|
38
|
21
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hitachi High-Technologies Corporation | 2004 |
84 |
| Hitachi High-Tech Corporation | 5339 |
46 |
| KLA-Tencor Corporation | 2544 |
14 |
| Advantest Corporation | 1810 |
9 |
| Precision Planting LLC | 1107 |
9 |
| Samsung Electronics Co., Ltd. | 146811 |
8 |
| Applied Materials Israel, Ltd. | 614 |
8 |
| KLA Corporation | 1566 |
8 |
| The Boeing Company | 20084 |
7 |
| ASML Netherlands B.V. | 7406 |
7 |
| May Patents Ltd. | 143 |
7 |
| Siemens AG | 24453 |
6 |
| Tsinghua University | 5940 |
6 |
| Nuctech Company Limited | 1423 |
6 |
| Applied Materials, Inc. | 18746 |
5 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 42945 |
5 |
| Arcam AB | 202 |
5 |
| General Electric Company | 13810 |
4 |
| NEC Corporation | 35778 |
4 |
| Robert Bosch GmbH | 42705 |
4 |
| Other owners | 279 |