- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/22 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material
Patent holdings for IPC class G01N 23/22
Total number of patents in this class: 405
10-year publication summary
|
39
|
36
|
22
|
26
|
31
|
25
|
10
|
21
|
15
|
5
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hitachi High-Tech Corporation | 5819 |
23 |
| Nova Measuring Instruments Inc. | 68 |
14 |
| Hitachi High-Tech Analysis Corporation | 286 |
11 |
| Riken | 1716 |
10 |
| FEI Company | 1052 |
8 |
| KLA-Tencor Corporation | 2518 |
8 |
| Chrysos Corporation Limited | 18 |
7 |
| Malvern PANalytical B.V. | 133 |
7 |
| Halliburton Energy Services, Inc. | 21320 |
6 |
| KLA Corporation | 1844 |
6 |
| Applied Materials Israel, Ltd. | 675 |
5 |
| Topcon Corporation | 1184 |
5 |
| The United States of America, as represented by the Secretary of Agriculture | 1153 |
5 |
| Veracio Ltd. | 73 |
5 |
| ASML Netherlands B.V. | 7906 |
4 |
| Lawrence Livermore National Security, LLC | 1972 |
4 |
| Carl Zeiss SMT GmbH | 3328 |
4 |
| Rigaku Corporation | 495 |
4 |
| The Regents of the University of California | 20720 |
3 |
| International Business Machines Corporation | 62621 |
3 |
| Other owners | 263 |