- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/22 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material
Patent holdings for IPC class G01N 23/22
Total number of patents in this class: 397
10-year publication summary
|
39
|
34
|
20
|
26
|
30
|
23
|
10
|
18
|
13
|
0
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hitachi High-Tech Corporation | 5564 |
23 |
| Nova Measuring Instruments Inc. | 70 |
14 |
| Hitachi High-Tech Analysis Corporation | 285 |
11 |
| Riken | 1702 |
9 |
| KLA-Tencor Corporation | 2525 |
8 |
| FEI Company | 1015 |
7 |
| Chrysos Corporation Limited | 18 |
7 |
| Malvern PANalytical B.V. | 132 |
7 |
| Halliburton Energy Services, Inc. | 21117 |
6 |
| KLA Corporation | 1721 |
6 |
| Applied Materials Israel, Ltd. | 636 |
5 |
| Topcon Corporation | 1137 |
5 |
| The United States of America, as represented by the Secretary of Agriculture | 1130 |
5 |
| ASML Netherlands B.V. | 7649 |
4 |
| Lawrence Livermore National Security, LLC | 1952 |
4 |
| Carl Zeiss SMT GmbH | 3146 |
4 |
| Rigaku Corporation | 464 |
4 |
| The Regents of the University of California | 20355 |
3 |
| International Business Machines Corporation | 61904 |
3 |
| Ebara Corporation | 2249 |
3 |
| Other owners | 259 |