- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/22 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material
Patent holdings for IPC class G01N 23/22
Total number of patents in this class: 394
10-year publication summary
|
42
|
39
|
34
|
20
|
26
|
30
|
23
|
10
|
16
|
11
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hitachi High-Tech Corporation | 5431 |
23 |
| Nova Measuring Instruments Inc. | 69 |
14 |
| Hitachi High-Tech Science Corporation | 285 |
13 |
| Riken | 1691 |
9 |
| KLA-Tencor Corporation | 2542 |
8 |
| FEI Company | 966 |
7 |
| Chrysos Corporation Limited | 17 |
7 |
| Malvern PANalytical B.V. | 132 |
7 |
| Halliburton Energy Services, Inc. | 21019 |
6 |
| KLA Corporation | 1629 |
6 |
| Applied Materials Israel, Ltd. | 618 |
5 |
| Topcon Corporation | 1116 |
5 |
| The United States of America, as represented by the Secretary of Agriculture | 1119 |
5 |
| ASML Netherlands B.V. | 7529 |
4 |
| Lawrence Livermore National Security, LLC | 1941 |
4 |
| Carl Zeiss SMT GmbH | 3059 |
4 |
| The Regents of the University of California | 20211 |
3 |
| International Business Machines Corporation | 61651 |
3 |
| Ebara Corporation | 2214 |
3 |
| Bar-Ilan University | 434 |
3 |
| Other owners | 255 |