- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/2258 - Measuring secondary ion emission, e.g. secondary ion mass spectrometry [SIMS]
Patent holdings for IPC class G01N 23/2258
Total number of patents in this class: 81
10-year publication summary
|
4
|
3
|
5
|
9
|
13
|
11
|
7
|
12
|
7
|
7
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Luxembourg Institute of Science and Technology (list) | 405 |
7 |
| Nova Measuring Instruments Inc. | 71 |
5 |
| Applied Materials, Inc. | 20514 |
4 |
| The Board of Trustees of the Leland Stanford Junior University | 6697 |
3 |
| Ionwerks, Inc. | 11 |
3 |
| UT-Battelle, LLC | 1519 |
3 |
| Schlumberger Technology Corporation | 11893 |
2 |
| Schlumberger Canada Limited | 7627 |
2 |
| Shin-Etsu Chemical Co., Ltd. | 6127 |
2 |
| Carl Zeiss SMT GmbH | 3356 |
2 |
| Carl Zeiss Microscopy, LLC | 27 |
2 |
| The Governing Council of The University of Toronto, | 1547 |
2 |
| IDEXX Laboratories, Inc. | 911 |
2 |
| University of Tennessee Research Foundation | 765 |
2 |
| Standard Biotools Canada Inc. | 100 |
2 |
| SCHOTT Pharma AG & Co. KGaA | 122 |
2 |
| Schlumberger Technology B.v. | 5302 |
1 |
| Halliburton Energy Services, Inc. | 21296 |
1 |
| LG Chem, Ltd. | 17956 |
1 |
| Genentech, Inc. | 4119 |
1 |
| Other owners | 32 |