- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/2258 - Measuring secondary ion emission, e.g. secondary ion mass spectrometry [SIMS]
Patent holdings for IPC class G01N 23/2258
Total number of patents in this class: 74
10-year publication summary
|
4
|
3
|
4
|
8
|
12
|
9
|
7
|
10
|
7
|
0
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Luxembourg Institute of Science and Technology (list) | 393 |
7 |
| Nova Measuring Instruments Inc. | 70 |
4 |
| Applied Materials, Inc. | 19391 |
3 |
| The Board of Trustees of the Leland Stanford Junior University | 6552 |
3 |
| Ionwerks, Inc. | 12 |
3 |
| UT-Battelle, LLC | 1479 |
3 |
| Schlumberger Technology Corporation | 11129 |
2 |
| Schlumberger Canada Limited | 7460 |
2 |
| Shin-Etsu Chemical Co., Ltd. | 5823 |
2 |
| Carl Zeiss SMT GmbH | 3117 |
2 |
| Carl Zeiss Microscopy, LLC | 27 |
2 |
| The Governing Council of The University of Toronto, | 1509 |
2 |
| IDEXX Laboratories, Inc. | 867 |
2 |
| University of Tennessee Research Foundation | 751 |
2 |
| Standard Biotools Canada Inc. | 93 |
2 |
| SCHOTT Pharma AG & Co. KGaA | 114 |
2 |
| Schlumberger Technology B.v. | 5228 |
1 |
| Halliburton Energy Services, Inc. | 21122 |
1 |
| LG Chem, Ltd. | 17702 |
1 |
| Genentech, Inc. | 4011 |
1 |
| Other owners | 27 |