- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 10/06 - Circuits or algorithms therefor
Patent holdings for IPC class G01Q 10/06
Total number of patents in this class: 247
10-year publication summary
21
|
25
|
23
|
18
|
16
|
14
|
15
|
17
|
11
|
2
|
2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
Bruker Nano, Inc. | 335 |
36 |
Infinitesima Limited | 65 |
26 |
Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2327 |
15 |
Carl Zeiss SMT GmbH | 2886 |
13 |
Shimadzu Corporation | 6088 |
11 |
Nearfield Instruments B.V. | 48 |
8 |
National University Corporation Kanazawa University | 249 |
5 |
Oxford Instruments Asylum Research, Inc. | 31 |
4 |
Universitat Basel | 289 |
4 |
Ohba, Yusuke | 7 |
4 |
Massachusetts Institute of Technology | 9931 |
3 |
Anton Paar GmbH | 182 |
3 |
Cornell University | 3252 |
3 |
IMEC VZW | 1565 |
3 |
Imperial Innovations Limited | 601 |
3 |
JPK Instruments AG | 20 |
3 |
SensApex Oy | 15 |
3 |
Universite Joseph Fourier | 152 |
3 |
UT-Battelle, LLC | 1424 |
3 |
Centre National de La Recherche Scientifique | 10165 |
2 |
Other owners | 92 |