- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 40/00 - Calibration, e.g. of probes
Patent holdings for IPC class G01Q 40/00
Total number of patents in this class: 102
10-year publication summary
|
6
|
8
|
8
|
7
|
2
|
2
|
5
|
6
|
6
|
5
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Infinitesima Limited | 68 |
10 |
| Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2384 |
8 |
| Oxford Instruments Asylum Research, Inc. | 31 |
7 |
| Bruker Nano, Inc. | 347 |
5 |
| Centre National de La Recherche Scientifique | 10516 |
4 |
| Nearfield Instruments B.V. | 52 |
4 |
| University Court of The University of ST Andrews | 317 |
3 |
| Seagate Technology LLC | 3970 |
2 |
| Carl Zeiss SMT GmbH | 3019 |
2 |
| Ecole Normale Superieure de Lyon | 239 |
2 |
| Horiba Jobin Yvon SAS | 48 |
2 |
| Hysitron, Inc. | 35 |
2 |
| Universite Claude Bernard Lyon 1 | 1028 |
2 |
| Veeco Instruments Inc. | 331 |
2 |
| Ouster, Inc. | 167 |
2 |
| Paris Sciences et Lettres - Quartier Latin | 213 |
2 |
| Sorbonne Universite | 1303 |
2 |
| Molecular Vista, Inc. | 15 |
2 |
| Hitachi High-Tech Corporation | 5364 |
2 |
| Samsung Electronics Co., Ltd. | 147501 |
1 |
| Other owners | 36 |