- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/38 - Probes, their manufacture or their related instrumentation, e.g. holders
Patent holdings for IPC class G01Q 60/38
Total number of patents in this class: 288
10-year publication summary
|
15
|
14
|
24
|
22
|
29
|
34
|
24
|
21
|
13
|
12
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Bruker Nano, Inc. | 343 |
30 |
| Centre National de La Recherche Scientifique | 10476 |
11 |
| Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2382 |
10 |
| The Regents of the University of California | 20015 |
7 |
| Shimadzu Corporation | 6187 |
6 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 43064 |
5 |
| President and Fellows of Harvard College | 5993 |
5 |
| Carl Zeiss SMT GmbH | 3011 |
5 |
| Vmicro | 10 |
5 |
| Park Systems Corp. | 34 |
4 |
| Shenyang Institute of Automation, Chinese Academy of Sciences | 83 |
4 |
| Veeco Instruments Inc. | 331 |
4 |
| AMG Technology Ltd. | 7 |
4 |
| International Business Machines Corporation | 61353 |
3 |
| Commissariat à l'énergie atomique et aux energies alternatives | 10930 |
3 |
| The Board of Trustees of the University of Illinois | 2704 |
3 |
| Korea Advanced Institute of Science and Technology | 4387 |
3 |
| DCG Systems, Inc. | 57 |
3 |
| UT-Battelle, LLC | 1463 |
3 |
| Samsung Electronics Co., Ltd. | 147131 |
2 |
| Other owners | 168 |