- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/38 - Probes, their manufacture or their related instrumentation, e.g. holders
Patent holdings for IPC class G01Q 60/38
Total number of patents in this class: 283
10-year publication summary
|
15
|
14
|
24
|
22
|
29
|
34
|
24
|
20
|
13
|
8
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Bruker Nano, Inc. | 337 |
27 |
| Centre National de La Recherche Scientifique | 10414 |
11 |
| Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2375 |
10 |
| The Regents of the University of California | 19868 |
7 |
| Shimadzu Corporation | 6155 |
6 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 42461 |
5 |
| President and Fellows of Harvard College | 5966 |
5 |
| Carl Zeiss SMT GmbH | 2965 |
5 |
| Vmicro | 10 |
5 |
| Park Systems Corp. | 33 |
4 |
| Shenyang Institute of Automation, Chinese Academy of Sciences | 82 |
4 |
| Veeco Instruments Inc. | 325 |
4 |
| AMG Technology Ltd. | 7 |
4 |
| International Business Machines Corporation | 61207 |
3 |
| Commissariat à l'énergie atomique et aux energies alternatives | 10924 |
3 |
| The Board of Trustees of the University of Illinois | 2689 |
3 |
| DCG Systems, Inc. | 58 |
3 |
| UT-Battelle, LLC | 1448 |
3 |
| Hitachi, Ltd. | 15459 |
2 |
| Board of Regents, The University of Texas System | 5772 |
2 |
| Other owners | 167 |