- All sections
- H - Electricity
- H01J - Electric discharge tubes or discharge lamps
- H01J 37/26 - Electron or ion microscopesElectron- or ion-diffraction tubes
Patent holdings for IPC class H01J 37/26
Total number of patents in this class: 1841
10-year publication summary
|
136
|
130
|
122
|
146
|
118
|
135
|
142
|
128
|
119
|
73
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hitachi High-Tech Corporation | 5323 |
261 |
| FEI Company | 944 |
219 |
| ASML Netherlands B.V. | 7392 |
108 |
| JEOL Ltd. | 581 |
82 |
| Carl Zeiss Microscopy GmbH | 1205 |
58 |
| KLA-Tencor Corporation | 2544 |
42 |
| Hitachi High-Technologies Corporation | 2004 |
33 |
| Applied Materials Israel, Ltd. | 611 |
33 |
| Protochips, Inc. | 76 |
31 |
| Carl Zeiss MultiSEM GmbH | 135 |
31 |
| Hitachi, Ltd. | 15495 |
26 |
| Hitachi High-Tech Science Corporation | 289 |
26 |
| Carl Zeiss SMT GmbH | 2979 |
23 |
| The Regents of the University of California | 19929 |
21 |
| ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | 159 |
21 |
| NuFlare Technology, Inc. | 845 |
17 |
| Samsung Electronics Co., Ltd. | 146346 |
15 |
| Applied Materials, Inc. | 18658 |
14 |
| Korea Research Institute of Standards and Science | 675 |
14 |
| Universiteit Antwerpen | 379 |
13 |
| Other owners | 753 |