- All sections
- H - Electricity
- H01J - Electric discharge tubes or discharge lamps
- H01J 37/31 - Electron-beam or ion-beam tubes for localised treatment of objects for cutting or drilling
Patent holdings for IPC class H01J 37/31
Total number of patents in this class: 123
10-year publication summary
|
10
|
9
|
13
|
19
|
11
|
13
|
7
|
9
|
3
|
5
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| FEI Company | 1062 |
15 |
| NuFlare Technology, Inc. | 928 |
8 |
| Hitachi High-Tech Corporation | 5969 |
8 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 48861 |
5 |
| JEOL Ltd. | 626 |
5 |
| Hitachi High-Tech Analysis Corporation | 286 |
5 |
| ASML Netherlands B.V. | 8019 |
4 |
| Carl Zeiss Microscopy GmbH | 1296 |
4 |
| Gatan, Inc. | 112 |
4 |
| Applied Materials, Inc. | 20579 |
3 |
| Varian Semiconductor Equipment Associates, Inc. | 1177 |
3 |
| Tel Manufacturing and Engineering of America, Inc. | 155 |
3 |
| Shanghai Huali Integrated Circuit Corporation | 242 |
3 |
| Hon Hai Precision Industry Co., Ltd. | 4019 |
2 |
| Applied Materials Israel, Ltd. | 688 |
2 |
| Board of Regents, The University of Texas System | 6172 |
2 |
| Tsinghua University | 6248 |
2 |
| Axcelis Technologies, Inc. | 425 |
2 |
| E.A. Fischione Instruments, Inc. | 14 |
2 |
| IMS Nanofabrication GmbH | 61 |
2 |
| Other owners | 39 |