- All sections
- H - Electricity
- H01J - Electric discharge tubes or discharge lamps
- H01J 37/31 - Electron-beam or ion-beam tubes for localised treatment of objects for cutting or drilling
Patent holdings for IPC class H01J 37/31
Total number of patents in this class: 114
10-year publication summary
|
11
|
10
|
9
|
13
|
19
|
11
|
13
|
7
|
5
|
3
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| FEI Company | 995 |
13 |
| NuFlare Technology, Inc. | 886 |
8 |
| Hitachi High-Tech Corporation | 5482 |
7 |
| Hitachi High-Tech Analysis Corporation | 283 |
5 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 46182 |
4 |
| ASML Netherlands B.V. | 7593 |
4 |
| Carl Zeiss Microscopy GmbH | 1229 |
4 |
| Gatan, Inc. | 111 |
4 |
| JEOL Ltd. | 600 |
4 |
| Varian Semiconductor Equipment Associates, Inc. | 1224 |
3 |
| Tel Manufacturing and Engineering of America, Inc. | 138 |
3 |
| Shanghai Huali Integrated Circuit Corporation | 202 |
3 |
| Hon Hai Precision Industry Co., Ltd. | 4024 |
2 |
| Applied Materials, Inc. | 19298 |
2 |
| Applied Materials Israel, Ltd. | 619 |
2 |
| Board of Regents, The University of Texas System | 5946 |
2 |
| Tsinghua University | 6023 |
2 |
| Axcelis Technologies, Inc. | 424 |
2 |
| E.A. Fischione Instruments, Inc. | 14 |
2 |
| NexGen Semi Holding, Inc. | 23 |
2 |
| Other owners | 36 |