- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 21/95 - Investigating the presence of flaws, defects or contamination characterised by the material or shape of the object to be examined
Patent holdings for IPC class G01N 21/95
Total number of patents in this class: 4331
10-year publication summary
|
283
|
335
|
336
|
378
|
396
|
379
|
333
|
347
|
398
|
140
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| KLA-Tencor Corporation | 2522 |
408 |
| KLA Corporation | 1812 |
337 |
| ASML Netherlands B.V. | 7785 |
172 |
| Samsung Electronics Co., Ltd. | 155224 |
149 |
| Hitachi High-Tech Corporation | 5694 |
137 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 47734 |
107 |
| Applied Materials Israel, Ltd. | 654 |
74 |
| Applied Materials, Inc. | 20145 |
69 |
| Tokyo Electron Limited | 13617 |
64 |
| Nova Ltd. | 191 |
49 |
| Onto Innovation Inc. | 378 |
43 |
| Unity Semiconductor | 65 |
37 |
| Samsung Display Co., Ltd. | 38092 |
31 |
| The Boeing Company | 20131 |
31 |
| Camtek Ltd. | 96 |
30 |
| Hamamatsu Photonics K.K. | 4620 |
28 |
| Carl Zeiss SMT GmbH | 3258 |
26 |
| Screen Holdings Co., Ltd. | 3114 |
24 |
| Femtometrix, Inc. | 43 |
23 |
| NuFlare Technology, Inc. | 908 |
23 |
| Other owners | 2469 |