- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 21/95 - Investigating the presence of flaws, defects or contamination characterised by the material or shape of the object to be examined
Patent holdings for IPC class G01N 21/95
Total number of patents in this class: 4068
10-year publication summary
|
299
|
280
|
328
|
332
|
367
|
389
|
363
|
319
|
333
|
290
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| KLA-Tencor Corporation | 2544 |
412 |
| KLA Corporation | 1603 |
309 |
| ASML Netherlands B.V. | 7434 |
171 |
| Hitachi High-Tech Corporation | 5364 |
135 |
| Samsung Electronics Co., Ltd. | 147501 |
132 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 43258 |
96 |
| Applied Materials Israel, Ltd. | 611 |
69 |
| Applied Materials, Inc. | 18861 |
59 |
| Tokyo Electron Limited | 12877 |
58 |
| Nova Ltd. | 171 |
45 |
| Onto Innovation Inc. | 362 |
37 |
| Unity Semiconductor | 63 |
35 |
| The Boeing Company | 20117 |
31 |
| Samsung Display Co., Ltd. | 35171 |
29 |
| Hamamatsu Photonics K.K. | 4446 |
27 |
| Camtek Ltd. | 95 |
27 |
| NuFlare Technology, Inc. | 852 |
23 |
| Omni Medsci, Inc. | 37 |
23 |
| Screen Holdings Co., Ltd. | 2856 |
23 |
| Carl Zeiss SMT GmbH | 3019 |
21 |
| Other owners | 2306 |