- All sections
- G - Physics
- G01R - Measuring electric variablesmeasuring magnetic variables
- G01R 31/307 - Contactless testing using electron beams of integrated circuits
Patent holdings for IPC class G01R 31/307
Total number of patents in this class: 94
10-year publication summary
|
7
|
6
|
6
|
8
|
5
|
4
|
14
|
5
|
13
|
7
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| ASML Netherlands B.V. | 7959 |
14 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 48539 |
12 |
| Applied Materials, Inc. | 20459 |
9 |
| Intel Corporation | 47069 |
6 |
| Samsung Electronics Co., Ltd. | 158337 |
4 |
| KLA-Tencor Corporation | 2518 |
4 |
| Hitachi High-Tech Corporation | 5903 |
4 |
| Micron Technology, Inc. | 27709 |
3 |
| DCG Systems, Inc. | 50 |
3 |
| Texas Instruments Incorporated | 19636 |
2 |
| Texas Instruments Japan, Ltd. | 1656 |
2 |
| Acellent Technologies, Inc. | 35 |
2 |
| FEI Company | 1055 |
2 |
| Top Engineering Co., Ltd. | 31 |
2 |
| GLOBALFOUNDRIES Singapore Pte. Ltd. | 850 |
2 |
| Cozai Ltd | 4 |
2 |
| Fujitsu Limited | 16860 |
1 |
| Hitachi, Ltd. | 16157 |
1 |
| Renesas Electronics Corporation | 5862 |
1 |
| Applied Materials Israel, Ltd. | 682 |
1 |
| Other owners | 17 |