- All sections
- G - Physics
- G01R - Measuring electric variablesmeasuring magnetic variables
- G01R 31/307 - Contactless testing using electron beams of integrated circuits
Patent holdings for IPC class G01R 31/307
Total number of patents in this class: 77
10-year publication summary
|
7
|
7
|
6
|
6
|
8
|
5
|
4
|
13
|
5
|
2
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| ASML Netherlands B.V. | 7312 |
9 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 42118 |
8 |
| Intel Corporation | 46699 |
4 |
| Applied Materials, Inc. | 18406 |
4 |
| KLA-Tencor Corporation | 2546 |
4 |
| Hitachi High-Tech Corporation | 5241 |
4 |
| Micron Technology, Inc. | 26209 |
3 |
| DCG Systems, Inc. | 59 |
3 |
| Samsung Electronics Co., Ltd. | 144143 |
2 |
| Texas Instruments Incorporated | 19487 |
2 |
| Texas Instruments Japan, Ltd. | 1656 |
2 |
| Acellent Technologies, Inc. | 36 |
2 |
| Chipworks, Inc. | 6 |
2 |
| FEI Company | 937 |
2 |
| Top Engineering Co., Ltd. | 30 |
2 |
| GLOBALFOUNDRIES Singapore Pte. Ltd. | 798 |
2 |
| Cozai Ltd | 4 |
2 |
| Fujitsu Limited | 18356 |
1 |
| Hitachi, Ltd. | 15434 |
1 |
| Renesas Electronics Corporation | 6041 |
1 |
| Other owners | 17 |