- All sections
- G - Physics
- G01R - Measuring electric variablesmeasuring magnetic variables
- G01R 31/3183 - Generation of test inputs, e.g. test vectors, patterns or sequences
Patent holdings for IPC class G01R 31/3183
Total number of patents in this class: 769
10-year publication summary
|
49
|
38
|
62
|
68
|
70
|
58
|
84
|
66
|
59
|
43
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Texas Instruments Incorporated | 19495 |
58 |
| Advantest Corporation | 1770 |
55 |
| Siemens Industry Software Inc. | 1663 |
47 |
| Synopsys, Inc. | 2748 |
35 |
| International Business Machines Corporation | 61721 |
33 |
| Cadence Design Systems, Inc. | 1790 |
22 |
| Intel Corporation | 46460 |
19 |
| Tektronix, Inc. | 672 |
18 |
| Teradyne, Inc. | 518 |
18 |
| Samsung Electronics Co., Ltd. | 149087 |
16 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 46161 |
16 |
| Kyushu Institute of Technology | 290 |
11 |
| Qualcomm Incorporated | 87585 |
10 |
| Xilinx, Inc. | 3947 |
9 |
| Imagination Technologies Limited | 1723 |
9 |
| Huawei Technologies Co., Ltd. | 115827 |
8 |
| SK Hynix Inc. | 11676 |
7 |
| Realtek Semiconductor Corp. | 3351 |
7 |
| ROHDE & Schwarz GmbH & Co. KG | 1971 |
7 |
| Marvell Asia PTE, Ltd. | 6427 |
7 |
| Other owners | 357 |