- All sections
- G - Physics
- G01R - Measuring electric variablesmeasuring magnetic variables
- G01R 31/3183 - Generation of test inputs, e.g. test vectors, patterns or sequences
Patent holdings for IPC class G01R 31/3183
Total number of patents in this class: 762
10-year publication summary
|
49
|
38
|
62
|
68
|
70
|
59
|
84
|
65
|
59
|
22
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Texas Instruments Incorporated | 19482 |
64 |
| Advantest Corporation | 1828 |
56 |
| Siemens Industry Software Inc. | 1652 |
43 |
| International Business Machines Corporation | 61123 |
32 |
| Synopsys, Inc. | 2780 |
32 |
| Cadence Design Systems, Inc. | 1769 |
22 |
| Intel Corporation | 46751 |
19 |
| Teradyne, Inc. | 546 |
18 |
| Tektronix, Inc. | 667 |
17 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 42222 |
16 |
| Samsung Electronics Co., Ltd. | 144426 |
15 |
| Kyushu Institute of Technology | 293 |
13 |
| Qualcomm Incorporated | 84634 |
10 |
| Xilinx, Inc. | 4002 |
9 |
| Imagination Technologies Limited | 1643 |
8 |
| SK Hynix Inc. | 11253 |
7 |
| Huawei Technologies Co., Ltd. | 111237 |
7 |
| Realtek Semiconductor Corp. | 3274 |
7 |
| ROHDE & Schwarz GmbH & Co. KG | 1916 |
7 |
| Marvell Asia PTE, Ltd. | 6561 |
7 |
| Other owners | 353 |