- All sections
- G - Physics
- G01R - Measuring electric variablesmeasuring magnetic variables
- G01R 31/3183 - Generation of test inputs, e.g. test vectors, patterns or sequences
Patent holdings for IPC class G01R 31/3183
Total number of patents in this class: 777
10-year publication summary
|
38
|
62
|
68
|
70
|
59
|
84
|
66
|
59
|
48
|
25
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Texas Instruments Incorporated | 19653 |
55 |
| Advantest Corporation | 1693 |
50 |
| Siemens Industry Software Inc. | 1855 |
47 |
| International Business Machines Corporation | 62671 |
36 |
| Synopsys, Inc. | 2714 |
34 |
| Cadence Design Systems, Inc. | 1787 |
22 |
| Intel Corporation | 47122 |
20 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 48438 |
19 |
| Teradyne, Inc. | 518 |
18 |
| Samsung Electronics Co., Ltd. | 157946 |
17 |
| Tektronix, Inc. | 654 |
17 |
| Qualcomm Incorporated | 92416 |
11 |
| Xilinx, Inc. | 3945 |
9 |
| Imagination Technologies Limited | 1789 |
9 |
| Kyushu Institute of Technology | 290 |
9 |
| Huawei Technologies Co., Ltd. | 123543 |
8 |
| SK Hynix Inc. | 12506 |
7 |
| Realtek Semiconductor Corp. | 3505 |
7 |
| ROHDE & Schwarz GmbH & Co. KG | 1994 |
7 |
| Marvell Asia PTE, Ltd. | 6309 |
7 |
| Other owners | 368 |