- All sections
- G - Physics
- G03F - Photomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devicesmaterials therefororiginals thereforapparatus specially adapted therefor
- G03F 1/44 - Testing or measuring features, e.g. grid patterns, focus monitors, sawtooth scales or notched scales
Patent holdings for IPC class G03F 1/44
Total number of patents in this class: 228
10-year publication summary
|
22
|
22
|
20
|
14
|
18
|
15
|
17
|
25
|
11
|
3
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| ASML Netherlands B.V. | 7630 |
39 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 46420 |
30 |
| KLA-Tencor Corporation | 2526 |
18 |
| Samsung Electronics Co., Ltd. | 150501 |
12 |
| Carl Zeiss SMT GmbH | 3132 |
8 |
| Boe Technology Group Co., Ltd. | 42239 |
8 |
| D2s, Inc. | 187 |
8 |
| Synopsys, Inc. | 2735 |
6 |
| Nikon Corporation | 7295 |
5 |
| Hoya Corporation | 2753 |
5 |
| International Business Machines Corporation | 61850 |
4 |
| Ordos Yuansheng Optoelectronics Co., Ltd. | 1284 |
4 |
| Changxin Memory Technologies, Inc. | 4926 |
4 |
| KLA Corporation | 1709 |
4 |
| Micron Technology, Inc. | 26838 |
3 |
| Dai Nippon Printing Co., Ltd. | 4159 |
3 |
| Shenzhen China Star Optoelectronics Technology Co., Ltd. | 8475 |
3 |
| Beijing BOE Optoelectronics Technology Co., Ltd. | 3908 |
3 |
| Shanghai Huali Microelectronics Corporation | 167 |
3 |
| Kioxia Corporation | 10493 |
3 |
| Other owners | 55 |