- All sections
- G - Physics
- G03F - Photomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devicesmaterials therefororiginals thereforapparatus specially adapted therefor
- G03F 1/44 - Testing or measuring features, e.g. grid patterns, focus monitors, sawtooth scales or notched scales
Patent holdings for IPC class G03F 1/44
Total number of patents in this class: 220
10-year publication summary
15
|
22
|
22
|
20
|
14
|
18
|
15
|
17
|
24
|
6
|
2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
ASML Netherlands B.V. | 7351 |
37 |
Taiwan Semiconductor Manufacturing Company, Ltd. | 42288 |
29 |
KLA-Tencor Corporation | 2546 |
18 |
Samsung Electronics Co., Ltd. | 144675 |
12 |
Boe Technology Group Co., Ltd. | 40728 |
8 |
Carl Zeiss SMT GmbH | 2958 |
7 |
D2s, Inc. | 174 |
7 |
Synopsys, Inc. | 2782 |
6 |
Nikon Corporation | 7166 |
5 |
Hoya Corporation | 2738 |
5 |
International Business Machines Corporation | 61144 |
4 |
Ordos Yuansheng Optoelectronics Co., Ltd. | 1268 |
4 |
Changxin Memory Technologies, Inc. | 4926 |
4 |
KLA Corporation | 1522 |
4 |
Micron Technology, Inc. | 26221 |
3 |
Dai Nippon Printing Co., Ltd. | 4066 |
3 |
Shenzhen China Star Optoelectronics Technology Co., Ltd. | 8478 |
3 |
Beijing BOE Optoelectronics Technology Co., Ltd. | 3878 |
3 |
Shanghai Huali Microelectronics Corporation | 176 |
3 |
Kioxia Corporation | 10288 |
3 |
Other owners | 52 |