- All sections
- G - Physics
- G03F - Photomechanical production of textured or patterned surfaces, e.g. for printing, for processing of semiconductor devicesmaterials therefororiginals thereforapparatus specially adapted therefor
- G03F 1/44 - Testing or measuring features, e.g. grid patterns, focus monitors, sawtooth scales or notched scales
Patent holdings for IPC class G03F 1/44
Total number of patents in this class: 236
10-year publication summary
|
22
|
22
|
20
|
14
|
18
|
15
|
19
|
25
|
10
|
12
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| ASML Netherlands B.V. | 7894 |
40 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 48214 |
31 |
| KLA-Tencor Corporation | 2519 |
18 |
| Samsung Electronics Co., Ltd. | 157300 |
12 |
| Carl Zeiss SMT GmbH | 3315 |
8 |
| Boe Technology Group Co., Ltd. | 43910 |
8 |
| D2s, Inc. | 199 |
8 |
| Synopsys, Inc. | 2718 |
6 |
| Nikon Corporation | 7238 |
5 |
| Hoya Corporation | 2720 |
5 |
| Samsung Display Co., Ltd. | 38544 |
4 |
| International Business Machines Corporation | 62612 |
4 |
| Ordos Yuansheng Optoelectronics Co., Ltd. | 1296 |
4 |
| Changxin Memory Technologies, Inc. | 4933 |
4 |
| KLA Corporation | 1840 |
4 |
| Micron Technology, Inc. | 27611 |
3 |
| United Microelectronics Corp. | 4492 |
3 |
| Dai Nippon Printing Co., Ltd. | 4234 |
3 |
| Shenzhen China Star Optoelectronics Technology Co., Ltd. | 8472 |
3 |
| Beijing BOE Optoelectronics Technology Co., Ltd. | 3931 |
3 |
| Other owners | 60 |