• All sections
• G - Physics
• G01N - Investigating or analysing materials by determining their chemical or physical properties
• G01N 23/2251 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material using electron or ion microprobes using incident electron beams, e.g. scanning electron microscopy [SEM]

Patent holdings for IPC class G01N 23/2251

Total number of patents in this class: 780

10-year publication summary

Principal owners for this class