- All sections
- G - Physics
- G01R - Measuring electric variablesmeasuring magnetic variables
- G01R 31/305 - Contactless testing using electron beams
Patent holdings for IPC class G01R 31/305
Total number of patents in this class: 64
10-year publication summary
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3
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4
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4
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3
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0
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3
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5
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3
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6
|
4
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| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Applied Materials, Inc. | 20601 |
9 |
| FEI Company | 1063 |
6 |
| Hitachi High-Tech Corporation | 5987 |
6 |
| Applied Materials Israel, Ltd. | 690 |
4 |
| Intel Corporation | 46313 |
3 |
| ASML Netherlands B.V. | 8033 |
3 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 49027 |
2 |
| ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | 157 |
2 |
| Samsung Electronics Co., Ltd. | 159298 |
1 |
| Centre National de La Recherche Scientifique | 11122 |
1 |
| Texas Instruments Incorporated | 19622 |
1 |
| Renesas Electronics Corporation | 5859 |
1 |
| Ricoh Company, Ltd. | 13407 |
1 |
| Tokyo Electron Limited | 13956 |
1 |
| Macronix International Co., Ltd. | 2487 |
1 |
| Hamilton Sundstrand Corporation | 5013 |
1 |
| Ebara Corporation | 2371 |
1 |
| Battelle Memorial Institute | 2614 |
1 |
| Korea Advanced Institute of Science and Technology | 4715 |
1 |
| Agency for Defense Development | 486 |
1 |
| Other owners | 17 |