- All sections
- H - Electricity
- H01J - Electric discharge tubes or discharge lamps
- H01J 37/256 - Tubes for spot-analysing by electron or ion beamsMicroanalysers using scanning beams
Patent holdings for IPC class H01J 37/256
Total number of patents in this class: 69
10-year publication summary
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3
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4
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1
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3
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4
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1
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1
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2
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2
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3
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| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| FEI Company | 1052 |
10 |
| Hitachi High-Tech Corporation | 5819 |
8 |
| Bruker Nano GmbH | 67 |
4 |
| Axcelis Technologies, Inc. | 423 |
3 |
| KLA-Tencor Corporation | 2518 |
3 |
| University of Connecticut | 881 |
3 |
| Centre National de La Recherche Scientifique | 11016 |
2 |
| Fibics Incorporated | 22 |
2 |
| Gatan, Inc. | 112 |
2 |
| New York Structural Biology Center | 11 |
2 |
| Hitachi, Ltd. | 16071 |
1 |
| Applied Materials, Inc. | 20363 |
1 |
| Varian Semiconductor Equipment Associates, Inc. | 1187 |
1 |
| Applied Materials Israel, Ltd. | 675 |
1 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 48248 |
1 |
| Massachusetts Institute of Technology | 10239 |
1 |
| President and Fellows of Harvard College | 6091 |
1 |
| Carl Zeiss SMT GmbH | 3328 |
1 |
| Arkema Inc. | 1060 |
1 |
| Carl Zeiss NTS GmbH | 26 |
1 |
| Other owners | 20 |